Zhong Chen

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multiple charged-particle beam apparatus with low crosstalk
- Patent number 12,211,669
- Issue date Jan 28, 2025
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Reassembly free deep packet inspection for peer to peer networks
- Patent number 12,095,779
- Issue date Sep 17, 2024
- SonicWALL Inc.
- Hui Ling
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Double coated tape
- Patent number 12,060,505
- Issue date Aug 13, 2024
- 3M Innovative Properties Company
- Jingjing Ma
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
In-die metrology methods and systems for process control
- Patent number 12,040,187
- Issue date Jul 16, 2024
- ASML Netherlands B.V.
- Lingling Pu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus using charged particle beams
- Patent number 11,961,697
- Issue date Apr 16, 2024
- ASML Netherlands B.V.
- Xuerang Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number RE49784
- Issue date Jan 2, 2024
- ASML Netherlands B.V.
- Weiming Ren
Information Patent Grant
Multiple charged-particle beam apparatus and methods
- Patent number 11,854,765
- Issue date Dec 26, 2023
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of inspecting samples with multiple beams of charged particles
- Patent number 11,815,473
- Issue date Nov 14, 2023
- ASML Netherlands B.V.
- Kuo-Feng Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus using multiple beams of charged particles
- Patent number 11,804,356
- Issue date Oct 31, 2023
- ASML Netherlands B.V.
- Xuerang Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rules execution system for IoT devices
- Patent number 11,768,823
- Issue date Sep 26, 2023
- Verizon Patent and Licensing Inc.
- Zhong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-beam inspection apparatus with improved detection performance...
- Patent number 11,721,521
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Weiming Ren
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Reassembly free deep packet inspection for peer to peer networks
- Patent number 11,695,784
- Issue date Jul 4, 2023
- SonicWALL Inc.
- Hui Ling
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron emitter and method of fabricating same
- Patent number 11,688,579
- Issue date Jun 27, 2023
- ASML Netherlands B.V.
- Juying Dou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged particle beams
- Patent number 11,676,793
- Issue date Jun 13, 2023
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus using charged particle beams
- Patent number 11,670,477
- Issue date Jun 6, 2023
- ASML Netherlands B.V.
- Xuerang Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam inspection apparatus with single-beam mode
- Patent number 11,594,396
- Issue date Feb 28, 2023
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electric-thermal performance and high-power density power module
- Patent number 11,569,815
- Issue date Jan 31, 2023
- Zhong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam inspection apparatus
- Patent number 11,538,655
- Issue date Dec 27, 2022
- ASML Netherlands B.V.
- Xuerang Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-die metrology methods and systems for process control
- Patent number 11,527,405
- Issue date Dec 13, 2022
- ASML Netherlands B.V.
- Lingling Pu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 11,513,087
- Issue date Nov 29, 2022
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
High temperature optoelectronic devices for power electronics
- Patent number 11,329,209
- Issue date May 10, 2022
- Zhong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus using multiple beams of charged particles
- Patent number 11,289,304
- Issue date Mar 29, 2022
- ASML Netherlands B.V.
- Xuerang Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressure-sensitive adhesive compositions for manufacturing electron...
- Patent number 11,286,407
- Issue date Mar 29, 2022
- 3M Innovative Properties Company
- John W. McAllister
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam inspection apparatus with improved detection performance...
- Patent number 11,282,675
- Issue date Mar 22, 2022
- ASML Netherlands B.V.
- Weiming Ren
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-cell detector for charged particles
- Patent number 11,222,766
- Issue date Jan 11, 2022
- ASML Netherlands B.V.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adhesive articles including a cushion layer and a continuous shell...
- Patent number 11,118,088
- Issue date Sep 14, 2021
- 3M Innovative Properties Company
- David J. Yarusso
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
On-chip IEC ESD protection using parasitic PNP devices
- Patent number 11,094,690
- Issue date Aug 17, 2021
- Board of Trustees of the University of Arkansas
- Zhong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus using multiple charged particle beams
- Patent number 11,062,874
- Issue date Jul 13, 2021
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reassembly free deep packet inspection for peer to peer networks
- Patent number 11,005,858
- Issue date May 11, 2021
- SonicWALL Inc.
- Hui Ling
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
REASSEMBLY FREE DEEP PACKET INSPECTION FOR PEER TO PEER NETWORKS
- Publication number 20250016178
- Publication date Jan 9, 2025
- SonicWALL US Holdings Inc.
- Hui Ling
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Polyester Polyol and Polyurethane Polymers Made Therefrom
- Publication number 20240409678
- Publication date Dec 12, 2024
