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Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
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Industry
CPC
G11C29/00
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Parent Industries
G
PHYSICS
G11
Information storage
G11C
STATIC STORES
Current Industry
G11C29/00
Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
Sub Industries
G11C29/003
in serial memories
G11C29/006
at wafer scale level
G11C29/02
Detection or location of defective auxiliary circuits
G11C29/021
in voltage or current generators
G11C29/022
in I/O circuitry
G11C29/023
in clock generator or timing circuitry
G11C29/024
in decoders
G11C29/025
in signal lines
G11C29/026
in sense amplifiers
G11C29/027
in fuses
G11C29/028
with adaption or trimming of parameters
G11C29/04
Detection or location of defective memory elements
G11C29/06
Acceleration testing
G11C29/08
Functional testing
G11C29/10
Test algorithms
G11C29/12
Built-in arrangements for testing
G11C29/12005
comprising voltage or current generators
G11C29/1201
comprising I/O circuitry
G11C29/12015
comprising clock generation or timing circuitry
G11C29/14
Implementation of control logic
G11C29/16
using microprogrammed units
G11C29/18
Address generation devices Devices for accessing memories
G11C29/20
using counters or linear-feedback shift registers [LFSR]
G11C29/22
Accessing serial memories
G11C29/24
Accessing extra cells
G11C29/26
Accessing multiple arrays
G11C29/28
Dependent multiple arrays
G11C29/30
Accessing single arrays
G11C29/32
Serial access Scan testing
G11C29/34
Accessing multiple bits simultaneously
G11C29/36
Data generation devices
G11C29/38
Response verification devices
G11C29/40
using compression techniques
G11C29/42
using error correcting codes [ECC] or parity check
G11C29/44
Indication or identification of errors
G11C29/4401
for self repair
G11C29/46
Test trigger logic
G11C29/48
Arrangements in static stores specially adapted for testing by means external to the store
G11C29/50
Marginal testing
G11C29/50004
of threshold voltage
G11C29/50008
of impedance
G11C29/50012
of timing
G11C29/50016
of retention
G11C29/52
Protection of memory contents Detection of errors in memory contents
G11C29/54
Arrangements for designing test circuits
G11C29/56
External testing equipment for static stores
G11C29/56004
Pattern generation
G11C29/56008
Error analysis, representation of errors
G11C29/56012
Timing aspects, clock generation, synchronisation
G11C29/56016
Apparatus features
G11C29/70
Masking faults in memories by using spares or by reconfiguring
G11C29/702
by replacing auxiliary circuits
G11C29/72
with optimized replacement algorithms
G11C29/74
using duplex memories
G11C29/76
using address translation or modifications
G11C29/765
in solid state disks
G11C29/78
using programmable devices
G11C29/781
combined in a redundant decoder
G11C29/783
with refresh of replacement cells
G11C29/785
with redundancy programming schemes
G11C29/787
using a fuse hierarchy
G11C29/789
using non-volatile cells or latches
G11C29/80
with improved layout
G11C29/802
by encoding redundancy signals
G11C29/804
to prevent clustered faults
G11C29/806
by reducing size of decoders
G11C29/808
using a flexible replacement scheme
G11C29/81
using a hierarchical redundancy scheme
G11C29/812
using a reduced amount of fuses
G11C29/814
for optimized yield
G11C29/816
for an application-specific layout
G11C29/818
for dual-port memories
G11C29/82
for EEPROMs
G11C29/822
for read only memories
G11C29/824
for synchronous memories
G11C29/83
with reduced power consumption
G11C29/832
with disconnection of faulty elements
G11C29/835
with roll call arrangements for redundant substitutions
G11C29/838
with substitution of defective spares
G11C29/84
with improved access time or stability
G11C29/842
by introducing a delay in a signal path
G11C29/844
by splitting the decoders in stages
G11C29/846
by choosing redundant lines at an output stage
G11C29/848
by adjacent switching
G11C29/86
in serial access memories
G11C29/88
with partially good memories
G11C29/883
using a single defective memory device with reduced capacity
G11C29/886
combining plural defective memory devices to provide a contiguous address range
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Memory device and method for testing the memory device that bypasse...
Patent number
12,340,843
Issue date
Jun 24, 2025
Infineon Technologies AG
Thomas Kern
G11 - INFORMATION STORAGE
Information
Patent Grant
Indicating a status of a memory built-in self-test using a data mas...
