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Patents Grants
last 30 patents
Information
Patent Grant
Gamma groove arrays for interconnecting and mounting devices
Patent number
10,656,362
Issue date
May 19, 2020
GLOBALFOUNDRIES Singapore Pte. Ltd.
Yamin Huang
G02 - OPTICS
Information
Patent Grant
Wedge-shaped fiber array on a silicon-photonic device and method fo...
Patent number
10,497,820
Issue date
Dec 3, 2019
GLOBALFOUNDRIES Singapore Pte. Ltd.
Dandan Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for detection of a photon emission generated by a device and...
Patent number
9,964,589
Issue date
May 8, 2018
GLOBALFOUNDRIES Singapore Pte. Ltd.
Lei Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Setup for multiple cross-section sample preparation
Patent number
9,496,187
Issue date
Nov 15, 2016
GLOBALFOUNDRIES Singapore Pte. Ltd.
Tsu Hau Ng
B24 - GRINDING POLISHING
Information
Patent Grant
Laser-enhanced chemical etching of nanotips
Patent number
9,128,117
Issue date
Sep 8, 2015
GLOBALFOUNDRIES Singapore Pte. Ltd.
ZhiHong Mai
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and system for introducing physical damage into an integrate...
Patent number
8,489,945
Issue date
Jul 16, 2013
GLOBALFOUNDRIES Singapore Pte, Ltd.
Zhihong Mai
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit system employing backside energy source for elec...
Patent number
8,158,513
Issue date
Apr 17, 2012
GLOBALFOUNDRIES Singapore Pte. Ltd.
Zhihong Mai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for decapping integrated circuit packages
Patent number
6,917,011
Issue date
Jul 12, 2005
Advanced Micro Devices PTE Ltd.
Ming Hui Hong
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and system for temperature cycling at an interface between a...
Patent number
6,821,796
Issue date
Nov 23, 2004
Advanced Micro Devices, Inc.
Zhihong Mai
G01 - MEASURING TESTING
Information
Patent Grant
Method of and apparatus for testing an integrated circuit package
Patent number
6,531,865
Issue date
Mar 11, 2003
Advanced Micro Devices, Inc.
Zhihong Mai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
WEDGE-SHAPED FIBER ARRAY ON A SILICON-PHOTONIC DEVICE AND METHOD FO...
Publication number
20190371945
Publication date
Dec 5, 2019
GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Dandan WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
GAMMA GROOVE ARRAYS FOR INTERCONNECTING AND MOUNTING DEVICES
Publication number
20190204525
Publication date
Jul 4, 2019
GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Yamin HUANG
G02 - OPTICS
Information
Patent Application
SYSTEM FOR DETECTION OF A PHOTON EMISSION GENERATED BY A DEVICE AND...
Publication number
20180128874
Publication date
May 10, 2018
GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Lei Zhu
G01 - MEASURING TESTING
Information
Patent Application
SETUP FOR MULTIPLE CROSS-SECTION SAMPLE PREPARATION
Publication number
20150140688
Publication date
May 21, 2015
GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Tsu Hau NG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LASER-ENHANCED CHEMICAL ETCHING OF NANOTIPS
Publication number
20140242805
Publication date
Aug 28, 2014
GLOBALFOUNDRIES SINGAPORE PTE. LTD.
ZhiHong MAI
B82 - NANO-TECHNOLOGY
Information
Patent Application
Method and system for introducing physical damage into an integrate...
Publication number
20120086468
Publication date
Apr 12, 2012
Globalfoundries Singapore PTE, LTD.
Zhihong Mai
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT SYSTEM EMPLOYING BACKSIDE ENERGY SOURCE FOR ELEC...
Publication number
20100087061
Publication date
Apr 8, 2010
Chartered Semiconductor Manufacturing LTD.
Zhihong Mai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for decapping integrated circuit packages
Publication number
20030010761
Publication date
Jan 16, 2003
Ming Hui Hong
H01 - BASIC ELECTRIC ELEMENTS