ZHIYONG HAO

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Testing multi-core integrated circuit with parallel scan test data...
- Patent number 10,054,637
- Issue date Aug 21, 2018
- NXP USA, INC.
- Zhiyong Hao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING MULTI-CORE INTEGRATED CIRCUIT WITH PARALLEL SCAN TEST DATA...
- Publication number 20170131351
- Publication date May 11, 2017
- FREESCALE SEMICONDUCTOR, INC.
- ZHIYONG HAO
- G01 - MEASURING TESTING