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Zunhang Yu Kasnavi
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Sunnyvale, CA, US
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last 30 patents
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Patent Grant
Delay test circuitry
Patent number
8,531,196
Issue date
Sep 10, 2013
Altera Corporation
Jaydev Amit Shelat
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for equalizer testing
Patent number
7,952,376
Issue date
May 31, 2011
Altera Corporation
Zunhang Yu Kasnavi
G01 - MEASURING TESTING