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G01N2201/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2201/00
Features of devices classified in G01N21/00
Sub Industries
G01N2201/02
Mechanical
G01N2201/021
Special mounting in general
G01N2201/0212
Liquid borne swimming apparatus
G01N2201/0214
Airborne
G01N2201/0216
Vehicle borne
G01N2201/0218
Submersible, submarine
G01N2201/022
Casings
G01N2201/0221
Portable cableless compact hand-held
G01N2201/0222
Pocket size
G01N2201/0224
Pivoting casing
G01N2201/0225
Part of casing being slidable, telescopic
G01N2201/0227
Sealable enclosure
G01N2201/0228
Moulded parts
G01N2201/023
Controlling conditions in casing
G01N2201/0231
Thermostating
G01N2201/0233
Gas purge
G01N2201/0235
with gas filters in casing
G01N2201/0236
Explosion proof
G01N2201/0238
Moisture monitoring or controlling
G01N2201/024
Modular construction
G01N2201/0245
with insertable-removable part
G01N2201/025
Mechanical control of operations
G01N2201/0253
Switches mounted at the casing
G01N2201/0256
Sensor for insertion of sample, cuvette, test strip
G01N2201/04
Batch operation multisample devices
G01N2201/0407
with multiple optical units
G01N2201/0415
Carrusel, sequential
G01N2201/0423
with rotating optics
G01N2201/043
optics constituted by optical fibre multiplex selector
G01N2201/0438
Linear motion, sequential
G01N2201/0446
Multicell plate, sequential
G01N2201/0453
Multicell sequential and multitest
G01N2201/0461
Simultaneous
G01N2201/0469
One cell, sequential
G01N2201/0476
Keyboard controlled
G01N2201/0484
Computer controlled
G01N2201/0492
Automatised microscope
G01N2201/06
Illumination Optics
G01N2201/061
Sources
G01N2201/06106
Plural sources used for calibration
G01N2201/06113
Coherent sources lasers
G01N2201/0612
Laser diodes
G01N2201/06126
Large diffuse sources
G01N2201/06133
Light tables
G01N2201/0614
Diffusing light tube with sample within
G01N2201/06146
Multisources for homogeneisation, as well sequential as simultaneous operation
G01N2201/06153
the sources being LED's
G01N2201/0616
Ambient light is used
G01N2201/06166
Line selective sources
G01N2201/06173
IR sources from heated molecular species
G01N2201/0618
Halogene sources
G01N2201/06186
Resistance heated wire sources lamelle sources
G01N2201/06193
Secundary in-situ sources
G01N2201/062
LED's
G01N2201/0621
Supply
G01N2201/0622
Use of a compensation LED
G01N2201/0623
Use of a reference LED
G01N2201/0624
Compensating variation in output of LED source
G01N2201/0625
Modulated LED
G01N2201/0626
Use of several LED's for spatial resolution
G01N2201/0627
Use of several LED's for spectral resolution
G01N2201/0628
Organic LED [OLED]
G01N2201/063
Illuminating optical parts
G01N2201/0631
Homogeneising elements
G01N2201/0632
homogeneising by integrating sphere
G01N2201/0633
Directed, collimated illumination
G01N2201/0634
Diffuse illumination
G01N2201/0635
Structured illumination
G01N2201/0636
Reflectors
G01N2201/0637
Elliptic
G01N2201/0638
Refractive parts
G01N2201/0639
Sphere lens
G01N2201/064
Stray light conditioning
G01N2201/0642
Light traps baffles
G01N2201/0644
Simple baffled tube construction
G01N2201/0646
Light seals
G01N2201/0648
Shutters
G01N2201/065
Integrating spheres
G01N2201/0655
Hemispheres
G01N2201/066
Modifiable path multiple paths in one sample
G01N2201/0662
Comparing measurements on two or more paths in one sample
G01N2201/0664
Using two ways
G01N2201/0666
Selectable paths insertable multiple sources
G01N2201/0668
Multiple paths optimisable path length
G01N2201/067
Electro-optic, magneto-optic, acousto-optic elements
G01N2201/0675
SLM
G01N2201/068
Optics, miscellaneous
G01N2201/0683
Brewster plate polarisation controlling elements
G01N2201/0686
Cold filter IR filter
G01N2201/069
Supply of sources
G01N2201/0691
Modulated (not pulsed supply)
G01N2201/0692
Regulated sources stabilised supply
G01N2201/0693
Battery powered circuitry
G01N2201/0694
Microprocessor controlled supply
G01N2201/0695
