Zhigiang Wu

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for preventing polysilicon mushrooming during selective epit...
- Patent number 6,872,610
- Issue date Mar 29, 2005
- Texas Instruments Incorporated
- Majid M. Mansoori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution pressure-sensing device having an insulating flexib...
- Patent number 6,561,044
- Issue date May 13, 2003
- Micron Technology, Inc.
- Tongbi Jiang
- G01 - MEASURING TESTING
Information Patent Grant
High resolution pressure-sensing device having an insulating flexib...
- Patent number 6,539,815
- Issue date Apr 1, 2003
- Micron Technology, Inc.
- Tongbi Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Reduced leakage DRAM storage unit
- Patent number 6,404,669
- Issue date Jun 11, 2002
- Micron Technology, Inc.
- Zhigiang Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Selective method to form roughened silicon
- Patent number 6,355,536
- Issue date Mar 12, 2002
- Micron Technology, Inc.
- Thomas A. Figura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Zero insertion force sockets using negative thermal expansion mater...
- Patent number 6,164,993
- Issue date Dec 26, 2000
- Micron Technology, Inc.
- Tongbi Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced leakage DRAM storage unit
- Patent number 5,973,954
- Issue date Oct 26, 1999
- Micron Technology, Inc.
- Zhigiang (Jeff) Wu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
High resolution pressure-sensing device having an insulating flexib...
- Publication number 20010052267
- Publication date Dec 20, 2001
- Micron Technology, Inc.
- Tongbi Jiang
- G01 - MEASURING TESTING
Information Patent Application
Reduced leakage DRAM storage unit
- Publication number 20010040816
- Publication date Nov 15, 2001
- Zhigiang (Jeff) Wu
- H01 - BASIC ELECTRIC ELEMENTS