MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Industry

CPC
G01J

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Current Industry

G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Sub Industries

G01J1/00Photometry G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour G01J4/00Measuring polarisation of light G01J5/00Radiation pyrometry G01J7/00Measuring velocity of light G01J9/00Measuring optical phase difference Determining degree of coherence Measuring optical wavelength

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Photothermal imaging device and system
- Patent number 12,228,503
- Issue date Feb 18, 2025
- University of Notre Dame Du Lac
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus
- Patent number 12,231,750
- Issue date Feb 18, 2025
- FUJIFILM Corporation
- Shinichi Shimotsu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for carrying out polarization resolved Raman spectroscopy
- Patent number 12,228,450
- Issue date Feb 18, 2025
- Danmarks Tekniske Universitet; Xnovo Technology ApS
- Oleksii Ilchenko
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 12,228,452
- Issue date Feb 18, 2025
- Shimadzu Corporation
- Ryoji Hiraoka
- G01 - MEASURING TESTING
Information Patent Grant
Light detection module, light detection method and display device
- Patent number 12,228,454
- Issue date Feb 18, 2025
- BOE Technology Group Co., Ltd.
- Xinshe Yin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Identification apparatus
- Patent number 12,228,517
- Issue date Feb 18, 2025
- Canon Kabushiki Kaisha
- Yuki Yonetani
- G01 - MEASURING TESTING
Information Patent Grant
Surface-enhanced raman scattering biosensor
- Patent number 12,228,520
- Issue date Feb 18, 2025
- Jonathan David Waldern
- G01 - MEASURING TESTING
Information Patent Grant
Active illumination and time-of-flight camera system to evaluate fa...
- Patent number 12,226,188
- Issue date Feb 18, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Photoelectric conversion apparatus, photoelectric conversion system...
- Patent number 12,230,722
- Issue date Feb 18, 2025
- Canon Kabushiki Kaisha
- Mahito Shinohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for diagnosing battery pack
- Patent number 12,228,617
- Issue date Feb 18, 2025
- LG ENERGY SOLUTION, LTD.
- Hye Yun Bae
- G01 - MEASURING TESTING
Information Patent Grant
Integrating a sensing system into headlight optics
- Patent number 12,228,653
- Issue date Feb 18, 2025
- MAGNA ELECTRONICS, LLC
- Bernard de Mersseman
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Flame monitor
- Patent number 12,228,455
- Issue date Feb 18, 2025
- DURAG GmbH
- Christian Deselaers
- F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information Patent Grant
Optical detector module and a method for operating the same
- Patent number 12,228,448
- Issue date Feb 18, 2025
- Artilux, Inc.
- Kai-Wei Chiu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for real-time light mapping
- Patent number 12,228,449
- Issue date Feb 18, 2025
- BOWERY FARMING, INC.
- Henry Sztul
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Spectrometer with self-referenced calibration
- Patent number 12,228,451
- Issue date Feb 18, 2025
- Wisconsin Alumni Research Foundation
- Scott Sanders
- G01 - MEASURING TESTING
Information Patent Grant
Hazardous ingredient measuring apparatus and hazardous ingredient a...
- Patent number 12,228,453
- Issue date Feb 18, 2025
- PIQUANT. CO., LTD.
- Do Yeon Pi
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-contact low substrate temperature measurement
- Patent number 12,230,521
- Issue date Feb 18, 2025
- Applied Materials, Inc.
- Kim Ramkumar Vellore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser detecting circuit and semiconductor apparatus including the same
- Patent number 12,230,588
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Cheolhwan Lim
- G11 - INFORMATION STORAGE
Information Patent Grant
Ultra-wide angle broadband polarization imaging system based on met...
- Patent number 12,228,710
- Issue date Feb 18, 2025
- The Institute of Optics and Electronics, The Chinese Academy of Sciences
- Xiangang Luo
- G01 - MEASURING TESTING
Information Patent Grant
Illuminator method and device for semiconductor package testing
