Zhibin Wang

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic liquid sealing device resistible to axial and radial vibra...
- Patent number 11,616,412
- Issue date Mar 28, 2023
- Tsinghua University
- Decai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High efficiency secondary and back scattered electron detector
- Patent number 8,895,935
- Issue date Nov 25, 2014
- Hermes-Microvision, Inc.
- Zhibin Wang
- G01 - MEASURING TESTING
Information Patent Grant
High efficiency scintillator detector for charged particle detection
- Patent number 8,829,451
- Issue date Sep 9, 2014
- Hermes-Microvision, Inc.
- Zhibin Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE SEALED WITH MAGNETIC LIQUID
- Publication number 20240145144
- Publication date May 2, 2024
- BEIJING JIAOTONG UNIVERSITY
- Decai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-COOLING DEVICE SEALED WITH MAGNETIC LIQUID
- Publication number 20240141999
- Publication date May 2, 2024
- BEIJING JIAOTONG UNIVERSITY
- Decai LI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
DEVICE SEALED WITH MAGNETIC LIQUID
- Publication number 20240141998
- Publication date May 2, 2024
- BEIJING JIAOTONG UNIVERSITY
- Decai LI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
MAGNETIC LIQUID SEALING DEVICE RESISTIBLE TO AXIAL AND RADIAL VIBRA...
- Publication number 20230030538
- Publication date Feb 2, 2023
- TSINGHUA UNIVERSITY
- Decai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH EFFICIENCY SCINTILLATOR DETECTOR FOR CHARGED PARTICLE DETECTION
- Publication number 20130334430
- Publication date Dec 19, 2013
- HERMES MICROVISION, INC.
- Zhibin Wang
- G01 - MEASURING TESTING
Information Patent Application
HIGH EFFICIENCY SECONDARY AND BACK SCATTERED ELECTRON DETECTOR
- Publication number 20130234032
- Publication date Sep 12, 2013
- HERMES MICROVISION, INC.
- Zhibin Wang
- G01 - MEASURING TESTING