Zhaoli Zhang

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for identifying defects of integrated circuits
- Patent number 10,628,935
- Issue date Apr 21, 2020
- Zhongke Jingyuan Electron Limited
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic updates for the inspection of integrated circuits
- Patent number 10,565,702
- Issue date Feb 18, 2020
- Dongfang Jingyuan Electron Limited
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Care area generation for inspecting integrated circuits
- Patent number 10,515,444
- Issue date Dec 24, 2019
- Dongfang Jingyuan Electron Limited
- Jie Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect prediction of integrated circuits
- Patent number 10,140,400
- Issue date Nov 27, 2018
- Dongfang Jingyuan Electron Limited
- Zongchang Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Guided defect detection of integrated circuits
- Patent number 10,133,838
- Issue date Nov 20, 2018
- Dongfang Jingyuan Electron Limited
- Hua-Yu Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system of classifying defects on a wafer
- Patent number 9,436,988
- Issue date Sep 6, 2016
- Hermes-Microvision, Inc.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Defect Prediction of Integrated Circuits
- Publication number 20180218096
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zongchang Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Guided Defect Detection of Integrated Circuits
- Publication number 20180218090
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Hua-Yu Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Identifying Defects Of Integrated Circuits
- Publication number 20180218492
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Care Area Generation For Inspecting Integrated Circuits
- Publication number 20180218490
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Jie Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Updates for the Inspection of Integrated Circuits
- Publication number 20180218493
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF CLASSIFYING DEFECTS ON A WAFER
- Publication number 20140321730
- Publication date Oct 30, 2014
- WEI FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR THE VISUAL CLASSIFICATION OF DEFECTS
- Publication number 20090080763
- Publication date Mar 26, 2009
- HERMES MICROVISION, INC.
- Jack Y. Jau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CREATING KNOWLEDGE AND SELECTING FEATURES IN...
- Publication number 20080175468
- Publication date Jul 24, 2008
- HERMES MICROVISION, INC.
- Jack Y. Jau
- G06 - COMPUTING CALCULATING COUNTING

Zhaoli Zhang

Person

Patents Grantslast 30 patents

Method and system for identifying defects of integrated circuits

Dynamic updates for the inspection of integrated circuits

Care area generation for inspecting integrated circuits

Method and system for defect prediction of integrated circuits

Guided defect detection of integrated circuits

Method and system of classifying defects on a wafer

Patents Applicationslast 30 patents

Method and System for Defect Prediction of Integrated Circuits

Guided Defect Detection of Integrated Circuits

Method And System For Identifying Defects Of Integrated Circuits

Care Area Generation For Inspecting Integrated Circuits

Dynamic Updates for the Inspection of Integrated Circuits

METHOD AND SYSTEM OF CLASSIFYING DEFECTS ON A WAFER

METHOD AND SYSTEM FOR THE VISUAL CLASSIFICATION OF DEFECTS

METHOD AND SYSTEM FOR CREATING KNOWLEDGE AND SELECTING FEATURES IN...