Zhiyong An

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Los Angeles, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe for testing semiconductor devices with features that increase...
- Patent number 7,772,859
- Issue date Aug 10, 2010
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid probe for testing semiconductor devices
- Patent number 7,589,542
- Issue date Sep 15, 2009
- Touchdown Technologies Inc.
- Melvin Khoo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYBRID PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252310
- Publication date Oct 16, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Nim Tea
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252328
- Publication date Oct 16, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Zhiyong An
- G01 - MEASURING TESTING