Ziad Noun

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Baalbeck, LB

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Patents Grantslast 30 patents

Information Patent Grant
System and method for wirelessly testing integrated circuits
- Patent number 8,792,835
- Issue date Jul 29, 2014
- Centre National de la Recherche Scientifique
- David Andreu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Wirelessly Testing Integrated Circuits
- Publication number 20110244814
- Publication date Oct 6, 2011
- Centre National De La Recherche Scientifique-cnrs
- David Andreu
- G01 - MEASURING TESTING