Patent number
12,340,860
Issue date
Jun 24, 2025
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Grant
Electronic device for adjusting driving voltage of volatile memory...
Patent number
12,340,857
Issue date
Jun 24, 2025
Samsung Electronics Co., Ltd.
Changmi Shin
G11 - INFORMATION STORAGE
Information
Patent Grant
Interface level-shifter dual-rail memory architecture
Patent number
12,340,864
Issue date
Jun 24, 2025
Synopsys, Inc.
Harold Pilo
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory system
Patent number
12,340,124
Issue date
Jun 24, 2025
Kioxia Corporation
Marie Takada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Distributed protocol endpoint services for data storage systems
Patent number
12,341,848
Issue date
Jun 24, 2025
PURE STORAGE, INC.
Justin Emerson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatuses, systems, and methods for module level error correction
Patent number
12,340,858
Issue date
Jun 24, 2025
Micron Technology, Inc.
Sujeet Ayyapureddi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hybrid memory system with increased bandwidth
Patent number
12,340,859
Issue date
Jun 24, 2025
QUALCOMM Incorporated
Jungwon Suh
G11 - INFORMATION STORAGE
Information
Patent Grant
Selective per die DRAM PPR for memory device
Patent number
12,340,861
Issue date
Jun 24, 2025
Micron Technology, Inc.
Amitava Majumdar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory, control apparatus, clock processing method, and electronic...
Patent number
12,339,699
Issue date
Jun 24, 2025
CHANGXIN MEMORY TECHNOLOGIES, INC.
Jingwei Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic address scramble
Patent number
12,334,138
Issue date
Jun 17, 2025
Micron Technology, Inc.
Erik T. Barmon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Digital Verify Failbit Count (VFC) circuit
Patent number
12,334,162
Issue date
Jun 17, 2025
Yangtze Memory Technologies Co., Ltd.
Teng Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Scheme to fetch optimal read parameters by skipping invalid wordlines
Patent number
12,334,169
Issue date
Jun 17, 2025
SanDisk Technologies, Inc.
Darshan Pagariya
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory device including flexible column repair circuit
Patent number
12,334,173
Issue date
Jun 17, 2025
Samsung Electronics Co., Ltd.
Hyungjin Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory device, memory system and method for operating memory system...
Patent number
12,334,186
Issue date
Jun 17, 2025
Samsung Electronics Co., Ltd.
Jaehyeok Baek
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and device for testing memory
Patent number
12,334,167
Issue date
Jun 17, 2025
CHANGXIN MEMORY TECHNOLOGIES, INC.
Dong Liu
G11 - INFORMATION STORAGE
Information
Patent Grant
Identifying unusable memory blocks based on zeros-ones imbalance in...
Patent number
12,334,176
Issue date
Jun 17, 2025
Apple Inc.
Assaf Shappir
G11 - INFORMATION STORAGE
Information
Patent Grant
Data integrity checks based on voltage distribution metrics
Patent number
12,334,166
Issue date
Jun 17, 2025
Micron Technology, Inc.
Vamsi Pavan Rayaprolu
G11 - INFORMATION STORAGE
Information
Patent Grant
Flash memory module testing method and associated memory controller...
Patent number
12,334,168
Issue date
Jun 17, 2025
Silicon Motion, Inc.
Chiu-Han Chang
G11 - INFORMATION STORAGE
Information
Patent Grant
Controlling memory including managing a correction value table
Patent number
12,334,171
Issue date
Jun 17, 2025
Kioxia Corporation
Masanobu Shirakawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Techniques for testing PLP capacitors
Patent number
12,332,710
Issue date
Jun 17, 2025
Kioxia Corporation
Paul Abrahams
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Address refresh check method and apparatus, storage medium, and ele...
Patent number
12,334,134
Issue date
Jun 17, 2025
CHANGXIN MEMORY TECHNOLOGIES, INC.
Teng Shi
G11 - INFORMATION STORAGE
Information
Patent Grant
Single-level cell program-verify, latch-limited data recovery
Patent number
12,334,163
Issue date
Jun 17, 2025
Micron Technology, Inc.
Eric N. Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Operating and testing semiconductor devices
Patent number
12,334,170
Issue date
Jun 17, 2025
Samsung Electronics Co., Ltd.
Taewook Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Link evaluation for a memory device
Patent number
12,334,172
Issue date
Jun 17, 2025
Micron Technology, Inc.
Markus Balb
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Maximum memory clock estimation procedures
Patent number
12,334,137
Issue date
Jun 17, 2025
Micron Technology, Inc.
