ZHONGHUA DONG

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor charged particle detector for microscopy
- Patent number 12,205,792
- Issue date Jan 21, 2025
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Field programmable detector array
- Patent number 11,942,304
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switch matrix design for beam image system
- Patent number 11,862,427
- Issue date Jan 2, 2024
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of inspecting samples with multiple beams of charged particles
- Patent number 11,815,473
- Issue date Nov 14, 2023
- ASML Netherlands B.V.
- Kuo-Feng Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for charged particle detection
- Patent number 11,715,619
- Issue date Aug 1, 2023
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pixel shape and section shape selection for large active area high...
- Patent number 11,594,395
- Issue date Feb 28, 2023
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor charged particle detector for microscopy
- Patent number 11,508,547
- Issue date Nov 22, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switch matrix design for beam image system
- Patent number 11,476,085
- Issue date Oct 18, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field programmable detector array
- Patent number 11,430,629
- Issue date Aug 30, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for charged particle detection
- Patent number 11,295,930
- Issue date Apr 5, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detecting time-dependent defects in a fast...
- Patent number 11,175,248
- Issue date Nov 16, 2021
- ASML Netherlands B.V.
- Long Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser SDE effect compensation by adaptive tuning
- Patent number 9,601,311
- Issue date Mar 21, 2017
- Hermes Microvision Inc.
- Ying Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hot spot identification, inspection, and review
- Patent number 9,330,987
- Issue date May 3, 2016
- Hermes-Microvision, Inc.
- Steve Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle system for reticle/wafer defects inspection and re...
- Patent number 8,519,333
- Issue date Aug 27, 2013
- Hermes Microvision Inc.
- Chiyan Kuan
- G01 - MEASURING TESTING
Information Patent Grant
System and method to determine focus parameters during an electron...
- Patent number 7,705,298
- Issue date Apr 27, 2010
- Hermes Microvision, Inc. (Taiwan)
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
- Publication number 20240044820
- Publication date Feb 8, 2024
- ASML NETHERLANDS B.V.
- Kuo-Feng TSENG
- G01 - MEASURING TESTING
Information Patent Application
AN APPARATUS USING ENHANCED DEFLECTORS TO MANIPULATE CHARGED PARTIC...
- Publication number 20230178328
- Publication date Jun 8, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY
- Publication number 20230123152
- Publication date Apr 20, 2023
- ASML NETHERLANDS B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR HIGH THROUGHPUT DEFECT INSPECTION IN A CHARGE...
- Publication number 20230116381
- Publication date Apr 13, 2023
- ASML NETHERLANDS B.V.
- Long MA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCH MATRIX DESIGN FOR BEAM IMAGE SYSTEM
- Publication number 20230005707
- Publication date Jan 5, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD PROGRAMMABLE DETECTOR ARRAY
- Publication number 20220415608
- Publication date Dec 29, 2022
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION
- Publication number 20220375716
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20220301811
- Publication date Sep 22, 2022
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR FOCUSING CHARGED -PARTICLE BEAMS
- Publication number 20220068590
- Publication date Mar 3, 2022
- ASML NETHERLANDS B.V.
- Ying LUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARCHITECTURE FOR LARGE ACTIVE AREA HIGH SPEED DETECTOR
- Publication number 20210134557
- Publication date May 6, 2021
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL SHAPE AND SECTION SHAPE SELECTION FOR LARGE ACTIVE AREA HIGH...
- Publication number 20210043416
- Publication date Feb 11, 2021
- ASML Netherlands B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF INSPECTING SAMPLES WITH MULTIPLE BEAMS OF CHARGED PARTICLES
- Publication number 20200271598
- Publication date Aug 27, 2020
- ASML NETHERLANDS B.V.
- Kuo-Feng TSENG
- G01 - MEASURING TESTING
Information Patent Application
SWITCH MATRIX DESIGN FOR BEAM IMAGE SYSTEM
- Publication number 20200227229
- Publication date Jul 16, 2020
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD PROGRAMMABLE DETECTOR ARRAY
- Publication number 20200219696
- Publication date Jul 9, 2020
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DETECTING TIME-DEPENDENT DEFECTS IN A FAST...
- Publication number 20200088659
- Publication date Mar 19, 2020
- ASML NETHERLANDS B.V.
- Long MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION
- Publication number 20200027694
- Publication date Jan 23, 2020
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY
- Publication number 20190378682
- Publication date Dec 12, 2019
- ASML Netherlands B.V.
- Yongxin Wang
- G01 - MEASURING TESTING
Information Patent Application
Laser SDE Effect Compensation by Adaptive Tuning
- Publication number 20160260579
- Publication date Sep 8, 2016
- HERMES MICROVISION INC.
- Ying Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hot Spot Identification, Inspection, and Review
- Publication number 20150069232
- Publication date Mar 12, 2015
- Hermes-Microvision, Inc.
- Steve Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SYSTEM FOR RETICLE / WAFER DEFECTS INSPECTION AND...
- Publication number 20120280125
- Publication date Nov 8, 2012
- HERMES MICROVISION INC.
- CHIYAN KUAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO DETERMINE FOCUS PARAMETERS DURING AN ELECTRON...
- Publication number 20090108199
- Publication date Apr 30, 2009
- Hermes Microvision, Inc. (TAIWAN)
- Xuedong LIU
- H01 - BASIC ELECTRIC ELEMENTS

ZHONGHUA DONG

Person

Patents Grantslast 30 patents

Semiconductor charged particle detector for microscopy

Cross-talk cancellation in multiple charged-particle beam inspection

Field programmable detector array

Switch matrix design for beam image system

Methods of inspecting samples with multiple beams of charged particles

Method and apparatus for charged particle detection

Pixel shape and section shape selection for large active area high...

Semiconductor charged particle detector for microscopy

Switch matrix design for beam image system

Field programmable detector array

Method and apparatus for charged particle detection

Apparatus and method for detecting time-dependent defects in a fast...

Laser SDE effect compensation by adaptive tuning

Hot spot identification, inspection, and review

Charged particle system for reticle/wafer defects inspection and re...

System and method to determine focus parameters during an electron...

Patents Applicationslast 30 patents

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES

AN APPARATUS USING ENHANCED DEFLECTORS TO MANIPULATE CHARGED PARTIC...

SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY

SYSTEM AND METHOD FOR HIGH THROUGHPUT DEFECT INSPECTION IN A CHARGE...

SWITCH MATRIX DESIGN FOR BEAM IMAGE SYSTEM

FIELD PROGRAMMABLE DETECTOR ARRAY

METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

SYSTEMS AND METHODS FOR FOCUSING CHARGED -PARTICLE BEAMS

ARCHITECTURE FOR LARGE ACTIVE AREA HIGH SPEED DETECTOR

PIXEL SHAPE AND SECTION SHAPE SELECTION FOR LARGE ACTIVE AREA HIGH...

METHODS OF INSPECTING SAMPLES WITH MULTIPLE BEAMS OF CHARGED PARTICLES

SWITCH MATRIX DESIGN FOR BEAM IMAGE SYSTEM

FIELD PROGRAMMABLE DETECTOR ARRAY

APPARATUS AND METHOD FOR DETECTING TIME-DEPENDENT DEFECTS IN A FAST...

METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION

SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY

Laser SDE Effect Compensation by Adaptive Tuning

Hot Spot Identification, Inspection, and Review

CHARGED PARTICLE SYSTEM FOR RETICLE / WAFER DEFECTS INSPECTION AND...

SYSTEM AND METHOD TO DETERMINE FOCUS PARAMETERS DURING AN ELECTRON...