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Absorbing heated plate or film and temperature detector
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G01J2005/103
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2005/103
Absorbing heated plate or film and temperature detector
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Patents Grants
last 30 patents
Information
Patent Grant
Controlled-emissivity face heated by non-resistive heat source
Patent number
11,226,236
Issue date
Jan 18, 2022
Hewlett-Packard Development Company, L.P.
Joshua Peter Yasbek
G01 - MEASURING TESTING
Information
Patent Grant
Thermal sensing layer for microbolometer and method of making the same
Patent number
10,648,865
Issue date
May 12, 2020
King Saud University
Mohamed Ramy Abdel-Rahman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermal sensing layer for microbolometer and method of making the same
Patent number
10,481,006
Issue date
Nov 19, 2019
King Saud University
Mohamed Ramy Abdel-Rahman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for thermal imaging of RF signals
Patent number
10,458,851
Issue date
Oct 29, 2019
Keysight Technologies, Inc.
Gregory Steven Lee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Non-contact thermal measurements of VUV optics
Patent number
10,139,283
Issue date
Nov 27, 2018
KLA-Tencor Corporation
Anatoly Shchemelinin
G01 - MEASURING TESTING
Information
Patent Grant
Method for making a device for detecting electromagnetic radiation...
Patent number
9,911,785
Issue date
Mar 6, 2018
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Jean-Jacques Yon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection device with suspended bolometric membranes having a high...
Patent number
9,869,593
Issue date
Jan 16, 2018
Ulis
Sébastien Cortial
G01 - MEASURING TESTING
Information
Patent Grant
Multispectral band sensor
Patent number
9,733,129
Issue date
Aug 15, 2017
Honeywell International Inc.
Kwong Wing Au
G01 - MEASURING TESTING
Information
Patent Grant
Layered structure for an infrared emitter, infrared emitter device...
Patent number
9,733,404
Issue date
Aug 15, 2017
Vaisala Oyj
Hannu Talvitie
G02 - OPTICS
Information
Patent Grant
Infrared sensor
Patent number
9,568,371
Issue date
Feb 14, 2017
Mitsubishi Materials Corporation
Kazuyoshi Tari
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Temperature sensor, fixing device, and image forming apparatus
Patent number
9,163,999
Issue date
Oct 20, 2015
Fuji Xerox Co., Ltd.
Yuki Kubota
G01 - MEASURING TESTING
Information
Patent Grant
Infrared detecting device and infrared detecting element for use in...
Patent number
5,426,412
Issue date
Jun 20, 1995
Matsushita Electric Works, Ltd.
Shigeaki Tomonari
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SENSING DEVICE
Publication number
20230314232
Publication date
Oct 5, 2023
InnoLux Corporation
Chin-Lung TING
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR
Publication number
20230255114
Publication date
Aug 10, 2023
Sumitomo Electric Industries, Ltd.
Kyohei KAKUYAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROMAGNETIC WAVE SENSOR
Publication number
20230055177
Publication date
Feb 23, 2023
TDK Corporation
Shinji HARA
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLED-EMISSIVITY FACE HEATED BY NON-RESISTIVE HEAT SOURCE
Publication number
20210199508
Publication date
Jul 1, 2021
Hewlett-Packard Development Company, L.P.
Joshua Peter YASBEK
G01 - MEASURING TESTING
Information
Patent Application
LARGE-AREA LASER HEATING SYSTEM
Publication number
20180135181
Publication date
May 17, 2018
ADNANOTEK CORP.
KAI YANG
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
MULTISPECTRAL BAND SENSOR
Publication number
20170370778
Publication date
Dec 28, 2017
HONEYWELL INTERNATIONAL INC.
Kwong Wing Au
G01 - MEASURING TESTING
Information
Patent Application
THERMAL INFRARED DETECTOR AND MANUFACTURING METHOD FOR THERMAL INFR...
Publication number
20170328778
Publication date
Nov 16, 2017
Mitsubishi Electric Corporation
Satoi KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MAKING A DEVICE FOR DETECTING ELECTROMAGNETIC RADIATION...
Publication number
20170317137
Publication date
Nov 2, 2017
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Jean-Jacques YON
G01 - MEASURING TESTING
Information
Patent Application
DETECTION DEVICE WITH SUSPENDED BOLOMETRIC MEMBRANES HAVING A HIGH...
Publication number
20170167922
Publication date
Jun 15, 2017
Ulis
Sébastien Cortial
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ-WAVE DETECTOR
Publication number
20170030775
Publication date
Feb 2, 2017
NEC Corporation
Seiji KURASHINA
G01 - MEASURING TESTING
Information
Patent Application
Optical layered structure, manufacturing method, and use
Publication number
20150241612
Publication date
Aug 27, 2015
Hannu Talvitie
G02 - OPTICS
Information
Patent Application
INFRARED SENSOR
Publication number
20140374596
Publication date
Dec 25, 2014
MITSUBISHI MATERIALS CORPORTION
Kazuyoshi Tari
G01 - MEASURING TESTING