- Patent number 12,228,610
- Issue date Feb 18, 2025
- UTAC HEADQUARTERS PTE. LTD.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Grant
In-line metrology systems, apparatus, and methods for optical devices
- Patent number 12,229,940
- Issue date Feb 18, 2025
- Applied Materials, Inc.
- Yangyang Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In-home relay device and electronic device connected thereto
- Patent number 12,231,216
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Ikjoo Byun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for extracting avalanche signal
- Patent number 12,222,241
- Issue date Feb 11, 2025
- QUDOOR TECHNOLOGIES INC.
- Liuping Chen
- G01 - MEASURING TESTING
Information Patent Grant
Cavity for gas measurements
- Patent number 12,222,244
- Issue date Feb 11, 2025
- Tunable AS
- Truls Simensen
- G01 - MEASURING TESTING
Information Patent Grant
Protective mask for an optical receiver
- Patent number 12,222,240
- Issue date Feb 11, 2025
- Luminar Technologies, Inc.
- Justin Robert Woodruff
- G01 - MEASURING TESTING
Information Patent Grant
Modulator, imaging apparatus, and design method
- Patent number 12,222,243
- Issue date Feb 11, 2025
- Sony Group Corporation
- Tuo Zhuang
- G01 - MEASURING TESTING
Information Patent Grant
Linearization of mercury cadmium telluride photodetectors
- Patent number 12,222,242
- Issue date Feb 11, 2025
- Thermo Electron Scientific Instruments LLC
- Nicolai Bech Mortensen
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid multispectral device
- Patent number 12,225,744
- Issue date Feb 11, 2025
- SENORICS GMBH
- Robert Brückner
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing images to assess task performance
- Patent number 12,223,458
- Issue date Feb 11, 2025
- TRAX TECHNOLOGY SOLUTIONS PTE LTD.
- Youval Bronicki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact core body temperature measurement systems and methods
- Patent number 12,220,207
- Issue date Feb 11, 2025
- Masimo Corporation
- Valery G. Telfort
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR FOR DETECTING GLARE CONDITIONS
- Publication number 20250059828
- Publication date Feb 20, 2025
- Lutron Technology Company LLC
- Craig Alan Casey
- E06 - DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL LADDERS
Information Patent Application
MULTI-SITE, MULTI-SUBJECT JOURNEY OBSERVATION DECISION SUPPORT METH...
- Publication number 20250057444
- Publication date Feb 20, 2025
- TurningMode, LLC
- Jorge Zapata
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGING OF MOVING MICROSCOPIC SAMPLE ELEMENTS
- Publication number 20250060252
- Publication date Feb 20, 2025
- CYTOVIVA, INC.
- James Melvin Beach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR ACCURATE DETECTION OF FEBRILE CONDITIONS WI...
- Publication number 20250060260
- Publication date Feb 20, 2025
- Wello, Inc.
- Alan C. Heller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTILAYER PHOTOELECTRIC CONVERTER, MULTILAYER PHOTOELECTRIC CONVER...
- Publication number 20250063831
- Publication date Feb 20, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Nozomu MATSUKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISTRIBUTED LEDGER FOR PHYSICAL MATERIAL
- Publication number 20250060312
- Publication date Feb 20, 2025
- MAT International Holdings, LLC
- Catherine E. McManus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTING TOOL FOR INSPECTING MICRO LED ARRAY PANEL
- Publication number 20250060248
- Publication date Feb 20, 2025
- Jade Bird Display (Shanghai) Limited
- Chenchao XU
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER, SPECTROSCOPIC MEASUREMENT RESULT DISPLAY METHOD, AND...
- Publication number 20250060249
- Publication date Feb 20, 2025
- SEIKO EPSON CORPORATION
- Ryohei KURI
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT SENSORS WITH IRREGULAR APERTURE MASKS, DIFFUSERS, AND CAM...
- Publication number 20250060254
- Publication date Feb 20, 2025
- Quartus Engineering Incorporated
- Peter Pilarz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PORTABLE SPECTROMETER DEVICE
- Publication number 20250060250
- Publication date Feb 20, 2025
- trinamiX GmbH
- Sebastian VALOUCH
- G01 - MEASURING TESTING
