Zhiming Jiang

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Spectral matching based calibration
- Patent number 10,088,413
- Issue date Oct 2, 2018
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Grant
High throughput thin film characterization and defect detection
- Patent number 8,711,349
- Issue date Apr 29, 2014
- KLA-Tencor Corporation
- Xiang Gao
- G01 - MEASURING TESTING
Information Patent Grant
Control by sample reflectivity
- Patent number 7,903,250
- Issue date Mar 8, 2011
- KLA-Tencor Corporation
- Fabio A. Faccini
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Spectral Matching Based Calibration
- Publication number 20130132021
- Publication date May 23, 2013
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Application
High Throughput Thin Film Characterization And Defect Detection
- Publication number 20130083320
- Publication date Apr 4, 2013
- KLA-Tencor Corporation
- Xiang Gao
- G01 - MEASURING TESTING