Zhiqin Wang

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Jersey City, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Image synchronization of scanning wafer inspection system
- Patent number 9,208,553
- Issue date Dec 8, 2015
- KLA-Tencor Corporation
- Kai Cao
- G01 - MEASURING TESTING
Information Patent Grant
Image synchronization of scanning wafer inspection system
- Patent number 8,995,746
- Issue date Mar 31, 2015
- KLA-Tencor Corporation
- Kai Cao
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
- Publication number 20150170357
- Publication date Jun 18, 2015
- KLA-Tencor Corporation
- Kai Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
- Publication number 20140270471
- Publication date Sep 18, 2014
- KLA-Tencor Corporation
- Kai Cao
- G01 - MEASURING TESTING