ac or dc measuring bridges

Industry

CPC
G01R17/10

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R17/00Measuring arrangements involving comparison with a reference value

Current Industry

G01R17/10ac or dc measuring bridges

Industries

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Patents Grantslast 30 patents

Information Patent Grant
High current source for a test system for testing an electrical pow...
- Patent number 12,203,999
- Issue date Jan 21, 2025
- Omicron Electronics GmbH
- Lukas Bitschnau
- G01 - MEASURING TESTING
Information Patent Grant
Offset calibration and diagnostics for resistance-based bridge circ...
- Patent number 11,906,610
- Issue date Feb 20, 2024
- Honeywell International Inc.
- Ian Bentley
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testkey pattern and test method thereof
- Patent number 11,721,599
- Issue date Aug 8, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Linshan Yuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor and inspection device
- Patent number 11,703,530
- Issue date Jul 18, 2023
- Kabushiki Kaisha Toshiba
- Akira Kikitsu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for estimation of sensor resistance
- Patent number 11,644,493
- Issue date May 9, 2023
- Cirrus Logic, Inc.
- Saurabh Singh
- G01 - MEASURING TESTING
Information Patent Grant
Verification of correct operation of a physical parameter sensor
- Patent number 11,630,015
- Issue date Apr 18, 2023
- Rosemount Aerospace Inc.
- Mark Buenz
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor array with different RA TMR film
- Patent number 11,598,828
- Issue date Mar 7, 2023
- Western Digital Technologies, Inc.
- Yuankai Zheng
- G01 - MEASURING TESTING
Information Patent Grant
AC impedance measurement circuit with calibration function
- Patent number 11,567,113
- Issue date Jan 31, 2023
- Hycon Technology Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring device and method of monitoring an impedance of a protec...
- Patent number 11,486,907
- Issue date Nov 1, 2022
- TE Connectivity Germany GmbH
- Stefan Kipp
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Bridge sensor error check
- Patent number 11,480,631
- Issue date Oct 25, 2022
- Melexis Technologies SA
- Javier Bilbao de Mendizabal
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor array with one TMR stack having two free layers
- Patent number 11,415,645
- Issue date Aug 16, 2022
- Western Digital Technologies, Inc.
- Yuankai Zheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Measuring shunt
- Patent number 11,385,262
- Issue date Jul 12, 2022
- Siemens Aktiengesellschaft
- Roland Lorz
- G01 - MEASURING TESTING
Information Patent Grant
Gas Chromatograph (GC) detector to provide GC measurement in digita...
- Patent number 11,327,057
- Issue date May 10, 2022
- Siemens Aktiengesellschaft
- Glen Eugene Schmidt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Strain gauge and multi-axis force sensor
- Patent number 11,293,818
- Issue date Apr 5, 2022
- MINEBEA MITSUMI INC.
- Dohaku Inamori
- G01 - MEASURING TESTING
Information Patent Grant
AC impedance measurement circuit with calibration function
- Patent number 11,280,818
- Issue date Mar 22, 2022
- Hycon Technology Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the resistance temperature characteristic of...
- Patent number 11,262,393
- Issue date Mar 1, 2022
- BorgWarner Ludwigsburg GmbH
- Karsten Volland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bottom leads chemical mechanical planarization for TMR magnetic sen...
- Patent number 11,201,280
- Issue date Dec 14, 2021
- Western Digital Technologies, Inc.
- Ronghui Zhou
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods, systems, and apparatus for progressive corrosion detection
- Patent number 11,175,215
- Issue date Nov 16, 2021
- Intel Corporation
- Thomas Birch
- G01 - MEASURING TESTING
Information Patent Grant
Dual free layer TMR magnetic field sensor
- Patent number 11,169,227
- Issue date Nov 9, 2021
- Western Digital Technologies, Inc.