Information Patent Application
HEAT ASSISTED DETECTION AND RANGING BASED ON SPECTROPOLARIMETRIC IM...
- Publication number 20250060251
- Publication date Feb 20, 2025
- Purdue Research Foundation
- Zubin Jacob
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BALER THERMAL SCANNING
- Publication number 20250060253
- Publication date Feb 20, 2025
- Deere & Company
- UMESH B. JADHAO
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
CALIBRATION DEVICE, DISPLAY DEVICE, CALIBRATION METHOD, AND IMAGE D...
- Publication number 20250061831
- Publication date Feb 20, 2025
- Sony Interactive Entertainment Inc.
- Makoto KOIZUMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROPAGATION ENVIRONMENT ESTIMATION METHOD, PROPAGATION ENVIRONMENT...
- Publication number 20250062844
- Publication date Feb 20, 2025
- Nippon Telegraph and Telephone Corporation
- Ryotaro TANIGUCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Monitoring A Flux Application
- Publication number 20250061564
- Publication date Feb 20, 2025
- SIEMENS AKTIENGESELLSCHAFT
- Ulrich Wittreich
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LIGHT DETECTION DEVICE AND ELECTRONIC DEVICE
- Publication number 20250052609
- Publication date Feb 13, 2025
- Sony Semiconductor Solutions Corporation
- KAZUHIRO GOI
- G01 - MEASURING TESTING
Information Patent Application
COLOR ADJUSTMENT METHODS AND SYSTEMS
- Publication number 20250052616
- Publication date Feb 13, 2025
- BASF COATINGS GMBH
- Guido BISCHOFF
- G01 - MEASURING TESTING
Information Patent Application
WIDE-BAND PHOTODETECTORS USING THERMOELECTRIC MATERIALS
- Publication number 20250052621
- Publication date Feb 13, 2025
- City University of Hong Kong
- Johnny Chung Yin HO
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE
- Publication number 20250056913
- Publication date Feb 13, 2025
- Sony Semiconductor Solutions Corporation
- SAYAKA TAKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTO SENSING DEVICE AND METHOD OF FABRICATING THE PHOTO SENSING DE...
- Publication number 20250056915
- Publication date Feb 13, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAN-HONG CHERN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTING TOOL FOR INSPECTING MICRO LED ARRAY PANEL
- Publication number 20250052608
- Publication date Feb 13, 2025
- Jade Bird Display (Shanghai) Limited
- Chenchao XU
- G01 - MEASURING TESTING
Information Patent Application
SPECTROPHOTOMETER
- Publication number 20250052613
- Publication date Feb 13, 2025
- Shimadzu Corporation
- Takahiro TAMAKI
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE MATERIAL FOR AND METHOD OF CALIBRATING RAMAN SPECTROMETERS
- Publication number 20250052614
- Publication date Feb 13, 2025
- Endress+Hauser Optical Analysis, Inc.
- Joseph Slater
- G01 - MEASURING TESTING
Information Patent Application
PEAK POSITION MEASUREMENT OFFSET IN A TWO-DIMENSIONAL OPTICAL SPECTRUM
- Publication number 20250052615
- Publication date Feb 13, 2025
- THERMO FISHER SCIENTIFIC (SHANGHAI) INSTRUMENTS CO., LTD.
- Shenghai Wu
- G01 - MEASURING TESTING
Information Patent Application
LIGHT DETECTION STRUCTURE AND METHOD THEREOF, DISPLAY SUBSTRATE AND...
- Publication number 20250052617
- Publication date Feb 13, 2025
- BOE TECHNOLOGY GROUP CO., LTD.
- Xinshe YIN
- G01 - MEASURING TESTING
Information Patent Application
PROPAGATION ENVIRONMENT ESTIMATION METHOD, PROPAGATION ENVIRONMENT...
- Publication number 20250052795
- Publication date Feb 13, 2025
- Nippon Telegraph and Telephone Corporation
- Ryotaro TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...
- Publication number 20250049326
- Publication date Feb 13, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method And System For A Trail Camera With Modular Fresnel Lenses
- Publication number 20250056110
- Publication date Feb 13, 2025
- Deer Management Systems, LLC
- Benjamin Stern
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...
- Publication number 20250052691
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Youngsun CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT DETECTION DEVICE
- Publication number 20250052612
- Publication date Feb 13, 2025
- HAMAMATSU PHOTONICS K. K.
- Takashi KASAHARA
- G01 - MEASURING TESTING

MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Photothermal imaging device and system

Imaging apparatus

Apparatus for carrying out polarization resolved Raman spectroscopy

Spectrometer

Light detection module, light detection method and display device

Identification apparatus

Surface-enhanced raman scattering biosensor

Active illumination and time-of-flight camera system to evaluate fa...

Photoelectric conversion apparatus, photoelectric conversion system...

Method for diagnosing battery pack

Integrating a sensing system into headlight optics

Flame monitor

Optical detector module and a method for operating the same

System and method for real-time light mapping

Spectrometer with self-referenced calibration

Hazardous ingredient measuring apparatus and hazardous ingredient a...

Method for non-contact low substrate temperature measurement

Laser detecting circuit and semiconductor apparatus including the same

Ultra-wide angle broadband polarization imaging system based on met...

Illuminator method and device for semiconductor package testing

In-line metrology systems, apparatus, and methods for optical devices

In-home relay device and electronic device connected thereto

Method and apparatus for extracting avalanche signal

Cavity for gas measurements

Protective mask for an optical receiver

Modulator, imaging apparatus, and design method

Linearization of mercury cadmium telluride photodetectors

Hybrid multispectral device

Analyzing images to assess task performance

Non-contact core body temperature measurement systems and methods

Patents Applicationslast 30 patents

SENSOR FOR DETECTING GLARE CONDITIONS

MULTI-SITE, MULTI-SUBJECT JOURNEY OBSERVATION DECISION SUPPORT METH...

HYPERSPECTRAL IMAGING OF MOVING MICROSCOPIC SAMPLE ELEMENTS

SYSTEMS AND METHODS FOR ACCURATE DETECTION OF FEBRILE CONDITIONS WI...

MULTILAYER PHOTOELECTRIC CONVERTER, MULTILAYER PHOTOELECTRIC CONVER...

DISTRIBUTED LEDGER FOR PHYSICAL MATERIAL

INSPECTING TOOL FOR INSPECTING MICRO LED ARRAY PANEL

SPECTROMETER, SPECTROSCOPIC MEASUREMENT RESULT DISPLAY METHOD, AND...

WAVEFRONT SENSORS WITH IRREGULAR APERTURE MASKS, DIFFUSERS, AND CAM...

PORTABLE SPECTROMETER DEVICE

HEAT ASSISTED DETECTION AND RANGING BASED ON SPECTROPOLARIMETRIC IM...

BALER THERMAL SCANNING

CALIBRATION DEVICE, DISPLAY DEVICE, CALIBRATION METHOD, AND IMAGE D...

PROPAGATION ENVIRONMENT ESTIMATION METHOD, PROPAGATION ENVIRONMENT...

Monitoring A Flux Application

LIGHT DETECTION DEVICE AND ELECTRONIC DEVICE

COLOR ADJUSTMENT METHODS AND SYSTEMS

WIDE-BAND PHOTODETECTORS USING THERMOELECTRIC MATERIALS

SENSOR DEVICE

PHOTO SENSING DEVICE AND METHOD OF FABRICATING THE PHOTO SENSING DE...

INSPECTING TOOL FOR INSPECTING MICRO LED ARRAY PANEL

SPECTROPHOTOMETER

REFERENCE MATERIAL FOR AND METHOD OF CALIBRATING RAMAN SPECTROMETERS

PEAK POSITION MEASUREMENT OFFSET IN A TWO-DIMENSIONAL OPTICAL SPECTRUM

LIGHT DETECTION STRUCTURE AND METHOD THEREOF, DISPLAY SUBSTRATE AND...

PROPAGATION ENVIRONMENT ESTIMATION METHOD, PROPAGATION ENVIRONMENT...

WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...

Method And System For A Trail Camera With Modular Fresnel Lenses

SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...

LIGHT DETECTION DEVICE