Zhigang Song

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Flexible circuit structure for circuit line bending
- Patent number 12,052,825
- Issue date Jul 30, 2024
- International Business Machines Corporation
- Hongqing Zhang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Tamper-respondent assembly with structural material within sealed i...
- Patent number 11,191,155
- Issue date Nov 30, 2021
- International Business Machines Corporation
- Hongqing Zhang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ranking defects with yield impacts
- Patent number 10,191,107
- Issue date Jan 29, 2019
- GLOBALFOUNDRIES Inc.
- Zhigang Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing in a semiconductor device a low resistance...
- Patent number 9,559,051
- Issue date Jan 31, 2017
- GlobalFoundries Inc.
- Yongchun Xin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage contrast characterization structures and methods for within...
- Patent number 9,519,210
- Issue date Dec 13, 2016
- International Business Machines Corporation
- Oliver D. Patterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Evaluating transistors with e-beam inspection
- Patent number 9,291,665
- Issue date Mar 22, 2016
- GLOBALFOUNDRIES Inc.
- Oliver D. Patterson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FLEXIBLE CIRCUIT STRUCTURE FOR CIRCUIT LINE BENDING
- Publication number 20220418110
- Publication date Dec 29, 2022
- International Business Machines Corporation
- Hongqing Zhang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
RANKING DEFECTS WITH YIELD IMPACTS
- Publication number 20180238958
- Publication date Aug 23, 2018
- GLOBALFOUNDRIES INC.
- Zhigang Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SRAM-LIKE EBI STRUCTURE DESIGN AND IMPLEMENTATION TO CAPTURE MOSFET...
- Publication number 20170154687
- Publication date Jun 1, 2017
- GLOBALFOUNDRIES INC.
- Zhigang Song
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN...
- Publication number 20160148849
- Publication date May 26, 2016
- International Business Machines Corporation
- Oliver D. Patterson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATING TRANSISTORS WITH E-BEAM INSPECTION
- Publication number 20130300451
- Publication date Nov 14, 2013
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DEFECT-BITMAP-FAIL PATTERNS MATCHING ANALYSIS...
- Publication number 20130016895
- Publication date Jan 17, 2013
- International Business Machines Corporation
- Zhigang Song
- G06 - COMPUTING CALCULATING COUNTING

Zhigang Song

Person

Patents Grantslast 30 patents

Flexible circuit structure for circuit line bending

Tamper-respondent assembly with structural material within sealed i...

Ranking defects with yield impacts

Method for manufacturing in a semiconductor device a low resistance...

Voltage contrast characterization structures and methods for within...

Evaluating transistors with e-beam inspection

Patents Applicationslast 30 patents

FLEXIBLE CIRCUIT STRUCTURE FOR CIRCUIT LINE BENDING

RANKING DEFECTS WITH YIELD IMPACTS

SRAM-LIKE EBI STRUCTURE DESIGN AND IMPLEMENTATION TO CAPTURE MOSFET...

VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN...

EVALUATING TRANSISTORS WITH E-BEAM INSPECTION

METHOD AND SYSTEM FOR DEFECT-BITMAP-FAIL PATTERNS MATCHING ANALYSIS...