Zhaohui GUO

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Pattern grouping method based on machine learning
- Patent number 11,756,182
- Issue date Sep 12, 2023
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Knowledge recommendation for defect review
- Patent number 11,650,576
- Issue date May 16, 2023
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect displaying method
- Patent number 11,416,979
- Issue date Aug 16, 2022
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Local alignment point calibration method in die inspection
- Patent number 11,043,356
- Issue date Jun 22, 2021
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Local alignment point calibration method in die inspection
- Patent number 10,497,538
- Issue date Dec 3, 2019
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PATTERN GROUPING METHOD BASED ON MACHINE LEARNING
- Publication number 20230386021
- Publication date Nov 30, 2023
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Local Alignment Point Calibration Method in Die Inspection
- Publication number 20200105497
- Publication date Apr 2, 2020
- ASML NETHERLANDS B.V.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN GROUPING METHOD BASED ON MACHINE LEARNING
- Publication number 20200020092
- Publication date Jan 16, 2020
- ASML Netherlands B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DISPLAYING METHOD
- Publication number 20190370950
- Publication date Dec 5, 2019
- ASML Netherlands B,V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
KNOWLEDGE RECOMMENDATON FOR DEFECT REVIEW
- Publication number 20190362488
- Publication date Nov 28, 2019
- ASML Netherlands B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Local Alignment Point Calibration Method in Die Inspection
- Publication number 20180247789
- Publication date Aug 30, 2018
- Hermes Microvision Inc.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS