Zijie Hua

Person

Harbin, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Dark-field confocal microscopy measurement apparatus based on vorte...
- Patent number 12,313,563
- Issue date May 27, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,276,615
- Issue date Apr 15, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopic measurement apparatus and method ba...
- Patent number 12,216,264
- Issue date Feb 4, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,204,081
- Issue date Jan 21, 2025
- Harbin Institute of Technology
- Jian Liu
- G02 - OPTICS
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,203,867
- Issue date Jan 21, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Vortex dichroism dark-field confocal microscopy measurement apparat...
- Patent number 12,196,686
- Issue date Jan 14, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Differential dark-field confocal microscopic measurement apparatus...
- Patent number 12,111,453
- Issue date Oct 8, 2024
- Harbin Institute of Technology
- Jian Liu
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...
- Publication number 20250138295
- Publication date May 1, 2025
- HARBIN INSTITUTE OF TECHNOLOGY
- Jian LIU
- G01 - MEASURING TESTING
Information Patent Application
DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...
- Publication number 20240329377
- Publication date Oct 3, 2024
- HARBIN INSTITUTE OF TECHNOLOGY
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS...
- Publication number 20240310613
- Publication date Sep 19, 2024
- HARBIN INSTITUTE OF TECHNOLOGY
- Jian Liu
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Dark-field confocal microscopy measurement apparatus based on vorte...

Dark-field confocal microscopy measurement apparatus and method bas...

Dark-field confocal microscopic measurement apparatus and method ba...

Dark-field confocal microscopy measurement apparatus and method bas...

Dark-field confocal microscopy measurement apparatus and method bas...

Vortex dichroism dark-field confocal microscopy measurement apparat...

Differential dark-field confocal microscopic measurement apparatus...

Patents Applicationslast 30 patents

DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...

DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...

DIFFERENTIAL DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS...