Zheng Li

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Hefei, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for measuring dimension of semiconductor structure
- Patent number 11,656,245
- Issue date May 23, 2023
- Changxin Memory Technologies, Inc.
- Zheng Li
- G01 - MEASURING TESTING
Information Patent Grant
Predictive, multi-layer caching architectures
- Patent number 9,785,608
- Issue date Oct 10, 2017
- Microsoft Technology Licensing, LLC
- Wenwu Zhu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Predictive, multi-layer caching architectures
- Patent number 8,850,075
- Issue date Sep 30, 2014
- Microsoft Corporation
- Wenwu Zhu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING DIMENSION OF SEMICONDUCTOR STRUCTURE
- Publication number 20220229087
- Publication date Jul 21, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zheng LI
- G01 - MEASURING TESTING
Information Patent Application
Predictive, Multi-Layer Caching Architectures
- Publication number 20150081779
- Publication date Mar 19, 2015
- Microsoft Corporation
- Wenwu Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Predictive, Multi-Layer Caching Architectures
- Publication number 20130014064
- Publication date Jan 10, 2013
- Microsoft Corporation
- Wenwu Zhu
- G06 - COMPUTING CALCULATING COUNTING