Zengqin ZHAO

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Zhubei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for optimized wafer process simulation
- Patent number 10,698,320
- Issue date Jun 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ru-Gun Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern modification and patterning process
- Patent number 10,514,613
- Issue date Dec 24, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Ming Chang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION SYSTEM AND METHOD OF USING THE SAME
- Publication number 20230049405
- Publication date Feb 16, 2023
- Taiwan Semiconductor Manufacturing Co., Lid.
- Chih-Kai Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Optimized Wafer Process Simulation
- Publication number 20180165388
- Publication date Jun 14, 2018
- Taiwan Semiconductor Manufacturing Co., LTD
- Ru-Gun Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MODIFICATION AND PATTERNING PROCESS
- Publication number 20180149982
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Ming CHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY