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Beijing, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Substance identification device and method for extracting statistic...
Patent number
11,619,599
Issue date
Apr 4, 2023
Tsinghua University
Zhi Zeng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method, device and system for inspecting moving object based on cos...
Patent number
10,620,336
Issue date
Apr 14, 2020
Tsinghua University
Kejun Kang
G01 - MEASURING TESTING
Information
Patent Grant
Method, apparatus and system for inspecting object based on cosmic ray
Patent number
10,613,247
Issue date
Apr 7, 2020
Tsinghua University
Kejun Kang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for measuring thickness by pulsed infrared thermal wave tech...
Patent number
9,464,891
Issue date
Oct 11, 2016
Capital Normal University
Zhi Zeng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETECTION METHOD, APPARATUS AND SYSTEM
Publication number
20240027371
Publication date
Jan 25, 2024
Nuctech Company Limited
Zhi ZENG
G01 - MEASURING TESTING
Information
Patent Application
SUBSTANCE IDENTIFICATION DEVICE AND METHOD FOR EXTRACTING STATISTIC...
Publication number
20210025836
Publication date
Jan 28, 2021
TSINGHUA UNIVERSITY
Zhi ZENG
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICES AND INSPECTION METHODS
Publication number
20180156741
Publication date
Jun 7, 2018
Nuctech Company Limited
Kejun Kang
G01 - MEASURING TESTING
Information
Patent Application
METHOD, APPARATUS AND SYSTEM FOR INSPECTING OBJECT BASED ON COSMIC RAY
Publication number
20170329038
Publication date
Nov 16, 2017
TSINGHUA UNIVERSITY
Kejun KANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD, DEVICE AND SYSTEM FOR INSPECTING MOVING OBJECT BASED ON COS...
Publication number
20170329039
Publication date
Nov 16, 2017
TSINGHUA UNIVERSITY
Kejun KANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING THICKNESS BY PULSED INFRARED THERMAL WAVE TECH...
Publication number
20140153608
Publication date
Jun 5, 2014
CAPITAL NORMAL UNIVERSITY
Zhi Zeng
G01 - MEASURING TESTING