Zongchang Yu

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic updates for the inspection of integrated circuits
- Patent number 10,565,702
- Issue date Feb 18, 2020
- Dongfang Jingyuan Electron Limited
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect prediction of integrated circuits
- Patent number 10,140,400
- Issue date Nov 27, 2018
- Dongfang Jingyuan Electron Limited
- Zongchang Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Guided defect detection of integrated circuits
- Patent number 10,133,838
- Issue date Nov 20, 2018
- Dongfang Jingyuan Electron Limited
- Hua-Yu Liu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Defect Prediction of Integrated Circuits
- Publication number 20180218096
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zongchang Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Guided Defect Detection of Integrated Circuits
- Publication number 20180218090
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Hua-Yu Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Identifying Defects Of Integrated Circuits
- Publication number 20180218492
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Updates for the Inspection of Integrated Circuits
- Publication number 20180218493
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING