Zhichao CHEN

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cascade defect inspection
- Patent number 11,861,818
- Issue date Jan 2, 2024
- ASML Netherlands B.V.
- Zhichao Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cascade defect inspection
- Patent number 11,308,602
- Issue date Apr 19, 2022
- ASML Netherlands B.V.
- Zhichao Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect pattern grouping method and system
- Patent number 11,238,579
- Issue date Feb 1, 2022
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining corrections to features of a mask
- Patent number 11,126,089
- Issue date Sep 21, 2021
- ASML Netherlands B.V.
- Wei Fang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
AUTO PARAMETER TUNING FOR CHARGED PARTICLE INSPECTION IMAGE ALIGNMENT
- Publication number 20250036030
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION
- Publication number 20240331132
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE DISTORTION CORRECTION IN CHARGED PARTICLE INSPECTION
- Publication number 20240331115
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOPOLOGY-BASED IMAGE RENDERING IN CHARGED-PARTICLE BEAM INSPECTION...
- Publication number 20240037890
- Publication date Feb 1, 2024
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING REFERENCE DATA FOR WAFER INSPECTION
- Publication number 20230139085
- Publication date May 4, 2023
- ASML NETHERLANDS B.V.
- Shengcheng JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED IMAGE GENERATION FOR MODEL BASE ALIGNMENTS
- Publication number 20220404712
- Publication date Dec 22, 2022
- ASML NETHERLANDS B.V.
- Qiang ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CASCADE DEFECT INSPECTION
- Publication number 20220245787
- Publication date Aug 4, 2022
- ASML NETHERLANDS B.V.
- Zhichao CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING CORRECTIONS TO FEATURES OF A MASK
- Publication number 20200326632
- Publication date Oct 15, 2020
- ASML NETHERLANDS B.V.
- Wei Fang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CASCADE DEFECT INSPECTION
- Publication number 20190347784
- Publication date Nov 14, 2019
- ASML Netherlands B.V.
- Zhichao CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT PATTERN GROUPING METHOD AND SYSTEM
- Publication number 20190333205
- Publication date Oct 31, 2019
- ASML Netherlands B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING

Zhichao CHEN

Person

Patents Grantslast 30 patents

Cascade defect inspection

Cascade defect inspection

Defect pattern grouping method and system

Method for determining corrections to features of a mask

Patents Applicationslast 30 patents

AUTO PARAMETER TUNING FOR CHARGED PARTICLE INSPECTION IMAGE ALIGNMENT

METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION

IMAGE DISTORTION CORRECTION IN CHARGED PARTICLE INSPECTION

TOPOLOGY-BASED IMAGE RENDERING IN CHARGED-PARTICLE BEAM INSPECTION...

PROCESSING REFERENCE DATA FOR WAFER INSPECTION

MACHINE LEARNING BASED IMAGE GENERATION FOR MODEL BASE ALIGNMENTS

CASCADE DEFECT INSPECTION

METHOD FOR DETERMINING CORRECTIONS TO FEATURES OF A MASK

CASCADE DEFECT INSPECTION

DEFECT PATTERN GROUPING METHOD AND SYSTEM