Zhigang WANG

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement device, calibration method of measurement device, and c...
- Patent number 10,438,771
- Issue date Oct 8, 2019
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image forming method
- Patent number 9,245,711
- Issue date Jan 26, 2016
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern dimension measuring device, charged particle beam apparatus...
- Patent number 9,136,089
- Issue date Sep 15, 2015
- Hitachi High-Technologies Corporation
- Zhigang Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope
- Patent number 8,969,801
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing apparatus, image processing method
- Patent number 8,923,614
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Hideki Itai
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 8,907,267
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope optical condition setting method and s...
- Patent number 8,692,197
- Issue date Apr 8, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling charging of sample and scanning electron mic...
- Patent number 8,487,251
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam irradiation system
- Patent number 7,851,756
- Issue date Dec 14, 2010
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,566,872
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT DEVICE, CALIBRATION METHOD OF MEASUREMENT DEVICE, AND C...
- Publication number 20170092462
- Publication date Mar 30, 2017
- Hitachi High-Technologies Corporation
- Michio HATANO
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Apparatus and Image Forming Method
- Publication number 20150221471
- Publication date Aug 6, 2015
- Hitachi High-Technologies Corporation
- Michio HATANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Dimension Measuring Device, Charged Particle Beam Apparatus...
- Publication number 20150041649
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Zhigang Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20140299769
- Publication date Oct 9, 2014
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20140217274
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD
- Publication number 20130343649
- Publication date Dec 26, 2013
- Hitachi High-Technologies Corporation
- Hideki ITAI
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope Optical Condition Setting Method and S...
- Publication number 20120318977
- Publication date Dec 20, 2012
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CONTROLLING CHARGING OF SAMPLE AND SCANNING ELECTRON MIC...
- Publication number 20110139981
- Publication date Jun 16, 2011
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Irradiation System
- Publication number 20110073760
- Publication date Mar 31, 2011
- Hitachi High-Technologies Corporation
- Ritsuo FUKAYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Irradiation System
- Publication number 20090032723
- Publication date Feb 5, 2009
- Hitachi High-Technologies Corporation
- Ritsuo FUKAYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20070045539
- Publication date Mar 1, 2007
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS

Zhigang WANG

Person

Patents Grantslast 30 patents

Measurement device, calibration method of measurement device, and c...

Charged particle beam apparatus and image forming method

Pattern dimension measuring device, charged particle beam apparatus...

Scanning electron microscope

Image processing apparatus, image processing method

Charged particle beam device

Scanning electron microscope optical condition setting method and s...

Method for controlling charging of sample and scanning electron mic...

Charged particle beam irradiation system

Scanning electron microscope

Patents Applicationslast 30 patents

MEASUREMENT DEVICE, CALIBRATION METHOD OF MEASUREMENT DEVICE, AND C...

Charged Particle Beam Apparatus and Image Forming Method

Pattern Dimension Measuring Device, Charged Particle Beam Apparatus...

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM DEVICE

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD

Scanning Electron Microscope Optical Condition Setting Method and S...

METHOD FOR CONTROLLING CHARGING OF SAMPLE AND SCANNING ELECTRON MIC...

Charged Particle Beam Irradiation System

Charged Particle Beam Irradiation System

Scanning electron microscope