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Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
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Industry
CPC
G11C29/00
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Parent Industries
G
PHYSICS
G11
Information storage
G11C
STATIC STORES
Current Industry
G11C29/00
Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
Sub Industries
G11C29/003
in serial memories
G11C29/006
at wafer scale level
G11C29/02
Detection or location of defective auxiliary circuits
G11C29/021
in voltage or current generators
G11C29/022
in I/O circuitry
G11C29/023
in clock generator or timing circuitry
G11C29/024
in decoders
G11C29/025
in signal lines
G11C29/026
in sense amplifiers
G11C29/027
in fuses
G11C29/028
with adaption or trimming of parameters
G11C29/04
Detection or location of defective memory elements
G11C29/06
Acceleration testing
G11C29/08
Functional testing
G11C29/10
Test algorithms
G11C29/12
Built-in arrangements for testing
G11C29/12005
comprising voltage or current generators
G11C29/1201
comprising I/O circuitry
G11C29/12015
comprising clock generation or timing circuitry
G11C29/14
Implementation of control logic
G11C29/16
using microprogrammed units
G11C29/18
Address generation devices Devices for accessing memories
G11C29/20
using counters or linear-feedback shift registers [LFSR]
G11C29/22
Accessing serial memories
G11C29/24
Accessing extra cells
G11C29/26
Accessing multiple arrays
G11C29/28
Dependent multiple arrays
G11C29/30
Accessing single arrays
G11C29/32
Serial access Scan testing
G11C29/34
Accessing multiple bits simultaneously
G11C29/36
Data generation devices
G11C29/38
Response verification devices
G11C29/40
using compression techniques
G11C29/42
using error correcting codes [ECC] or parity check
G11C29/44
Indication or identification of errors
G11C29/4401
for self repair
G11C29/46
Test trigger logic
G11C29/48
Arrangements in static stores specially adapted for testing by means external to the store
G11C29/50
Marginal testing
G11C29/50004
of threshold voltage
G11C29/50008
of impedance
G11C29/50012
of timing
G11C29/50016
of retention
G11C29/52
Protection of memory contents Detection of errors in memory contents
G11C29/54
Arrangements for designing test circuits
G11C29/56
External testing equipment for static stores
G11C29/56004
Pattern generation
G11C29/56008
Error analysis, representation of errors
G11C29/56012
Timing aspects, clock generation, synchronisation
G11C29/56016
Apparatus features
G11C29/70
Masking faults in memories by using spares or by reconfiguring
G11C29/702
by replacing auxiliary circuits
G11C29/72
with optimized replacement algorithms
G11C29/74
using duplex memories
G11C29/76
using address translation or modifications
G11C29/765
in solid state disks
G11C29/78
using programmable devices
G11C29/781
combined in a redundant decoder
G11C29/783
with refresh of replacement cells
G11C29/785
with redundancy programming schemes
G11C29/787
using a fuse hierarchy
G11C29/789
using non-volatile cells or latches
G11C29/80
with improved layout
G11C29/802
by encoding redundancy signals
G11C29/804
to prevent clustered faults
G11C29/806
by reducing size of decoders
G11C29/808
using a flexible replacement scheme
G11C29/81
using a hierarchical redundancy scheme
G11C29/812
using a reduced amount of fuses
G11C29/814
for optimized yield
G11C29/816
for an application-specific layout
G11C29/818
for dual-port memories
G11C29/82
for EEPROMs
G11C29/822
for read only memories
G11C29/824
for synchronous memories
G11C29/83
with reduced power consumption
G11C29/832
with disconnection of faulty elements
G11C29/835
with roll call arrangements for redundant substitutions
G11C29/838
with substitution of defective spares
G11C29/84
with improved access time or stability
G11C29/842
by introducing a delay in a signal path
G11C29/844
by splitting the decoders in stages
G11C29/846
by choosing redundant lines at an output stage
G11C29/848
by adjacent switching
G11C29/86
in serial access memories
G11C29/88
with partially good memories
G11C29/883
using a single defective memory device with reduced capacity
G11C29/886
combining plural defective memory devices to provide a contiguous address range
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and apparatus to facilitate atomic operations in victim cache
Patent number
12,321,284
Issue date
Jun 3, 2025
Texas Instruments Incorporated
Naveen Bhoria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory controller for a memory device
Patent number
12,321,190
Issue date
Jun 3, 2025
Samsung Electronics Co., Ltd.
