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Singapore, SG
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last 30 patents
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Patent Grant
Test structures for on-chip real-time reliability testing
Patent number
6,724,214
Issue date
Apr 20, 2004
Chartered Semiconductor Manufacturing Ltd.
Indrajit Manna
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
TEST STRUCTURES FOR ON-CHIP REAL-TIME RELIABILITY TESTING
Publication number
20040051553
Publication date
Mar 18, 2004
Chartered Semiconductor Manufacturing Ltd.
Indrajit Manna
G01 - MEASURING TESTING