Zhifeng Huang

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray CT microscopy system and method utilizing lattice sampling
- Patent number 11,085,888
- Issue date Aug 10, 2021
- Carl Zeiss X-ray Microscopy, Inc.
- William Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for spectral characterization in computed tomogra...
- Patent number 10,859,515
- Issue date Dec 8, 2020
- Carl Zeiss X-ray Microscopy, Inc.
- Zhifeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray CT microscopy system and method utilizing lattice sampling
- Patent number 10,514,343
- Issue date Dec 24, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- William Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Segmentation and spectrum based metal artifact reduction method and...
- Patent number 10,297,048
- Issue date May 21, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Zhifeng Huang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
X-ray CT microscopy system and method utilizing lattice sampling
- Publication number 20200080947
- Publication date Mar 12, 2020
- CARL ZEISS X-RAY MICROSCOPY, INC.
- William Thompson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SPECTRAL CHARACTERIZATION IN COMPUTED TOMOGRA...
- Publication number 20170276620
- Publication date Sep 28, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Zhifeng Huang
- G01 - MEASURING TESTING
Information Patent Application
Segmentation and Spectrum Based Metal Artifact Reduction Method and...
- Publication number 20170109904
- Publication date Apr 20, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Zhifeng Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-ray CT microscopy system and method utilizing lattice sampling
- Publication number 20160252467
- Publication date Sep 1, 2016
- CARL ZEISS X-RAY MICROSCOPY, INC.
- William Thompson
- G01 - MEASURING TESTING