Choongeui Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data storage device for checking a defect of row lines and an opera...
Patent number
12,322,464
Issue date
Jun 3, 2025
Samsung Electronics Co., Ltd.
Kyungduk Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Digital verify failbit count (VFC) circuit
Patent number
12,322,465
Issue date
Jun 3, 2025
Yangtze Memory Technologies Co., Ltd.
Teng Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Capacity-expanding memory control component
Patent number
12,323,164
Issue date
Jun 3, 2025
Astera Labs, Inc.
Enrique Musoll
G11 - INFORMATION STORAGE
Information
Patent Grant
Read cache memory
Patent number
12,321,608
Issue date
Jun 3, 2025
Micron Technology, Inc.
Eugene Feng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory authentication
Patent number
12,321,615
Issue date
Jun 3, 2025
Rachael R. Carlson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Digital verify failbit count (VFC) circuit
Patent number
12,322,456
Issue date
Jun 3, 2025
Yangtze Memory Technologies Co., Ltd.
Teng Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vehicle memory system based on 3D memory and method operating thereof
Patent number
12,322,463
Issue date
Jun 3, 2025
Hyundai Motor Company
Hong Yeol Lim
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory device with redundancy for page-based repair
Patent number
12,322,466
Issue date
Jun 3, 2025
Micron Technology, Inc.
Alan John Wilson
G11 - INFORMATION STORAGE
Information
Patent Grant
Victim cache with write miss merging
Patent number
12,321,285
Issue date
Jun 3, 2025
Texas Instruments Incorporated
Naveen Bhoria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory device including sense amplifying circuit
Patent number
12,315,579
Issue date
May 27, 2025
SK Hynix Inc.
Yeonsu Jang
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory system, memory controller and method for operating memory sy...
Patent number
12,315,581
Issue date
May 27, 2025
SK Hynix Inc.
Seong Chan Kim
G11 - INFORMATION STORAGE
Information
Patent Grant
Autoscreenshot systems and methods for virtual operating system states
Patent number
12,314,137
Issue date
May 27, 2025
KASEYA US LLC
Collin Mitchell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Built-in self-test circuitry
Patent number
12,315,580
Issue date
May 27, 2025
Micron Technology, Inc.
William Yu
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory device and operating method of the memory device
Patent number
12,315,582
Issue date
May 27, 2025
SK hynix Inc.
Min Ho Her
G11 - INFORMATION STORAGE
Information
Patent Grant
Automated test equipment comprising a plurality of communication in...
Patent number
12,315,585
Issue date
May 27, 2025
Advantest Corporation
Frank Hensel
G11 - INFORMATION STORAGE
Information
Patent Grant
SRAM repair system and method
Patent number
12,315,586
Issue date
May 27, 2025
Texas Instruments Incorporated
Robin O. Hoel
G11 - INFORMATION STORAGE
Information
Patent Grant
Repairable semiconductor memory device
Patent number
12,315,583
Issue date
May 27, 2025
ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC.
Min-Chung Chou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for finding common optimal reference voltage and memory stor...
Patent number
12,315,584
Issue date
May 27, 2025
INNOGRIT TECHNOLOGIES CO., LTD.
Youngjoon Choi
G11 - INFORMATION STORAGE
Information
Patent Grant
Multi-voltage RAM used to cross clock and voltage domains
Patent number
12,315,589
Issue date
May 27, 2025
NVIDIA Corporation
Jason Golbus
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for testing memory device
Patent number
12,308,086
Issue date
May 20, 2025
NANYA TECHNOLOGY CORPORATION
Jui-Chung Hsu
G11 - INFORMATION STORAGE
Information
Patent Grant
Reconfigurable MBIST method based on adaptive march algorithm
Patent number
12,308,085
Issue date
May 20, 2025
Nanjing University Of Posts And Telecommunications
Zhikuang Cai
G11 - INFORMATION STORAGE
Information
Patent Grant
In-situ detection of anomalies in integrated circuits using machine...