Supply to maintain constant beam intensity
G01N2201/0696
Pulsed
G01N2201/0697
Pulsed lasers
G01N2201/0698
Using reference pulsed source
G01N2201/0699
Randomly pulsed source
G01N2201/08
Optical fibres light guides
G01N2201/0806
Light rod
G01N2201/0813
Arrangement of collimator tubes, glass or empty
G01N2201/082
Fibres for a reference path
G01N2201/0826
Fibre array at source, distributing
G01N2201/0833
Fibre array at detector, resolving
G01N2201/084
Fibres for remote transmission
G01N2201/0846
Fibre interface with sample
G01N2201/0853
Movable fibre optical member
G01N2201/086
Modular construction
G01N2201/0866
Use of GRIN elements
G01N2201/0873
Using optically integrated constructions
G01N2201/088
Using a sensor fibre
G01N2201/0886
and using OTDR
G01N2201/0893
Using fibres for resolution in time
G01N2201/10
Scanning
G01N2201/101
Scanning measuring head
G01N2201/102
Video camera
G01N2201/103
Scanning by mechanical motion of stage
G01N2201/1035
3D motion
G01N2201/104
Mechano-optical scan
G01N2201/1042
X, Y scan
G01N2201/1045
Spiral scan
G01N2201/1047
with rotating optics and moving stage
G01N2201/105
Purely optical scan
G01N2201/1053
System of scan mirrors for composite motion of beam
G01N2201/1056
Prism scan, diasporameter
G01N2201/106
Acousto-optical scan
G01N2201/107
CRT flying spot scan
G01N2201/108
Miscellaneous
G01N2201/1082
Descanning
G01N2201/1085
Using optical fibre array and scanner
G01N2201/1087
Focussed scan beam
G01N2201/11
Monitoring and controlling the scan
G01N2201/112
Grating pulse time encoder
G01N2201/115
Optical equalisation of scan intensity
G01N2201/117
Indexed, memorised or programmed scan
G01N2201/12
Circuits of general importance Signal processing
G01N2201/121
Correction signals
G01N2201/1211
for temperature
G01N2201/1212
and switch-off from upwarming
G01N2201/1214
for humidity
G01N2201/1215
for interfering gases
G01N2201/1217
for index of solution, carrying fluids
G01N2201/1218
for pressure variations
G01N2201/122
Kinetic analysis determining reaction rate
G01N2201/1222
Endpoint determination reaction time determination
G01N2201/1224
Polymerisation
G01N2201/1226
Relaxation methods
G01N2201/1228
Reading time being controlled
G01N2201/123
Conversion circuit
G01N2201/1232
Log representation
G01N2201/1235
Measuring or displaying selectably absorbance or density
G01N2201/1237
Measuring extrema
G01N2201/124
Sensitivity
G01N2201/1241
Multirange
G01N2201/1242
Validating
G01N2201/1244
Ambient light detector
G01N2201/1245
Averaging several measurements
G01N2201/1247
Thresholding
G01N2201/1248
Validating from signal shape, slope, peak
G01N2201/125
Digital circuitry
G01N2201/126
Microprocessor processing
G01N2201/1263
Microprocessor is used as variant to separate part circuits
G01N2201/1266
Interface card
G01N2201/127
Calibration base line adjustment drift compensation
G01N2201/12707
Pre-test of apparatus
G01N2201/12715
Zero adjustment
G01N2201/12723
Self check capacity automatic, periodic step of checking
G01N2201/1273
Check triggered by sensing conditions
G01N2201/12738
Selectively initiating check
G01N2201/12746
Calibration values determination
G01N2201/12753
and storage
G01N2201/12761
Precalibration
G01N2201/12769
and adjusting controls
G01N2201/12776
Automatic scaling up
G01N2201/12784
Base line obtained from computation, histogram
G01N2201/12792
Compensating own radiation in apparatus
G01N2201/128
Alternating sample and standard or reference part in one path
G01N2201/1281
Reflecting part
G01N2201/1283
Opaque part
G01N2201/1285
Standard cuvette
G01N2201/1286
More than one cuvette
G01N2201/1288
Calibration medium periodically inserted in one cell
G01N2201/129
Using chemometrical methods
G01N2201/1293
resolving multicomponent spectra
G01N2201/1296
using neural networks
G01N2201/13
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Patents Grants
last 30 patents
Information
Patent Grant
Organic plant material microbial test kit devices and processing me...
