Zhi-Min Ling

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method to break and assemble solar cells
- Patent number 8,343,795
- Issue date Jan 1, 2013
- Yuhao Luo
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for testing a memory device with a redundant s...
- Patent number 7,626,874
- Issue date Dec 1, 2009
- Xilinx, Inc.
- Yuezhen Fan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of automatic fault isolation in a programmable logic device
- Patent number 7,246,285
- Issue date Jul 17, 2007
- Xilinx, Inc.
- Tarek Eldin
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for and method of identifying a defect in an integrate...
- Patent number 7,227,364
- Issue date Jun 5, 2007
- Xilinx, Inc.
- Yuezhen Fan
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuits for localizing defective interconnect resources...
- Patent number 7,145,344
- Issue date Dec 5, 2006
- Xilinx, Inc.
- David Mark
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring and improving integrated circuit fabrication...
- Patent number 7,020,860
- Issue date Mar 28, 2006
- Xilinx, Inc.
- Joe W. Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correlation of electrical test data with physical defect data
- Patent number 6,950,771
- Issue date Sep 27, 2005
- Xilinx, Inc.
- Yuezhen Fan
- G11 - INFORMATION STORAGE
Information Patent Grant
Application-specific testing methods for programmable logic devices
- Patent number 6,891,395
- Issue date May 10, 2005
- Xilinx, Inc.
- Robert W. Wells
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Application-specific testing methods for programmable logic devices
- Patent number 6,817,006
- Issue date Nov 9, 2004
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Method of using partially defective programmable logic devices
- Patent number 6,664,808
- Issue date Dec 16, 2003
- Xilinx, Inc.
- Zhi-Min Ling
- G01 - MEASURING TESTING
Information Patent Grant
Fault emulation testing of programmable logic devices
- Patent number 6,594,610
- Issue date Jul 15, 2003
- Xilinx, Inc.
- Shahin Toutounchi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and structures for protecting reticles from ESD failure
- Patent number 6,376,131
- Issue date Apr 23, 2002
- Xilinx, Inc.
- Jae Cho
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO MANAGE A PHOTOVOLTAIC SYSTEM
- Publication number 20110088743
- Publication date Apr 21, 2011
- Yuhao Luo
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
BUILDING-INTEGRATED SOLAR PHOTOVOLTAIC PANEL
- Publication number 20110061711
- Publication date Mar 17, 2011
- Yuhao Luo
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
METHOD TO BREAK AND ASSEMBLE SOLAR CELLS
- Publication number 20110065226
- Publication date Mar 17, 2011
- Yuhao Luo
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
METHOD AND DEVICE FOR FABRICATING A SOLAR CELL USING AN INTERFACE P...
- Publication number 20110017263
- Publication date Jan 27, 2011
- Solaria Corporation
- KEVIN R. GIBSON
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Application-specific testing methods for programmable logic devices
- Publication number 20040216081
- Publication date Oct 28, 2004
- Xilinx, Inc.
- Robert W. Wells
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and circuits for localizing defective interconnect resources...
- Publication number 20040103354
- Publication date May 27, 2004
- Xilinx, Inc.
- David Mark
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method of using partially defective programmable logic devices
- Publication number 20030062923
- Publication date Apr 3, 2003
- Xilinx, Inc.
- Zhi-Min Ling
- G01 - MEASURING TESTING

Zhi-Min Ling

Person

Patents Grantslast 30 patents

Method to break and assemble solar cells

Method and apparatus for testing a memory device with a redundant s...

Method of automatic fault isolation in a programmable logic device

Test circuit for and method of identifying a defect in an integrate...

Method and circuits for localizing defective interconnect resources...

Method for monitoring and improving integrated circuit fabrication...

Correlation of electrical test data with physical defect data

Application-specific testing methods for programmable logic devices

Application-specific testing methods for programmable logic devices

Method of using partially defective programmable logic devices

Fault emulation testing of programmable logic devices

Methods and structures for protecting reticles from ESD failure

Patents Applicationslast 30 patents

METHOD TO MANAGE A PHOTOVOLTAIC SYSTEM

BUILDING-INTEGRATED SOLAR PHOTOVOLTAIC PANEL

METHOD TO BREAK AND ASSEMBLE SOLAR CELLS

METHOD AND DEVICE FOR FABRICATING A SOLAR CELL USING AN INTERFACE P...

Application-specific testing methods for programmable logic devices

Method and circuits for localizing defective interconnect resources...

Method of using partially defective programmable logic devices