Zongtao GE

Person

Saitama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical wave interference measuring apparatus
- Patent number 8,059,278
- Issue date Nov 15, 2011
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Optical wave interference measuring apparatus
- Patent number 7,982,882
- Issue date Jul 19, 2011
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Light wave interferometer apparatus
- Patent number 7,880,897
- Issue date Feb 1, 2011
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring amount of eccentricity
- Patent number 7,792,366
- Issue date Sep 7, 2010
- Fujinon Corporation
- Zongtao Ge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wavefront measuring apparatus for optical pickup
- Patent number 7,719,691
- Issue date May 18, 2010
- Fujinon Corporation
- Zongtao Ge
- G11 - INFORMATION STORAGE
Information Patent Grant
Wavefront-measuring interferometer apparatus, and light beam measur...
- Patent number 7,538,890
- Issue date May 26, 2009
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Sample inclination measuring method
- Patent number 7,245,384
- Issue date Jul 17, 2007
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Low coherent interference fringe analysis method
- Patent number 7,119,907
- Issue date Oct 10, 2006
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Method of extracting circular region from fringe image
- Patent number 6,950,191
- Issue date Sep 27, 2005
- Fujinon Corporation
- Zongtao Ge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of assisting sample inclination error adjustment
- Patent number 6,947,149
- Issue date Sep 20, 2005
- Fujinon Corporation
- Fumio Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Phase shift fringe analysis method and apparatus using the same
- Patent number 6,778,281
- Issue date Aug 17, 2004
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Fringe analysis method using fourier transform
- Patent number 6,768,554
- Issue date Jul 27, 2004
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting posture of object and apparatus using the same
- Patent number 6,707,559
- Issue date Mar 16, 2004
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Fringe analysis method using fourier transform
- Patent number 6,693,715
- Issue date Feb 17, 2004
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Fringe analysis method and apparatus using Fourier transform
- Patent number 6,621,579
- Issue date Sep 16, 2003
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Fringe analysis error detection method and fringe analysis error co...
- Patent number 6,532,073
- Issue date Mar 11, 2003
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS
- Publication number 20110304856
- Publication date Dec 15, 2011
- FUJIFILM CORPORATION
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
ASPHERIC SURFACE MEASURING APPARATUS
- Publication number 20110242545
- Publication date Oct 6, 2011
- FUJIFILM CORPORATION
- MASAAKI TOMIMIZU
- G01 - MEASURING TESTING
Information Patent Application
ASPHERE MEASUREMENT METHOD AND APPARATUS
- Publication number 20100309458
- Publication date Dec 9, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING AMOUNT OF ECCENTRICITY
- Publication number 20100245804
- Publication date Sep 30, 2010
- Zongtao GE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS OF MEASURING POSITIONAL VARIATION OF ROTATION...
- Publication number 20100246900
- Publication date Sep 30, 2010
- Zongtao GE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE
- Publication number 20100231923
- Publication date Sep 16, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
LIGHTWAVE INTERFERENCE MEASUREMENT DEVICE
- Publication number 20100201992
- Publication date Aug 12, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVE INTERFERENCE MEASURING APPARATUS
- Publication number 20100097619
- Publication date Apr 22, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVE INTERFERENCE MEASURING APPARATUS
- Publication number 20100091299
- Publication date Apr 15, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
OMNIDIRECTIONAL IMAGING APPARATUS
- Publication number 20090309957
- Publication date Dec 17, 2009
- Zongtao GE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LIGHT WAVE INTERFEROMETER APPARATUS
- Publication number 20090168076
- Publication date Jul 2, 2009
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT MEASURING APPARATUS FOR OPTICAL PICKUP
- Publication number 20090073459
- Publication date Mar 19, 2009
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
Wavefront-measuring interferometer apparatus, and light beam measur...
- Publication number 20050270543
- Publication date Dec 8, 2005
- Fujinon Corporation
- Zongtao Ge
- G02 - OPTICS
Information Patent Application
Method of extracting circular region from fringe image
- Publication number 20040001195
- Publication date Jan 1, 2004
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample inclination measuring method
- Publication number 20040001205
- Publication date Jan 1, 2004
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Application
Low coherent interference fringe analysis method
- Publication number 20030234938
- Publication date Dec 25, 2003
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Application
Method of assisting sample inclination error adjustment
- Publication number 20030227633
- Publication date Dec 11, 2003
- Fuji Photo Optical Co., Ltd.
- Fumio Kobayashi
- G02 - OPTICS
Information Patent Application
Phase shift fringe analysis method and apparatus using the same
- Publication number 20020135777
- Publication date Sep 26, 2002
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting posture of object and apparatus using the same
- Publication number 20020113973
- Publication date Aug 22, 2002
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Application
Fringe analysis error detection method and fringe analysis error co...
- Publication number 20020051134
- Publication date May 2, 2002
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Application
Fringe analysis method using fourier transform
- Publication number 20010049709
- Publication date Dec 6, 2001
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Application
Fringe analysis method and apparatus using fourier transform
- Publication number 20010030753
- Publication date Oct 18, 2001
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Application
Fringe analysis method using fourier transform
- Publication number 20010019635
- Publication date Sep 6, 2001
- Zongtao Ge
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Optical wave interference measuring apparatus

Optical wave interference measuring apparatus

Light wave interferometer apparatus

Method of measuring amount of eccentricity

Wavefront measuring apparatus for optical pickup

Wavefront-measuring interferometer apparatus, and light beam measur...

Sample inclination measuring method

Low coherent interference fringe analysis method

Method of extracting circular region from fringe image

Method of assisting sample inclination error adjustment

Phase shift fringe analysis method and apparatus using the same

Fringe analysis method using fourier transform

Method of detecting posture of object and apparatus using the same

Fringe analysis method using fourier transform

Fringe analysis method and apparatus using Fourier transform

Fringe analysis error detection method and fringe analysis error co...

Patents Applicationslast 30 patents

LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS

ASPHERIC SURFACE MEASURING APPARATUS

ASPHERE MEASUREMENT METHOD AND APPARATUS

METHOD OF MEASURING AMOUNT OF ECCENTRICITY

METHOD AND APPARATUS OF MEASURING POSITIONAL VARIATION OF ROTATION...

THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE

LIGHTWAVE INTERFERENCE MEASUREMENT DEVICE

OPTICAL WAVE INTERFERENCE MEASURING APPARATUS

OPTICAL WAVE INTERFERENCE MEASURING APPARATUS

OMNIDIRECTIONAL IMAGING APPARATUS

LIGHT WAVE INTERFEROMETER APPARATUS

WAVEFRONT MEASURING APPARATUS FOR OPTICAL PICKUP

Wavefront-measuring interferometer apparatus, and light beam measur...

Method of extracting circular region from fringe image

Sample inclination measuring method

Low coherent interference fringe analysis method

Method of assisting sample inclination error adjustment

Phase shift fringe analysis method and apparatus using the same

Method of detecting posture of object and apparatus using the same

Fringe analysis error detection method and fringe analysis error co...

Fringe analysis method using fourier transform

Fringe analysis method and apparatus using fourier transform

Fringe analysis method using fourier transform