- Chih-Ching Hu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor with serial resistor for asymmetric sensing field r...
- Patent number 11,169,228
- Issue date Nov 9, 2021
- Western Digital Technologies, Inc.
- Yung-Hung Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Strain gauge and multi-axis force sensor
- Patent number 11,112,319
- Issue date Sep 7, 2021
- MINEBEA MITSUMI INC.
- Dohaku Inamori
- G01 - MEASURING TESTING
Information Patent Grant
Half-bridge differential sensor
- Patent number 11,085,953
- Issue date Aug 10, 2021
- Melexis Technologies NV
- Asparuh Ivanov Grigorov
- G01 - MEASURING TESTING
Information Patent Grant
Sensing systems using current steering bridges
- Patent number 11,067,607
- Issue date Jul 20, 2021
- KSR IP Holdings, LLC
- Joong K. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensing apparatus
- Patent number 11,061,085
- Issue date Jul 13, 2021
- iSentek Inc.
- Fu-Te Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Measuring bridge arrangement with improved error detection
- Patent number 10,983,187
- Issue date Apr 20, 2021
- Ypsomed AG
- Michael Gentz
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device, method for operating the same, and wireless cont...
- Patent number 10,809,785
- Issue date Oct 20, 2020
- TPK Glass Solutions (Xiamen) Inc.
- Chao-Sung Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting device
- Patent number 10,718,795
- Issue date Jul 21, 2020
- FANUC CORPORATION
- Shougo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for biasing and readout of resistive sensor stru...
- Patent number 10,698,009
- Issue date Jun 30, 2020
- Melexis Technologies SA
- Johan L. Raman
- G01 - MEASURING TESTING
Information Patent Grant
Resistance calibration
- Patent number 10,663,995
- Issue date May 26, 2020
- SOCIONEXT INC.
- Hassan Shafeeu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Current sensing
- Patent number 10,649,010
- Issue date May 12, 2020
- Infineon Technologies AG
- Wolfgang Raberg
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT BOARD AND MONITORING METHOD THEREFOR
- Publication number 20240310431
- Publication date Sep 19, 2024
- Wiwynn Corporation
- Gong-Bo SONG
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Sensor Readout System and Sensor Readout Method
- Publication number 20240192028
- Publication date Jun 13, 2024
- Stichting IMEC Nederland
- Roland Van Wegberg
- G01 - MEASURING TESTING
Information Patent Application
HIGH CURRENT SOURCE FOR A TEST SYSTEM FOR TESTING AN ELECTRICAL POW...
- Publication number 20230341476
- Publication date Oct 26, 2023
- OMICRON Electronics GmbH
- Lukas Bitschnau
- G01 - MEASURING TESTING
Information Patent Application
OFFSET CALIBRATION AND DIAGNOSTICS FOR RESISTANCE-BASED BRIDGE CIRC...
- Publication number 20220291322
- Publication date Sep 15, 2022
- Honeywell International Inc.
- Ian Bentley
- G01 - MEASURING TESTING
Information Patent Application
BRIDGE SENSOR DC ERROR CANCELLATION SCHEME
- Publication number 20220149856
- Publication date May 12, 2022
- Microsoft Technology Licensing, LLC
- Chang Joon PARK
- G01 - MEASURING TESTING
Information Patent Application
AC Impedance Measurement Circuit with Calibration Function
- Publication number 20220074980
- Publication date Mar 10, 2022
- Hycon Technology Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SHUNT
- Publication number 20220011348
- Publication date Jan 13, 2022
- SIEMENS AKTIENGESELLSCHAFT
- ROLAND LORZ
- G01 - MEASURING TESTING
Information Patent Application
AC Impedance Measurement Circuit with Calibration Function
- Publication number 20210382100
- Publication date Dec 9, 2021
- Hycon Technology Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Application
STRAIN GAUGE AND MULTI-AXIS FORCE SENSOR
- Publication number 20210364374
- Publication date Nov 25, 2021
- MINEBEA MITSUMI INC.
- Dohaku INAMORI
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Sensor Array with Different RA TMR Film
- Publication number 20210063507
- Publication date Mar 4, 2021
