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Zhijian Ma
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San Jose, CA, US
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last 30 patents
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Patent Grant
On-chip interface trap characterization and monitoring
Patent number
7,472,322
Issue date
Dec 30, 2008
Integrated Device Technology, Inc.
Zhijian Ma
G01 - MEASURING TESTING
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Patent Grant
Methods, apparatus and computer program products for modeling integ...
Patent number
6,898,561
Issue date
May 24, 2005
Integrated Device Technology, Inc.
Chunbo Liu
G06 - COMPUTING CALCULATING COUNTING