3D motion

Industry

CPC
G01N2201/1035

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/10353D motion

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Programmable digital machine vision inspection system
- Patent number 9,626,753
- Issue date Apr 18, 2017
- Tyco Electronics (Shanghai) Co. Ltd.
- Yingcong Deng
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 8,451,439
- Issue date May 28, 2013
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 8,149,395
- Issue date Apr 3, 2012
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 7,911,601
- Issue date Mar 22, 2011
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 7,446,866
- Issue date Nov 4, 2008
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 7,081,953
- Issue date Jul 25, 2006
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 6,831,737
- Issue date Dec 14, 2004
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis method and apparatus
- Patent number 5,055,679
- Issue date Oct 8, 1991
- Hitachi, Ltd.
- Ken Ninomiya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the automated analysis of three-dimensiona...
- Patent number 5,030,008
- Issue date Jul 9, 1991
- KLA Instruments, Corporation
- Richard S. F. Scott
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Tomography System and Method for Large-volume Recordings
- Publication number 20170123083
- Publication date May 4, 2017
- Robert Divoky
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING PATTERN
- Publication number 20120176602
- Publication date Jul 12, 2012
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING PATTERN
- Publication number 20110170092
- Publication date Jul 14, 2011
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Inspecting Pattern
- Publication number 20090066943
- Publication date Mar 12, 2009
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting pattern
- Publication number 20060256328
- Publication date Nov 16, 2006
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting pattern
- Publication number 20050062961
- Publication date Mar 24, 2005
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting pattern
- Publication number 20030020904
- Publication date Jan 30, 2003
- Sachio Uto
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Programmable digital machine vision inspection system

Apparatus and method for inspecting pattern

Apparatus and method for inspecting pattern

Apparatus and method for inspecting pattern

Apparatus and method for inspecting pattern

Apparatus and method for inspecting pattern

Apparatus and method for inspecting pattern

Surface analysis method and apparatus

Method and apparatus for the automated analysis of three-dimensiona...

Patents Applicationslast 30 patents

Tomography System and Method for Large-volume Recordings

APPARATUS AND METHOD FOR INSPECTING PATTERN

APPARATUS AND METHOD FOR INSPECTING PATTERN

Apparatus And Method For Inspecting Pattern

Apparatus and method for inspecting pattern

Apparatus and method for inspecting pattern

Apparatus and method for inspecting pattern