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Zvika Rosenberg
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Jerusalem, IL
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for determining a cross sectional feature of a st...
Patent number
7,910,885
Issue date
Mar 22, 2011
Applied Materials Israel, Ltd.
Zvika Rosenberg
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam column and method for directing a charged par...
Patent number
7,223,974
Issue date
May 29, 2007
Applied Materials, Israel, Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam column and method of its operation
Patent number
7,067,807
Issue date
Jun 27, 2006
Applied Materials, Israel, Ltd.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for use in the monitoring of samples with a charg...
Patent number
7,034,297
Issue date
Apr 25, 2006
Applied Materials, Israel, Ltd.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Grant
Deflection method and system for use in a charged particle beam column
Patent number
6,825,475
Issue date
Nov 30, 2004
Applied Materials Israel, Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and method for inspecting samples
Patent number
6,674,075
Issue date
Jan 6, 2004
Applied Materials, Inc.
Igor Petrov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System and method for determining a cross sectional feature of a st...
Publication number
20070051888
Publication date
Mar 8, 2007
Zvika Rosenberg
G01 - MEASURING TESTING
Information
Patent Application
Charged particle beam column and method of its operation
Publication number
20060049348
Publication date
Mar 9, 2006
APPLIED MATERIALS, INC.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Application
Method and system for use in the monitoring of samples with a charg...
Publication number
20040173746
Publication date
Sep 9, 2004
Applied Materials Israel Ltd.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Application
Deflection method and system for use in a charged particle beam column
Publication number
20040056207
Publication date
Mar 25, 2004
Applied Materials Israel Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged particle beam column and method for directing a charged par...
Publication number
20030218133
Publication date
Nov 27, 2003
Applied Materials Israel Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR INSPECTING SAMPLES
Publication number
20030209667
Publication date
Nov 13, 2003
Applied Materials Israel Ltd.
Igor Petrov
G01 - MEASURING TESTING