Accessing multiple arrays

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G11C29/26

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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G11C29/26Accessing multiple arrays

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Patents Grantslast 30 patents

Information Patent Grant
Memory module register access
- Patent number 11,953,981
- Issue date Apr 9, 2024
- RAMBUS INC.
- Thomas J. Giovannini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Configurable trim settings on a memory device
- Patent number 11,853,207
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory management device, system and method
- Patent number 11,749,343
- Issue date Sep 5, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Nitin Chawla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory module register access
- Patent number 11,573,849
- Issue date Feb 7, 2023
- RAMBUS INC.
- Thomas J. Giovannini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die-based high and low priority error queues
- Patent number 11,417,410
- Issue date Aug 16, 2022
- Kioxia Corporation
- Gyan Prakash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in-self-test circuits and methods using pipeline registers
- Patent number 11,257,562
- Issue date Feb 22, 2022
- Intel Corporation
- Tze Sin Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory management device, system and method
- Patent number 11,257,543
- Issue date Feb 22, 2022
- STMICROELECTRONICS INTERNATIONAL N.V.
- Nitin Chawla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hamming-distance analyzer and method for analyzing hamming-distance
- Patent number 11,195,593
- Issue date Dec 7, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Determination of a match between data values stored by three or mor...
- Patent number 11,194,477
- Issue date Dec 7, 2021
- Micron Technology, Inc.
- Aaron P. Boehm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enabling high at-speed test coverage of functional memory interface...
- Patent number 11,087,857
- Issue date Aug 10, 2021
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G01 - MEASURING TESTING
Information Patent Grant
Testing multi-port array in integrated circuits
- Patent number 11,069,422
- Issue date Jul 20, 2021
- International Business Machines Corporation
- Matthew Steven Hyde
- G11 - INFORMATION STORAGE
Information Patent Grant
On chip block repair scheme
- Patent number 11,049,585
- Issue date Jun 29, 2021
- Macronix International Co., Ltd.
- Shuo-Nan Hung
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable trim settings on a memory device
- Patent number 11,036,631
- Issue date Jun 15, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory module register access
- Patent number 11,016,837
- Issue date May 25, 2021
- Rambus, Inc.
- Thomas J. Giovannini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple algorithmic pattern generator testing of a memory device
- Patent number 10,937,518
- Issue date Mar 2, 2021
- Micron Technology, Inc.
- Roman A. Royer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Solid-state disk manufacturing self test
- Patent number 10,803,970
- Issue date Oct 13, 2020
- Seagate Technology LLC
- Karl David Schuh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, memory test method for semiconductor device,...
- Patent number 10,777,293
- Issue date Sep 15, 2020
- Renesas Electronics Corporation
- Tomonori Sasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Byte enable memory built-in self-test (MBIST) algorithm
- Patent number 10,748,641
- Issue date Aug 18, 2020
- QUALCOMM Incorporated
- Greg Seok
- G11 - INFORMATION STORAGE
Information Patent Grant
Inspection apparatus, image sensing apparatus, electronic equipment...
- Patent number 10,650,905
- Issue date May 12, 2020
- Canon Kabushiki Kaisha
- Koichi Iwao
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Integrated characterization vehicles for non-volatile memory cells
- Patent number 10,622,087
- Issue date Apr 14, 2020
- Hewlett Packard Enterprise Development LP
- Jeffrey Alan Lucas
- G01 - MEASURING TESTING
Information Patent Grant
Content addressable memory with match hit quality indication
- Patent number 10,614,884
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Martin Eckert
- G11 - INFORMATION STORAGE
Information Patent Grant
Parallel memory self-testing
- Patent number 10,600,495
- Issue date Mar 24, 2020
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and diagnostic method therefor
- Patent number 10,580,513
- Issue date Mar 3, 2020
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices and memory packages
- Patent number 10,573,401
- Issue date Feb 25, 2020
- Samsung Electronics Co., Ltd.
- Jin Seok Heo
- G11 - INFORMATION STORAGE
Information Patent Grant
Hamming-distance analyzer and method for analyzing hamming-distance
- Patent number 10,515,713
- Issue date Dec 24, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 10,468,094
- Issue date Nov 5, 2019
- TOSHIBA MEMORY CORPORATION
- Hayao Kasai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor apparatus with reduced risks of chip counterfeiting a...
- Patent number 10,460,824
- Issue date Oct 29, 2019
- Yukihiro Nagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-processor core device with MBIST
- Patent number 10,352,998
- Issue date Jul 16, 2019
- Microchip Technology Incorporated
- Stephen Bowling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Content addressable memory with match hit quality indication
- Patent number 10,347,337
- Issue date Jul 9, 2019
- International Business Machines Corporation
- Martin Eckert
- G11 - INFORMATION STORAGE
Information Patent Grant
Fail bit counter and semiconductor memory device having the same
- Patent number 10,297,336
