Zhiyu Chen

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Eagan, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Intelligent defect identification system
- Patent number 11,320,385
- Issue date May 3, 2022
- Seagate Technology LLC
- Kurtis Dean Loken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated detection of artifacts in scan image
- Patent number 11,288,809
- Issue date Mar 29, 2022
- Seagate Technology LLC
- Zhiyu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Automated detection of artifacts in scan image
- Patent number 10,679,353
- Issue date Jun 9, 2020
- Seagate Technology LLC
- Zhiyu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Automated and accurate high-throughput slider-level flatness inspec...
- Patent number 10,281,268
- Issue date May 7, 2019
- Seagate Technology LLC
- Zhiyu Chen
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE
- Publication number 20200265583
- Publication date Aug 20, 2020
- SEAGATE TECHNOLOGY LLC
- Zhiyu Chen
- G01 - MEASURING TESTING
Information Patent Application
INTELLIGENT DEFECT IDENTIFICATION SYSTEM
- Publication number 20200116650
- Publication date Apr 16, 2020
- Seagate Technology LLC
- Kurtis Dean Loken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE
- Publication number 20190139224
- Publication date May 9, 2019
- SEAGATE TECHNOLOGY LLC
- Zhiyu Chen
- G01 - MEASURING TESTING