Patent number
12,307,747
Issue date
May 20, 2025
Intel Corporation
Sriram R. Vangal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Volatile memory devices and methods of operating same to improve re...
Patent number
12,308,083
Issue date
May 20, 2025
Samsung Electronics Co., Ltd.
Junyoung Ko
G11 - INFORMATION STORAGE
Information
Patent Grant
Techniques for determining an interface connection status
Patent number
12,308,080
Issue date
May 20, 2025
Micron Technology, Inc.
Melissa I. Uribe
G11 - INFORMATION STORAGE
Information
Patent Grant
Configurable testing and repair system for non-volatile memory
Patent number
12,308,081
Issue date
May 20, 2025
iSTART-TEK INC.
Cheng-Yen Han
G11 - INFORMATION STORAGE
Information
Patent Grant
Interactive DRAM signal analyzer and method of analyzing and calibr...
Patent number
12,308,084
Issue date
May 20, 2025
COSIGNON
Sung Ho Park
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor memory devices that support enhanced data recovery op...
Patent number
12,308,082
Issue date
May 20, 2025
Samsung Electronics Co., Ltd.
Seungjun Oh
G11 - INFORMATION STORAGE
Information
Patent Grant
Tamper detection and prevention in computer systems having one-time...
Patent number
12,299,183
Issue date
May 13, 2025
Meta Platforms Technologies, LLC
Sudhir Satpathy
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE
Publication number
20250182828
Publication date
Jun 5, 2025
KIOXIA Corporation
Masanobu SHIRAKAWA
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
Publication number
20250182839
Publication date
Jun 5, 2025
Micron Technology, Inc.
James Brian Johnson
G11 - INFORMATION STORAGE
Information
Patent Application
SOLID STATE STORAGE DEVICE AND PATROL READ METHOD USING WORD LINE G...
Publication number
20250181498
Publication date
Jun 5, 2025
KIOXIA Corporation
Bai-Jun XIAO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY MODULE WITH LOCAL SYNCHRONIZATION
Publication number
20250181504
Publication date
Jun 5, 2025
Netlist, Inc.
Hyun Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STORAGE DEVICE
Publication number
20250182838
Publication date
Jun 5, 2025
Canon Kabushiki Kaisha
YOSHIHISA SUZUKI
G11 - INFORMATION STORAGE
Information
Patent Application
GLOBAL COLUMN REPAIR WITH LOCAL COLUMN DECODER CIRCUITRY, AND RELAT...
Publication number
20250181452
Publication date
Jun 5, 2025
Micron Technology, Inc.
Christopher G. Wieduwilt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY DEVICE TEST SYSTEM
Publication number
20250174295
Publication date
May 29, 2025
NANYA TECHNOLOGY CORPORATION
Yi-Kai HUANG
G11 - INFORMATION STORAGE
Information
Patent Application
VOLTAGE THRESHOLD ADJUSTMENT OF STORAGE DEVICES BY AN EXTERNAL CONT...
Publication number
20250173079
Publication date
May 29, 2025
PURE STORAGE, INC.
NENAD MILADINOVIC
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Memory apparatus having at-speed test mechanism and memory test met...
Publication number
20250174291
Publication date
May 29, 2025
REALTEK SEMICONDUCTOR CORPORATION
YU-CHENG LO
G11 - INFORMATION STORAGE
Information
Patent Application
SHIFT CIRCUIT, MEMORY CONTROLLER, AND MEMORY SYSTEM
Publication number
20250174254
Publication date
May 29, 2025
Yangtze Memory Technologies Co., Ltd.
Zhiwei ZHUANG
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY
Publication number
20250174292
Publication date
May 29, 2025
CXMT CORPORATION
Weibing SHANG
G11 - INFORMATION STORAGE
Information
Patent Application
CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...