- Issue date May 21, 2019
- SK Hynix Inc.
- Yong Hwan Hong
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
NON-VOLATILE MEMORY AND REWRITE CONTROL METHOD THEREOF
- Publication number 20250037781
- Publication date Jan 30, 2025
- RENESAS ELECTRONICS CORPORATION
- Masami HANYU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE REGISTER ACCESS
- Publication number 20240320080
- Publication date Sep 26, 2024
- Rambus Inc.
- Thomas J. Giovannini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES
- Publication number 20240120016
- Publication date Apr 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE REGISTER ACCESS
- Publication number 20230305915
- Publication date Sep 28, 2023
- Rambus Inc.
- Thomas J. Giovannini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE-BASED HIGH AND LOW PRIORITY ERROR QUEUES
- Publication number 20230030672
- Publication date Feb 2, 2023
- KIOXIA Corporation
- Gyan Prakash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY MANAGEMENT DEVICE, SYSTEM AND METHOD
- Publication number 20220139453
- Publication date May 5, 2022
- STMicroelectronics International N.V.
- Nitin CHAWLA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE-BASED HIGH AND LOW PRIORITY ERROR QUEUES
- Publication number 20220084617
- Publication date Mar 17, 2022
- KIOXIA Corporation
- Gyan Prakash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF A MATCH BETWEEN DATA VALUES STORED BY THREE OR MOR...
- Publication number 20220057942
- Publication date Feb 24, 2022
- Micron Technology, Inc.
- Aaron P. Boehm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES
- Publication number 20210327525
- Publication date Oct 21, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE REGISTER ACCESS
- Publication number 20210303383
- Publication date Sep 30, 2021
- Rambus Inc.
- Thomas J. Giovannini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURABLE TRIM SETTINGS ON A MEMORY DEVICE
- Publication number 20210286722
- Publication date Sep 16, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY MANAGEMENT DEVICE, SYSTEM AND METHOD
- Publication number 20200411089
- Publication date Dec 31, 2020
- STMicroelectronics International N.V.
- Nitin CHAWLA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE ALGORITHMIC PATTERN GENERATOR TESTING OF A MEMORY DEVICE
- Publication number 20200194090
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Roman A. Royer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HAMMING-DISTANCE ANALYZER AND METHOD FOR ANALYZING HAMMING-DISTANCE
- Publication number 20200135294
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, MEMORY TEST METHOD FOR SEMICONDUCTOR DEVICE,...
- Publication number 20190333598
- Publication date Oct 31, 2019
- RENESAS ELECTRONICS CORPORATION
- Tomonori SASAKI
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CHARACTERIZATION VEHICLES FOR NON-VOLATILE MEMORY CELLS
- Publication number 20190272886
- Publication date Sep 5, 2019
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Jeffrey Alan Lucas
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICES AND MEMORY PACKAGES
- Publication number 20190228832
- Publication date Jul 25, 2019
- Samsung Electronics Co., Ltd.
- Jin Seok HEO
- G11 - INFORMATION STORAGE
Information Patent Application
CONTENT ADDRESSABLE MEMORY WITH MATCH HIT QUALITY INDICATION
- Publication number 20190206492
- Publication date Jul 4, 2019
- International Business Machines Corporation
- Martin ECKERT
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE REGISTER ACCESS
- Publication number 20190179690
- Publication date Jun 13, 2019
- RAMBUS INC.
- Thomas J. Giovannini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory Module and Memory System
- Publication number 20190103152
- Publication date Apr 4, 2019
- Longitude Semiconductor S.a.r.l.
- Yoshinori Matsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Built-In-Self-Test Circuits And Methods Using Pipeline Registers
- Publication number 20190043601
- Publication date Feb 7, 2019
- Intel Corporation
- Tze Sin Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY AND METHOD FOR TESTING R...
- Publication number 20190006023
- Publication date Jan 3, 2019
- MegaChips Corporation
- Takahiko SUGAHARA
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Module and Memory System
- Publication number 20180286472
- Publication date Oct 4, 2018
- Longitude Semiconductor S.a.r.l.
- Yoshinori Matsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAIL BIT COUNTER AND SEMICONDUCTOR MEMORY DEVICE HAVING THE SAME
- Publication number 20180144813
- Publication date May 24, 2018
- SK HYNIX INC.
- Yong Hwan HONG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE INCLUDING A REDUNDANCY COLUMN AND A REDUNDANCY PERIPH...
- Publication number 20180075929
- Publication date Mar 15, 2018
- Samsung Electronics Co., Ltd.
- HOONKI KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE USING A PARALLEL BIT OPERATION AND METHOD OF O...
- Publication number 20170352434
- Publication date Dec 7, 2017
- Samsung Electronics Co., Ltd.
- Je-min RYU
- G11 - INFORMATION STORAGE
Information Patent Application
STACK TYPE SEMICONDUCTOR MEMORY AND SEMICONDUCTOR SYSTEM USING THE...
- Publication number 20170133103
- Publication date May 11, 2017
- SK HYNIX INC.
- Ki Hun KWON
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY DEVICE DETECTING DEFECTIVE BIT LINE AT HIGH SPEE...
- Publication number 20170032849
- Publication date Feb 2, 2017
- Sang-In PARK
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE AND METHOD TO PERFORM A PARALLEL MEMORY TEST
- Publication number 20150063045
- Publication date Mar 5, 2015
- INSIDE SECURE
- Graeme Hickey
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20150043289
- Publication date Feb 12, 2015
- SK HYNIX INC.
- Young-Jun KU
- G11 - INFORMATION STORAGE

