Zhounan Wang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for monitoring alignment between contact holes and polycryst...
- Patent number 9,080,863
- Issue date Jul 14, 2015
- SHANGAI HUALI MICROELECTRONICS CORPORATION
- Qiliang Ni
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MONITORING ALIGNMENT BETWEEN CONTACT HOLES AND POLYCRYST...
- Publication number 20130342842
- Publication date Dec 26, 2013
- Shangai Huali Microelectronics Corporation
- Qiliang Ni
- G01 - MEASURING TESTING