Zvi Nir

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Karmei Yosef, IL

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Patents Grantslast 30 patents

Information Patent Grant
System and method for scanning an object with an electron beam usin...
- Patent number 10,541,104
- Issue date Jan 21, 2020
- Applied Materials Israel Ltd.
- Uri Lev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern invariant focusing of a charged particle beam
- Patent number 7,759,642
- Issue date Jul 20, 2010
- Applied Materials Israel, Ltd.
- Zvi Nir
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM INFLUENCING DEV...
- Publication number 20190019649
- Publication date Jan 17, 2019
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SCANNING AN OBJECT WITH AN ELECTRON BEAM
- Publication number 20170011883
- Publication date Jan 12, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Uri Lev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Invariant Focusing of a Charged Particle Beam
- Publication number 20090272900
- Publication date Nov 5, 2009
- Zvi Nir
- H01 - BASIC ELECTRIC ELEMENTS