Zhan ZHAN

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of detecting failure of a semiconductor device
- Patent number 10,622,265
- Issue date Apr 14, 2020
- Samsung Electronics Co., Ltd.
- Ji-Young Choi
- G01 - MEASURING TESTING
Information Patent Grant
Test element group and semiconductor wafer including the same
- Patent number 10,600,702
- Issue date Mar 24, 2020
- Samsung Electronics Co., Ltd.
- Zhan Zhan
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 10,522,430
- Issue date Dec 31, 2019
- Samsung Electronics Co., Ltd.
- Zhan Zhan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETECTING FAILURE OF A SEMICONDUCTOR DEVICE
- Publication number 20190385918
- Publication date Dec 19, 2019
- Samsung Electronics Co., Ltd.
- Ji-Young CHOI
- G01 - MEASURING TESTING
Information Patent Application
TEST ELEMENT GROUP AND SEMICONDUCTOR WAFER INCLUDING THE SAME
- Publication number 20190304856
- Publication date Oct 3, 2019
- Samsung Electronics Co., Ltd.
- Zhan Zhan
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180012814
- Publication date Jan 11, 2018
- Samsung Electronics Co., Ltd.
- Zhan ZHAN
- G01 - MEASURING TESTING