Zhengyu Wang

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detection of thin lines for selective sensitivity during reticle in...
- Patent number 9,092,847
- Issue date Jul 28, 2015
- KLA-Tencor Corporation
- Zhengyu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Detection of thin lines for selective sensitivity during reticle in...
- Patent number 8,855,400
- Issue date Oct 7, 2014
- KLA-Tencor Corporation
- Zhengyu Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF THIN LINES FOR SELECTIVE SENSITIVITY DURING RETICLE IN...
- Publication number 20140369593
- Publication date Dec 18, 2014
- KLA-Tencor Corporation
- Zhengyu Wang
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF THIN LINES FOR SELECTIVE SENSITIVITY DURING RETICLE IN...
- Publication number 20130236083
- Publication date Sep 12, 2013
- KLA-Tencor Corporation
- Zhengyu Wang
- G01 - MEASURING TESTING