- Western Digital Technologies, Inc.
- Yuankai ZHENG
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Sensor with Serial Resistor for Asymmetric Sensing Field R...
- Publication number 20210063509
- Publication date Mar 4, 2021
- Western Digital Technologies, Inc.
- Yung-Hung WANG
- G01 - MEASURING TESTING
Information Patent Application
Dual Free Layer TMR Magnetic Field Sensor
- Publication number 20210063508
- Publication date Mar 4, 2021
- Western Digital Technologies, Inc.
- Chih-Ching HU
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Sensor Array With One TMR Stack Having Two Free Layers
- Publication number 20210055361
- Publication date Feb 25, 2021
- Western Digital Technologies, Inc.
- Yuankai ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bottom Leads Chemical Mechanical Planarization for TMR Magnetic Sen...
- Publication number 20210057638
- Publication date Feb 25, 2021
- Western Digital Technologies, Inc.
- Ronghui ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD SENSING APPARATUS
- Publication number 20200300937
- Publication date Sep 24, 2020
- Isentek Inc.
- Fu-Te Yuan
- G01 - MEASURING TESTING
Information Patent Application
STRAIN GAUGE AND MULTI-AXIS FORCE SENSOR
- Publication number 20200124486
- Publication date Apr 23, 2020
- MINEBEA MITSUMI INC.
- Dohaku INAMORI
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND APPARATUS FOR PROGRESSIVE CORROSION DETECTION
- Publication number 20200025671
- Publication date Jan 23, 2020
- Intel Corporation
- Thomas Birch
- G01 - MEASURING TESTING
Information Patent Application
HALF-BRIDGE DIFFERENTIAL SENSOR
- Publication number 20200018781
- Publication date Jan 16, 2020
- MELEXIS TECHNOLOGIES NV
- Asparuh Ivanov GRIGOROV
- G01 - MEASURING TESTING
Information Patent Application
Pressure Sensing Apparatus and Control Method Thereof
- Publication number 20190383685
- Publication date Dec 19, 2019
- Tyco Electronics AMP Korea Co., Ltd.
- Young-Deok Kim
- G01 - MEASURING TESTING
Information Patent Application
Monitoring Device and Method of Monitoring an Impedance of a Protec...
- Publication number 20190212370
- Publication date Jul 11, 2019
- TE Connectivity Germany GmbH
- Stefan Kipp
- B60 - VEHICLES IN GENERAL
Information Patent Application
DETECTING DEVICE
- Publication number 20190064226
- Publication date Feb 28, 2019
- FANUC CORPORATION
- Yuuki FUKUMOTO
- G05 - CONTROLLING REGULATING
Information Patent Application
DETECTING DEVICE
- Publication number 20190064227
- Publication date Feb 28, 2019
- FANUC CORPORATION
- Shougo TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CALCULATING OFFSET OF WHEATSTONE BRIDGE TY...
- Publication number 20180180700
- Publication date Jun 28, 2018
- Korea Electronics Technology Institute
- Won Ki PARK
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSING
- Publication number 20180172739
- Publication date Jun 21, 2018
- INFINEON TECHNOLOGIES AG
- Wolfgang Raberg
- G01 - MEASURING TESTING
Information Patent Application
MEASURING BRIDGE ARRANGEMENT WITH IMPROVED ERROR DETECTION
- Publication number 20170350955
- Publication date Dec 7, 2017
- TecPharma Licensing AG
- Michael Gentz
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH MULTIPLE SENSE LAYER MAGNETIZATION ORIEN...
- Publication number 20170212175
- Publication date Jul 27, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH PERMANENT MAGNET BIASING
- Publication number 20170212189
- Publication date Jul 27, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH SKEWED SENSE MAGNETIZATION OF SENSE LAYER
- Publication number 20170212176
- Publication date Jul 27, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACCURACY IMPROVEMENT IN CURRENT COMPARATORS
- Publication number 20170184637
- Publication date Jun 29, 2017
- Guildline Instruments Limited
- Mark EVANS
- G01 - MEASURING TESTING
Information Patent Application
Methods, Devices And Systems Which Determine A Parameter Value Of A...
- Publication number 20160349291
- Publication date Dec 1, 2016
- Millar Inc.
- Huntly D. Millar
- G01 - MEASURING TESTING

ac or dc measuring bridges

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High current source for a test system for testing an electrical pow...

Offset calibration and diagnostics for resistance-based bridge circ...

Semiconductor testkey pattern and test method thereof

Sensor and inspection device

Systems and methods for estimation of sensor resistance

Verification of correct operation of a physical parameter sensor

Magnetic sensor array with different RA TMR film

AC impedance measurement circuit with calibration function

Monitoring device and method of monitoring an impedance of a protec...

Bridge sensor error check

Magnetic sensor array with one TMR stack having two free layers

Measuring shunt

Gas Chromatograph (GC) detector to provide GC measurement in digita...

Strain gauge and multi-axis force sensor

AC impedance measurement circuit with calibration function

Method for determining the resistance temperature characteristic of...

Bottom leads chemical mechanical planarization for TMR magnetic sen...

Methods, systems, and apparatus for progressive corrosion detection

Dual free layer TMR magnetic field sensor

Magnetic sensor with serial resistor for asymmetric sensing field r...

Strain gauge and multi-axis force sensor

Half-bridge differential sensor

Sensing systems using current steering bridges

Magnetic field sensing apparatus

Measuring bridge arrangement with improved error detection

Electronic device, method for operating the same, and wireless cont...

Detecting device

Method and circuit for biasing and readout of resistive sensor stru...

Resistance calibration

Current sensing

Patents Applicationslast 30 patents

CIRCUIT BOARD AND MONITORING METHOD THEREFOR

Sensor Readout System and Sensor Readout Method

HIGH CURRENT SOURCE FOR A TEST SYSTEM FOR TESTING AN ELECTRICAL POW...

OFFSET CALIBRATION AND DIAGNOSTICS FOR RESISTANCE-BASED BRIDGE CIRC...

BRIDGE SENSOR DC ERROR CANCELLATION SCHEME

AC Impedance Measurement Circuit with Calibration Function

MEASURING SHUNT

AC Impedance Measurement Circuit with Calibration Function

STRAIN GAUGE AND MULTI-AXIS FORCE SENSOR

Magnetic Sensor Array with Different RA TMR Film

Magnetic Sensor with Serial Resistor for Asymmetric Sensing Field R...

Dual Free Layer TMR Magnetic Field Sensor

Magnetic Sensor Array With One TMR Stack Having Two Free Layers

Bottom Leads Chemical Mechanical Planarization for TMR Magnetic Sen...

MAGNETIC FIELD SENSING APPARATUS

STRAIN GAUGE AND MULTI-AXIS FORCE SENSOR

METHODS, SYSTEMS, AND APPARATUS FOR PROGRESSIVE CORROSION DETECTION

HALF-BRIDGE DIFFERENTIAL SENSOR

Pressure Sensing Apparatus and Control Method Thereof

Monitoring Device and Method of Monitoring an Impedance of a Protec...

DETECTING DEVICE

DETECTING DEVICE

METHOD AND APPARATUS FOR CALCULATING OFFSET OF WHEATSTONE BRIDGE TY...

CURRENT SENSING

MEASURING BRIDGE ARRANGEMENT WITH IMPROVED ERROR DETECTION

MAGNETIC FIELD SENSOR WITH MULTIPLE SENSE LAYER MAGNETIZATION ORIEN...

MAGNETIC FIELD SENSOR WITH PERMANENT MAGNET BIASING

MAGNETIC FIELD SENSOR WITH SKEWED SENSE MAGNETIZATION OF SENSE LAYER

METHODS AND SYSTEMS FOR ACCURACY IMPROVEMENT IN CURRENT COMPARATORS

Methods, Devices And Systems Which Determine A Parameter Value Of A...