- 3M Innovative Properties Company
- Yongshang Lu
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
MULTIPLE CHARGED-PARTICLE BEAM APPARATUS AND METHODS
- Publication number 20240145214
- Publication date May 2, 2024
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES
- Publication number 20240071711
- Publication date Feb 29, 2024
- ASML NETHERLANDS B.V.
- Xuerang HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
- Publication number 20240044820
- Publication date Feb 8, 2024
- ASML NETHERLANDS B.V.
- Kuo-Feng TSENG
- G01 - MEASURING TESTING
Information Patent Application
Email Subject Line Generation Method
- Publication number 20240005365
- Publication date Jan 4, 2024
- CONSTANT CONTACT, INC.
- Ming Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS USING CHARGED PARTICLE BEAMS
- Publication number 20230411110
- Publication date Dec 21, 2023
- ASML NETHERLANDS B.V.
- Xuerang HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REASSEMBLY FREE DEEP PACKET INSPECTION FOR PEER TO PEER NETWORKS
- Publication number 20230336570
- Publication date Oct 19, 2023
- SonicWALL US Holdings Inc.
- Hui Ling
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230137186
- Publication date May 4, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- G01 - MEASURING TESTING
Information Patent Application
HIGH-TEMPERATURE POWER MODULE INTEGRATED WITH AN OPTICALLY GALVANIC...
- Publication number 20230119193
- Publication date Apr 20, 2023
- Board of Trustees of the University of Arkansas
- Zhong Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
IN-DIE METROLOGY METHODS AND SYSTEMS FOR PROCESS CONTROL
- Publication number 20230076943
- Publication date Mar 9, 2023
- ASML NETHERLANDS B.V.
- Lingling PU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BEAM CURRENT ADJUSTMENT FOR CHARGED-PARTICLE INSPECTION SYSTEM
- Publication number 20230028799
- Publication date Jan 26, 2023
- ASML NETHERLANDS B.V.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20220375712
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM INSPECTION APPARATUS WITH IMPROVED DETECTION PERFORMANCE...
- Publication number 20220319808
- Publication date Oct 6, 2022
- ASML NETHERLANDS B.V.
- Weiming REN
- B82 - NANO-TECHNOLOGY
Information Patent Application
MULTIPLE LANDING ENERGY SCANNING ELECTRON MICROSCOPY SYSTEMS AND ME...
- Publication number 20220254599
- Publication date Aug 11, 2022
- ASML NETHERLANDS B.V.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES
- Publication number 20220223366
- Publication date Jul 14, 2022
- ASML NETHERLANDS B.V.
- Xuerang HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Polyisobutylene Adhesive Comprising Multifunctional Component with...
- Publication number 20220213358
- Publication date Jul 7, 2022
- 3M Innovative Properties Company
- Vasav Sahni
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
SYSTEM AND METHOD FOR ALIGNMENT OF SECONDARY BEAMS IN MULTI-BEAM IN...
- Publication number 20220189726
- Publication date Jun 16, 2022
- ASML NETHERLANDS B.V.
- Qingpo XI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON EMITTER AND METHOD OF FABRICATING SAME
- Publication number 20220189725
- Publication date Jun 16, 2022
- ASML NETHERLANDS B.V.
- Juying DOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR OBTAINING OPTICAL MEASUREMENTS IN A CHARGED PARTICLE...
- Publication number 20220084777
- Publication date Mar 17, 2022
- ASML NETHERLANDS B.V.
- Jan-Gerard Cornelis VAN DER TOORN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS USING MULTIPLE CHARGED PARTICLE BEAMS
- Publication number 20220005665
- Publication date Jan 6, 2022
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A Polyester Polyol and Polyurethane Polymers Made Therefrom
- Publication number 20210388149
- Publication date Dec 16, 2021
- 3M Innovative Properties Company
- Yongshang Lu
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
REASSEMBLY FREE DEEP PACKET INSPECTION FOR PEER TO PEER NETWORKS
- Publication number 20210234873
- Publication date Jul 29, 2021
- SonicWALL US Holdings Inc.
- Hui Ling
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MULTIPLE CHARGED-PARTICLE BEAM APPARATUS WITH LOW CROSSTALK
- Publication number 20210193437
- Publication date Jun 24, 2021
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM INSPECTION APPARATUS WITH IMPROVED DETECTION PERFORMANCE...
- Publication number 20210151291
- Publication date May 20, 2021
- ASML NETHERLANDS B.V.
- Weiming REN
- B82 - NANO-TECHNOLOGY
Information Patent Application
MULTI-BEAM INSPECTION APPARATUS
- Publication number 20210151280
- Publication date May 20, 2021
- ASML NETHERLANDS B.V.
- Xuerang HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRESSURE-SENSITIVE ADHESIVE COMPOSITIONS FOR MANUFACTURING ELECTRON...
- Publication number 20210130661
- Publication date May 6, 2021
- 3M Innovative Properties Company
- John W. McAllister
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20210116398
- Publication date Apr 22, 2021
- ASML NETHERLANDS B.V.
- Weiming REN
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE-SENSITIVE ADHESIVE COMPOSITIONS FOR ELECTRONIC BONDING APP...
- Publication number 20210102094
- Publication date Apr 8, 2021
- 3M Innovative Properties Company
- Pierre R. Bieber
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
POLYISOBUTYLENE ADHESIVE COMPRISING POLYOLEFIN COPOLYMER ADDITIVE
- Publication number 20210071041
- Publication date Mar 11, 2021
- 3M Innovative Properties Company
- Vasav Sahni
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...

