Zeljka TOPIC-BEGANOVIC

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Essex Junction, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer frontside-backside through silicon via
- Patent number 9,455,214
- Issue date Sep 27, 2016
- GLOBALFOUNDRIES Inc.
- Jeffrey C. Maling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of eliminating poor reveal of through silicon vias
- Patent number 9,443,764
- Issue date Sep 13, 2016
- GLOBALFOUNDRIES, INC.
- Jeffrey C. Maling
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automated residual material detection
- Patent number 9,043,743
- Issue date May 26, 2015
- International Business Machines Corporation
- Jeffrey C. Maling
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER FRONTSIDE-BACKSIDE THROUGH SILICON VIA
- Publication number 20150332966
- Publication date Nov 19, 2015
- International Business Machines Corporation
- Jeffrey C. MALING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED RESIDUAL MATERIAL DETECTION
- Publication number 20150113494
- Publication date Apr 23, 2015
- International Business Machines Corporation
- Jeffrey C. MALING
- G01 - MEASURING TESTING
Information Patent Application
ELIMINATING POOR REVEAL OF THROUGH SILICON VIAS
- Publication number 20150101856
- Publication date Apr 16, 2015
- International Business Machines Corporation
- Jeffrey C. Maling
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...