Accessing multiple arrays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Memory module register access

Configurable trim settings on a memory device

Memory management device, system and method

Memory module register access

Die-based high and low priority error queues

Built-in-self-test circuits and methods using pipeline registers

Memory management device, system and method

Hamming-distance analyzer and method for analyzing hamming-distance

Determination of a match between data values stored by three or mor...

Enabling high at-speed test coverage of functional memory interface...

Testing multi-port array in integrated circuits

On chip block repair scheme

Configurable trim settings on a memory device

Memory module register access

Multiple algorithmic pattern generator testing of a memory device

Solid-state disk manufacturing self test

Semiconductor device, memory test method for semiconductor device,...

Byte enable memory built-in self-test (MBIST) algorithm

Inspection apparatus, image sensing apparatus, electronic equipment...

Integrated characterization vehicles for non-volatile memory cells

Content addressable memory with match hit quality indication

Parallel memory self-testing

Semiconductor device and diagnostic method therefor

Memory devices and memory packages

Hamming-distance analyzer and method for analyzing hamming-distance

Semiconductor memory device

Semiconductor apparatus with reduced risks of chip counterfeiting a...

Multi-processor core device with MBIST

Content addressable memory with match hit quality indication

Fail bit counter and semiconductor memory device having the same

Patents Applicationslast 30 patents

NON-VOLATILE MEMORY AND REWRITE CONTROL METHOD THEREOF

MEMORY MODULE REGISTER ACCESS

AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES

MEMORY MODULE REGISTER ACCESS

DIE-BASED HIGH AND LOW PRIORITY ERROR QUEUES

MEMORY MANAGEMENT DEVICE, SYSTEM AND METHOD

DIE-BASED HIGH AND LOW PRIORITY ERROR QUEUES

DETERMINATION OF A MATCH BETWEEN DATA VALUES STORED BY THREE OR MOR...

AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES

MEMORY MODULE REGISTER ACCESS

CONFIGURABLE TRIM SETTINGS ON A MEMORY DEVICE

MEMORY MANAGEMENT DEVICE, SYSTEM AND METHOD

MULTIPLE ALGORITHMIC PATTERN GENERATOR TESTING OF A MEMORY DEVICE

HAMMING-DISTANCE ANALYZER AND METHOD FOR ANALYZING HAMMING-DISTANCE

SEMICONDUCTOR DEVICE, MEMORY TEST METHOD FOR SEMICONDUCTOR DEVICE,...

INTEGRATED CHARACTERIZATION VEHICLES FOR NON-VOLATILE MEMORY CELLS

MEMORY DEVICES AND MEMORY PACKAGES

CONTENT ADDRESSABLE MEMORY WITH MATCH HIT QUALITY INDICATION

MEMORY MODULE REGISTER ACCESS

Memory Module and Memory System

Built-In-Self-Test Circuits And Methods Using Pipeline Registers

SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY AND METHOD FOR TESTING R...

Memory Module and Memory System

FAIL BIT COUNTER AND SEMICONDUCTOR MEMORY DEVICE HAVING THE SAME

MEMORY DEVICE INCLUDING A REDUNDANCY COLUMN AND A REDUNDANCY PERIPH...

SEMICONDUCTOR DEVICE USING A PARALLEL BIT OPERATION AND METHOD OF O...

STACK TYPE SEMICONDUCTOR MEMORY AND SEMICONDUCTOR SYSTEM USING THE...

NONVOLATILE MEMORY DEVICE DETECTING DEFECTIVE BIT LINE AT HIGH SPEE...

DEVICE AND METHOD TO PERFORM A PARALLEL MEMORY TEST

SEMICONDUCTOR MEMORY DEVICE