Zhen Hou

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 10,209,501
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 10,048,480
- Issue date Aug 14, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,664,888
- Issue date May 30, 2017
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,645,381
- Issue date May 9, 2017
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 9,389,408
- Issue date Jul 12, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,036,869
- Issue date May 19, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
System and method for monitoring LED chip surface roughening process
- Patent number 8,976,366
- Issue date Mar 10, 2015
- Zeta Instruments, Inc.
- James Jianguo Xu
- G01 - MEASURING TESTING
Information Patent Grant
Servo pattern characterization on magnetic disks
- Patent number 7,397,621
- Issue date Jul 8, 2008
- KLA-Tencor Technologies Corporation
- Zhen Hou
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20180356623
- Publication date Dec 13, 2018
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160253813
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160252714
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20150226952
- Publication date Aug 13, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20150226953
- Publication date Aug 13, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Application
System And Method For Monitoring LED Chip Surface Roughening Process
- Publication number 20120327414
- Publication date Dec 27, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D Microscope Including Insertable Components To Provide Multiple I...
- Publication number 20120176475
- Publication date Jul 12, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20120051660
- Publication date Mar 1, 2012
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20120019626
- Publication date Jan 26, 2012
- Zeta Instruments, Inc.
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Servo pattern characterization on magnetic disks
- Publication number 20060215289
- Publication date Sep 28, 2006
- KLA-Tencor Technologies Corp.
- Zhen Hou
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

3D microscope and methods of measuring patterned substrates

3D microscope including insertable components to provide multiple i...

Multi-surface optical 3D microscope

Multi-surface optical 3D microscope

3D microscope and methods of measuring patterned substrates

Multi-surface optical 3D microscope

System and method for monitoring LED chip surface roughening process

Servo pattern characterization on magnetic disks

Patents Applicationslast 30 patents

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

3D Microscope And Methods Of Measuring Patterned Substrates

3D Microscope And Methods Of Measuring Patterned Substrates

Multi-Surface Optical 3D Microscope

Multi-Surface Optical 3D Microscope

System And Method For Monitoring LED Chip Surface Roughening Process

3D Microscope Including Insertable Components To Provide Multiple I...

Multi-Surface Optical 3D Microscope

3D Microscope And Methods Of Measuring Patterned Substrates

Servo pattern characterization on magnetic disks