Patent number
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Issue date
Jul 22, 2025
Craig Ellins
G01 - MEASURING TESTING
Information
Patent Grant
Estimating soil properties within a field using hyperspectral remot...
Patent number
12,366,678
Issue date
Jul 22, 2025
CLIMATE LLC
Nick Cisek
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface-enhanced Raman scattering substrate for fuel oil analysis
Patent number
12,366,534
Issue date
Jul 22, 2025
King Fahd University of Petroleum & Minerals
Abdulaziz Abdulrahman Al-Saadi
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Systems and methods for live projection imaging for fluorescence mi...
Patent number
12,366,740
Issue date
Jul 22, 2025
The Board of Regents of the University of Texas System
Reto Fiolka
G01 - MEASURING TESTING
Information
Patent Grant
Optical transmission sample holder and analysis, particularly for h...
Patent number
12,366,520
Issue date
Jul 22, 2025
ESSENLIX CORPORATION
Stephen Y. Chou
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Fruit maturity and quality scanning
Patent number
12,366,524
Issue date
Jul 22, 2025
Colorado State University Research Foundation
Ioannis Minas
G01 - MEASURING TESTING
Information
Patent Grant
Phase retrieval
Patent number
12,366,525
Issue date
Jul 22, 2025
Applied Materials Israel Ltd.
Benny Kirshner
G01 - MEASURING TESTING
Information
Patent Grant
System including a fiber laser module
Patent number
12,366,532
Issue date
Jul 22, 2025
Atonarp Inc.
Mateusz Plewicki
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
12,366,538
Issue date
Jul 22, 2025
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for determining optical density of a solution
Patent number
12,366,528
Issue date
Jul 22, 2025
Cytiva Sweden AB
Hanno Ehring
G01 - MEASURING TESTING
Information
Patent Grant
Use of vibrational spectroscopy for microfluidic liquid measurement
Patent number
12,364,984
Issue date
Jul 22, 2025
1087 Systems, Inc.
Matthias Wagner
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Measuring apparatus and method for roughness and/or defect measurem...
Patent number
12,366,445
Issue date
Jul 22, 2025
ASML Netherlands B.V.
Alexander Von Finck
G01 - MEASURING TESTING
Information
Patent Grant
Colorimeter optical measurement interference mitigation
Patent number
12,366,522
Issue date
Jul 22, 2025
Hach Company
Russell Paul Gorham
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection device
Patent number
12,366,539
Issue date
Jul 22, 2025
HITACHI HIGH-TECH CORPORATION
Katsuhiko Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Laser shearography end effector for industrial robot system
Patent number
12,360,057
Issue date
Jul 15, 2025
Wichita State University
John Tomblin
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Inspection system and inspection method using the same
Patent number
12,360,055
Issue date
Jul 15, 2025
Samsung Display Co., Ltd.
Sungwoo Jung
G01 - MEASURING TESTING
Information
Patent Grant
Short-wave infrared materials, detectors, and methods
Patent number
12,364,157
Issue date
Jul 15, 2025
Honda Motor Co., Ltd.
Gugang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Characteristic information extraction method and portable detection...
Patent number
12,360,047
Issue date
Jul 15, 2025
Jiangsu University
Quansheng Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and methods for the estimation of soil unconfined compres...
Patent number
12,360,048
Issue date
Jul 15, 2025
King Fahd University of Petroleum & Minerals
Yakubu Sani Wudil
G01 - MEASURING TESTING
Information
Patent Grant
Surface plasmon resonance imaging apparatus and method
Patent number
12,352,696
Issue date
Jul 8, 2025
Electronics and Telecommunications Research Institute
Soocheol Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for amplifying and detecting gene
Patent number
12,351,864
Issue date
Jul 8, 2025
Electronics and Telecommunications Research Institute
Jin Tae Kim
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mueller matrix ellipsometer
Patent number
12,352,687
Issue date
Jul 8, 2025
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Thomas Avery Germer
G01 - MEASURING TESTING
Information
Patent Grant
Protective sheet fixing jig and auto visual inspection system inclu...