Person

Patents Grantslast 30 patents

Multiple charged-particle beam apparatus with low crosstalk

Systems and methods for voltage contrast defect detection

Reassembly free deep packet inspection for peer to peer networks

Double coated tape

In-die metrology methods and systems for process control

Apparatus using charged particle beams

Apparatus of plural charged-particle beams

Multiple charged-particle beam apparatus and methods

Methods of inspecting samples with multiple beams of charged particles

Apparatus using multiple beams of charged particles

Rules execution system for IoT devices

Multi-beam inspection apparatus with improved detection performance...

Reassembly free deep packet inspection for peer to peer networks

Electron emitter and method of fabricating same

Apparatus of plural charged particle beams

Apparatus using charged particle beams

Multi-beam inspection apparatus with single-beam mode

High electric-thermal performance and high-power density power module

Multi-beam inspection apparatus

In-die metrology methods and systems for process control

Systems and methods for voltage contrast defect detection

High temperature optoelectronic devices for power electronics

Apparatus using multiple beams of charged particles

Pressure-sensitive adhesive compositions for manufacturing electron...

Multi-beam inspection apparatus with improved detection performance...

Multi-cell detector for charged particles

Adhesive articles including a cushion layer and a continuous shell...

On-chip IEC ESD protection using parasitic PNP devices

Apparatus using multiple charged particle beams

Reassembly free deep packet inspection for peer to peer networks

Patents Applicationslast 30 patents

REASSEMBLY FREE DEEP PACKET INSPECTION FOR PEER TO PEER NETWORKS

Polyester Polyol and Polyurethane Polymers Made Therefrom

MULTIPLE CHARGED-PARTICLE BEAM APPARATUS AND METHODS

APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES

METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES

Email Subject Line Generation Method

APPARATUS USING CHARGED PARTICLE BEAMS

REASSEMBLY FREE DEEP PACKET INSPECTION FOR PEER TO PEER NETWORKS

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

HIGH-TEMPERATURE POWER MODULE INTEGRATED WITH AN OPTICALLY GALVANIC...

IN-DIE METROLOGY METHODS AND SYSTEMS FOR PROCESS CONTROL

BEAM CURRENT ADJUSTMENT FOR CHARGED-PARTICLE INSPECTION SYSTEM

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

MULTI-BEAM INSPECTION APPARATUS WITH IMPROVED DETECTION PERFORMANCE...

MULTIPLE LANDING ENERGY SCANNING ELECTRON MICROSCOPY SYSTEMS AND ME...

APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES

Polyisobutylene Adhesive Comprising Multifunctional Component with...

SYSTEM AND METHOD FOR ALIGNMENT OF SECONDARY BEAMS IN MULTI-BEAM IN...

ELECTRON EMITTER AND METHOD OF FABRICATING SAME

APPARATUS FOR OBTAINING OPTICAL MEASUREMENTS IN A CHARGED PARTICLE...

APPARATUS USING MULTIPLE CHARGED PARTICLE BEAMS

A Polyester Polyol and Polyurethane Polymers Made Therefrom

REASSEMBLY FREE DEEP PACKET INSPECTION FOR PEER TO PEER NETWORKS

MULTIPLE CHARGED-PARTICLE BEAM APPARATUS WITH LOW CROSSTALK

MULTI-BEAM INSPECTION APPARATUS WITH IMPROVED DETECTION PERFORMANCE...

MULTI-BEAM INSPECTION APPARATUS

PRESSURE-SENSITIVE ADHESIVE COMPOSITIONS FOR MANUFACTURING ELECTRON...

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

PRESSURE-SENSITIVE ADHESIVE COMPOSITIONS FOR ELECTRONIC BONDING APP...

POLYISOBUTYLENE ADHESIVE COMPRISING POLYOLEFIN COPOLYMER ADDITIVE