Zhihua Zou

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Gilbert, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and processes for measuring thickness values of semiconduct...
- Patent number 10,269,758
- Issue date Apr 23, 2019
- Intel Corporation
- Zhihua Zou
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of microelectronic devices using near-infrared light
- Patent number 10,066,927
- Issue date Sep 4, 2018
- Intel Corporation
- Liang W. Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection of microelectronic devices using near-infrared light
- Patent number 9,488,595
- Issue date Nov 8, 2016
- Intel Corporation
- Liang W. Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment inspection
- Patent number 8,399,264
- Issue date Mar 19, 2013
- Intel Corporation
- Zhihua Zou
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
MICROELECTRONIC ASSEMBLIES WITH DIRECT BONDING USING NANOTWINNED CO...
- Publication number 20240332237
- Publication date Oct 3, 2024
- Intel Corporation
- Vivek Chidambaram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUMMY DIE PLACEMENT WITHIN A DICING STREET OF A WAFER
- Publication number 20230197520
- Publication date Jun 22, 2023
- Intel Corporation
- Yi SHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND PROCESSES FOR MEASURING THICKNESS VALUES OF SEMICONDUCT...
- Publication number 20170186722
- Publication date Jun 29, 2017
- Intel Corporation
- Zhihua Zou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OF MICROELECTRONIC DEVICES USING NEAR-INFRARED LIGHT
- Publication number 20160363542
- Publication date Dec 15, 2016
- Intel Corporation
- Liang W. Zhang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION OF MICROELECTRONIC DEVICES USING NEAR-INFRARED LIGHT
- Publication number 20150276621
- Publication date Oct 1, 2015
- Liang W. Zhang
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT INSPECTION
- Publication number 20120135546
- Publication date May 31, 2012
- Zhihua Zou
- G06 - COMPUTING CALCULATING COUNTING