Patent number
12,352,699
Issue date
Jul 8, 2025
Samsung Display Co., Ltd.
Woongil Choi
G01 - MEASURING TESTING
Information
Patent Grant
Light sheet microscope with line focus
Patent number
12,352,941
Issue date
Jul 8, 2025
Miltenyi Biotec B.V. & Co. KG
Heinrich Spiecker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Apparatus and method for measuring the light absorbance of a substa...
Patent number
12,352,685
Issue date
Jul 8, 2025
Cytiva Sweden AB
Hanno Ehring
G01 - MEASURING TESTING
Information
Patent Grant
Method of analyzing degree of hydrogenation of hydrogenated diene p...
Patent number
12,352,691
Issue date
Jul 8, 2025
Sumitomo Rubber Industries, Ltd.
Yusuke Shibata
G01 - MEASURING TESTING
Information
Patent Grant
Automated control of cell culture using Raman spectroscopy
Patent number
12,352,625
Issue date
Jul 8, 2025
Lonza Ltd
Thaddaeus Webster
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
In-line gas sensor and sensing methods
Patent number
12,352,690
Issue date
Jul 8, 2025
INTEGRITY COMMUNICATIONS SOLUTIONS, INC.
Michael Lenn Tipton
G01 - MEASURING TESTING
Information
Patent Grant
Multiple superposition detection system and method for capacitor ap...
Patent number
12,352,700
Issue date
Jul 8, 2025
Zhaoqing University
Rongrong Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for shortwave infrared photothermal (SWIP) mic...
Patent number
12,352,944
Issue date
Jul 8, 2025
Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
Publication number
20250237615
Publication date
Jul 24, 2025
HITACHI HIGH-TECH CORPORATION
Yuta URANO
G01 - MEASURING TESTING
Information
Patent Application
DEVICES, SYSTEMS AND METHODS FOR DETECTING MICROBIAL ACTIVITY
Publication number
20250237610
Publication date
Jul 24, 2025
The Procter & Gamble Company
Lucia MENDEZ-MATA
G01 - MEASURING TESTING
Information
Patent Application
POLARIZER ASSEMBLY AND SPECTROSCOPIC ELLIPSOMETER INCLUDING THE SAME
Publication number
20250237861
Publication date
Jul 24, 2025
Samsung Electronics Co., Ltd.
Jiyong Shin
G02 - OPTICS
Information
Patent Application
DEVICES FOR BIOLOGICAL ANALYSIS
Publication number
20250237602
Publication date
Jul 24, 2025
CELLSBIN, INC.
Ali KABIRI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE
Publication number
20250237607
Publication date
Jul 24, 2025
Cerillo, Inc.
Kevin Seitter
G01 - MEASURING TESTING
Information
Patent Application
TEST OBJECT ANALYSIS METHOD
Publication number
20250237608
Publication date
Jul 24, 2025
HAMAMTSU PHOTONICS K.K.
Kazuhiko FUJIWARA
G01 - MEASURING TESTING
Information
Patent Application
FLUID SAFETY DEVICE FOR DETECTING AND MONITORING SPOILAGE OF PERISH...
Publication number
20250237612
Publication date
Jul 24, 2025
MOHAMMED AL-MANA COLLEGE FOR MEDICAL SCIENCES
Fardus Abdullah ALJUNIBI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING COLOR MATCH FOR SURFACE COATINGS
Publication number
20250237638
Publication date
Jul 24, 2025
SWIMC LLC
Klaas DE HAAS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ION BEAM TIME OF ARRIVAL (TOA) GAUGE
Publication number
20250237546
Publication date
Jul 24, 2025
Analex Corporation
Todd Evan Vande Brake
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL LOCALIZED SURFACE PLASMON RESONANCE SENSOR USING BUNDLE OF...
Publication number
20250231107
Publication date
Jul 17, 2025
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, DANKOOK UNIVERSITY
Seung Ki LEE
G01 - MEASURING TESTING
Information
Patent Application
FLUORESCENCE DETECTION DEVICE
Publication number
20250231111
Publication date
Jul 17, 2025
Japan Display Inc.
