Zhi-Xiong (Jack) Jiang

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring thin layers using SIMS
- Patent number 7,579,590
- Issue date Aug 25, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Zhi-Xiong (Jack) Jiang
- G01 - MEASURING TESTING