Publication number
20250174293
Publication date
May 29, 2025
Samsung Electronics Co., Ltd.
Jinuk Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TOOL FOR FAULT DETECTION AND CLASSIFICATION IN DESIGN AND GENERATIO...
Publication number
20250174294
Publication date
May 29, 2025
Arteris, Inc
Xavier VAN RUYMBEKE
G11 - INFORMATION STORAGE
Information
Patent Application
STORAGE DEVICE AND METHOD OF OPERATING STORAGE DEVICE
Publication number
20250174297
Publication date
May 29, 2025
Samsung Electronics Co., Ltd.
Seonghyeog Choi
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE PERFORMING DATA READ OPERATION AND CONTROLLER...
Publication number
20250174290
Publication date
May 29, 2025
SK HYNIX INC.
Hyung Jin CHOI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY DEVICES, OPERATING METHODS THEREOF, MEMORY SYSTEMS
Publication number
20250174296
Publication date
May 29, 2025
Yangtze Memory Technologies Co., Ltd.
Xiaodong Mei
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUS AND METHODS FOR MANAGING WEAR LEVELING IN MEMORY
Publication number
20250166722
Publication date
May 22, 2025
Micron Technology, Inc.
Mohammed A. Khan
G11 - INFORMATION STORAGE
Information
Patent Application
INTERFACE READ AFTER WRITE
Publication number
20250165191
Publication date
May 22, 2025
Micron Technology, Inc.
Yue Chan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY, OPERATION METHOD THEREOF, AND MEMORY SYSTEM
Publication number
20250166717
Publication date
May 22, 2025
Yangtze Memory Technologies Co., Ltd.
SongMin JIANG
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY REPAIR CIRCUIT, A MEMORY REPAIR METHOD, AND A MEMORY DEVICE
Publication number
20250166720
Publication date
May 22, 2025
Samsung Electronics Co., Ltd.
Hyunseok KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR IN-LINE ECC PROTECTION
Publication number
20250165393
Publication date
May 22, 2025
TEXAS INSTRUMENTS INCORPORATED
Denis Roland BEAUDOIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LASER DETECTING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
Publication number
20250167139
Publication date
May 22, 2025
Samsung Electronics Co., Ltd.
Cheolhwan LIM
G11 - INFORMATION STORAGE
Information
Patent Application
DETECTING EXTRINSIC BITLINE DEFECTS
Publication number
20250166718
Publication date
May 22, 2025
Micron Technology, Inc.
Tingjun Hu
G11 - INFORMATION STORAGE
Information
Patent Application
TRIM SETTING DETERMINATION FOR A MEMORY DEVICE
Publication number
20250166719
Publication date
May 22, 2025
Micron Technology, Inc.
Aswin Thiruvengadam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ADAPTIVE SENSING TIME FOR MEMORY OPERATIONS
Publication number
20250166708
Publication date
May 22, 2025
Micron Technology, Inc.
Yu-Chung Lien
G11 - INFORMATION STORAGE
Information
Patent Application
NONVOLATILE MEMORY DEVICE, STORAGE DEVICE HAVING THE SAME, AND TEST...
Publication number
20250166721
Publication date
May 22, 2025
Samsung Electronics Co., Ltd.
Yongha PARK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECTIVE MEMORY UNIT SCREENING IN A MEMORY SYSTEM
Publication number
20250157563
Publication date
May 15, 2025
Micron Technology, Inc.
Alex Frolikov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ACTIVATION FUNCTIONS FOR ARTIFICIAL INTELLIGENCE OPERATIONS
Publication number
20250157509
Publication date
May 15, 2025
Micron Technology, Inc.
Alberto Troia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NONVOLATILE MEMORY DEVICE, METHOD OF CONTROLLING INITIALIZATION OF...
Publication number
20250157505
Publication date
May 15, 2025
Samsung Electronics Co., Ltd.
Yo Han LEE
G11 - INFORMATION STORAGE
Information
Patent Application
INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...
Publication number
20250157558
Publication date
May 15, 2025
COSIGNON
Sung Ho PARK
G01 - MEASURING TESTING