Yasuhiro TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR RAPID CHARACTERIZATION OF METALLIC POWDERS
Publication number
20250231113
Publication date
Jul 17, 2025
RTX Corporation
David U. Furrer
G01 - MEASURING TESTING
Information
Patent Application
System for Measuring Microplastics in an Aquatic Environment
Publication number
20250231115
Publication date
Jul 17, 2025
Ely Oser
G01 - MEASURING TESTING
Information
Patent Application
HYDROGEN SENSING WITH THERMAL COMPENSATION
Publication number
20250231160
Publication date
Jul 17, 2025
Baker Hughes Oilfield Operations LLC
Darin Duphorne
E21 - EARTH DRILLING MINING
Information
Patent Application
METHOD AND COMPUTER PROGRAM FOR PREDICTING PARAMETER OF SAMPLE IN O...
Publication number
20250231098
Publication date
Jul 17, 2025
Industry-Academic Cooperation Foundation, Yonsei University
Young-Joo KIM
G01 - MEASURING TESTING
Information
Patent Application
DETECTION DEVICE
Publication number
20250231099
Publication date
Jul 17, 2025
Japan Display Inc.
Kaoru ITO
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CANCER DETECTION
Publication number
20250231106
Publication date
Jul 17, 2025
DXCOVER LIMITED
Matthew J BAKER
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF MEASURING AN ANGLE BETWEEN TWO SURFACES
Publication number
20250231117
Publication date
Jul 17, 2025
Baker Hughes Holdings LLC
Clark A. Bendall
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL APPARATUS
Publication number
20250234096
Publication date
Jul 17, 2025
Panasonic Intellectual Property Management Co., Ltd.
Yusuke KITAGAWA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
System and Method/Process for In-Field Measurements of Plant Crops
Publication number
20250231299
Publication date
Jul 17, 2025
Agriculture Victoria Services PTY LTD
German Carlos Spangenberg
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL GAS SENSOR DEVICE, GAS DETECTION METHOD, AND STORAGE MEDIUM...
Publication number
20250231104
Publication date
Jul 17, 2025
MITSUMI ELECTRIC CO., LTD.
Akira NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE
Publication number
20250224342
Publication date
Jul 10, 2025
Hitachi High-Tech Corporation
Tomoharu NAGASHIMA
G01 - MEASURING TESTING
Information
Patent Application
WAFER INSPECTION APPARATUS AND WAFER INSPECTION SYSTEM INCLUDING TH...
Publication number
20250224345
Publication date
Jul 10, 2025
Samsung Electronics Co., Ltd.
Jun Taek OH
G01 - MEASURING TESTING
Information
Patent Application
A METHOD FOR ANALYZING MILK, A METHOD FOR ANALYZING THE CONTENT OF...
Publication number
20250224334
Publication date
Jul 10, 2025
CARAG AG
Alexander Kalyanov
G01 - MEASURING TESTING
Information
Patent Application
2-Dimentional Dimethylglyoxime-Iridium (DMG-Ir) Nanosheet, Method f...
Publication number
20250224339
Publication date
Jul 10, 2025
NATIONAL SUN YAT-SEN UNIVERSITY
Hui-Fen Wu
C07 - ORGANIC CHEMISTRY
Information
Patent Application
SPECTROSCOPIC ELLIPSOMETER AND SUBSTRATE ANALYSIS METHOD USING THE...
Publication number
20250224326
Publication date
Jul 10, 2025
Samsung Electronics Co., Ltd.
Jaeho KIM
G01 - MEASURING TESTING
Information
Patent Application
LUMINESCENCE IMAGING FOR GEMSTONE SCREENING
Publication number
20250224338
Publication date
Jul 10, 2025
Gemological Institute of America, Inc.
Tsung-Han TSAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE, METHOD AND COMPUTER READABLE STORAGE MEDIUM FOR QUANTITATIV...
Publication number
20250224337
Publication date
Jul 10, 2025
Bay Jay Ray Technology Limited
Renjie ZHOU
G02 - OPTICS
Information
Patent Application
APPARATUS AND METHOD WITH DEFECT DETECTION
Publication number
20250225647
Publication date
Jul 10, 2025
Samsung Electro-Mechanics Co., Ltd.
Dongjin PARK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NONLINEAR OPTICAL STOKES ELLIPSOMETERS
Publication number
20250224327
Publication date
Jul 10, 2025
FemtoMetrix, Inc.
Ken James
H01 - BASIC ELECTRIC ELEMENTS