Zhe LIAN

Person

Suzhou, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Heating structure and wafer test device
- Patent number 12,237,184
- Issue date Feb 25, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip moving device
- Patent number 12,235,316
- Issue date Feb 25, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-level semiconductor high-voltage reliability test fixture
- Patent number 12,228,603
- Issue date Feb 18, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive flexible chip test socket and formation method thereof
- Patent number 12,216,139
- Issue date Feb 4, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING
Information Patent Grant
Chip test pressing-down apparatus and formation method thereof
- Patent number 12,216,156
- Issue date Feb 4, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250051104
- Publication date Feb 13, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Renwei TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250020687
- Publication date Jan 16, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL SEMICONDUCTOR HIGH-VOLTAGE RELIABILITY TEST FIXTURE
- Publication number 20250012845
- Publication date Jan 9, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF
- Publication number 20240410917
- Publication date Dec 12, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
CHIP TEST PRESSING-DOWN APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20240410935
- Publication date Dec 12, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC CHIP PICK-AND-PLACE APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20240335958
- Publication date Oct 10, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Shan ZHAO
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...
- Publication number 20240310433
- Publication date Sep 19, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
CHIP MOVING DEVICE
- Publication number 20240310435
- Publication date Sep 19, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE
- Publication number 20240295600
- Publication date Sep 5, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Heating structure and wafer test device

Chip moving device

Wafer-level semiconductor high-voltage reliability test fixture

Adaptive flexible chip test socket and formation method thereof

Chip test pressing-down apparatus and formation method thereof

Patents Applicationslast 30 patents

CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF

ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOF

WAFER-LEVEL SEMICONDUCTOR HIGH-VOLTAGE RELIABILITY TEST FIXTURE

ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF

CHIP TEST PRESSING-DOWN APPARATUS AND FORMATION METHOD THEREOF

AUTOMATIC CHIP PICK-AND-PLACE APPARATUS AND FORMATION METHOD THEREOF

PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...

CHIP MOVING DEVICE

CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE