Zunhang Yu Kasnavi

Person

  • Sunnyvale, CA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Delay test circuitry

    • Patent number 8,531,196
    • Issue date Sep 10, 2013
    • Altera Corporation
    • Jaydev Amit Shelat
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and apparatus for equalizer testing

    • Patent number 7,952,376
    • Issue date May 31, 2011
    • Altera Corporation
    • Zunhang Yu Kasnavi
    • G01 - MEASURING TESTING