Erik V. Pohlmann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Aging monitoring circuit of semiconductor memory device
Patent number
12,334,165
Issue date
Jun 17, 2025
FIDELIX CO., LTD.
Jae Jin Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Electronic devices related to compensation of monitoring signals
Patent number
12,334,174
Issue date
Jun 17, 2025
SK hynix Inc.
Yoon Jae Shin
G11 - INFORMATION STORAGE
Information
Patent Grant
Differential strobe fault indication
Patent number
12,334,175
Issue date
Jun 17, 2025
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Grant
Row access strobe (RAS) clobber and row hammer failure mitigation
Patent number
12,333,022
Issue date
Jun 17, 2025
Micron Technology, Inc.
Yang Lu
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
BACKGROUND DATA REFRESH USING SOFT READS
Publication number
20250210127
Publication date
Jun 26, 2025
SK Hynix NAND Product Solutions Corp. (dba Solidigm)
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY CONTROLLER PERFORMING TRAINING TO IMPROVE COMMUNICATION AND...
Publication number
20250210079
Publication date
Jun 26, 2025
SK HYNIX INC.
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY FAULT NOTIFICATION
Publication number
20250210122
Publication date
Jun 26, 2025
Micron Technology, Inc.
G11 - INFORMATION STORAGE
Information
Patent Application
ENHANCED ERROR CORRECTION CODE FOR ERROR DETECTION AND CORRECTION I...
Publication number
20250210126
Publication date
Jun 26, 2025
TetraMem Inc.
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE
Publication number
20250210123
Publication date
Jun 26, 2025
Lodestar Licensing Group LLC
G11 - INFORMATION STORAGE
Information
Patent Application
PERFORMING SELECT GATE INTEGRITY CHECKS TO IDENTIFY AND INVALIDATE...
Publication number
20250210125
Publication date
Jun 26, 2025
Micron Technology, Inc.
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NON-VOLATILE MEMORY WITH LEAK TESTS
Publication number
20250210124
Publication date
Jun 26, 2025
Western Digital Technologies, Inc.
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECTING ERRORS WITHIN DATA PATH CIRCUITRY OF A MEMORY DEVICE
Publication number
20250201329
Publication date
Jun 19, 2025
ADVANCED MICRO DEVICES, INC.
Michael LITT
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUS WITH CIRCUIT-LOCATING MECHANISM
Publication number
20250201331
Publication date
Jun 19, 2025
Micron Technology, Inc.
Itamar Lavy
G11 - INFORMATION STORAGE
Information
Patent Application
STORAGE DEVICE AND METHOD OF APPLYING DYNAMIC PARITY
Publication number
20250201333
Publication date
Jun 19, 2025
Samsung Electronics Co., Ltd.
Seona WON
G11 - INFORMATION STORAGE
Information
Patent Application
DIE-LEVEL BLOCK FAMILY ERROR AVOIDANCE
Publication number
20250201326
Publication date
Jun 19, 2025
Micron Technology, Inc.
Murong Lang
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY DEVICE INCLUDING DAMAGE DETECTION CIRCUIT AND TEST SYSTEM IN...
Publication number
20250201324
Publication date
Jun 19, 2025
Samsung Electronics Co., Ltd.
Eunji Kim
G11 - INFORMATION STORAGE
Information
Patent Application
SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
Publication number
20250201327
Publication date
Jun 19, 2025
NANYA TECHNOLOGY CORPORATION
Yaochang CHIU
G11 - INFORMATION STORAGE
Information
Patent Application
DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION
Publication number
20250201328
Publication date
Jun 19, 2025
Rambus Inc.
Ely Tsern
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FAIL CLASSIFICATION DEVICE FOR PLURALITY OF MEMORY CELLS AND METHOD...
Publication number
20250201332
Publication date
Jun 19, 2025
SK HYNIX INC.
Seon O LEE
G11 - INFORMATION STORAGE
Information
Patent Application
ON-ACCESS ERROR CORRECTION FOR CONTENT-ADDRESSABLE MEMORY
Publication number
20250201334
Publication date
Jun 19, 2025
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP.
Ron M. Roth
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ROWHAMMER MITIGATION FOR A MEMORY DIE
Publication number
20250201295
Publication date
Jun 19, 2025
Rambus Inc.
Wendy Elsasser
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY SYSTEM
Publication number
20250201325
Publication date
Jun 19, 2025
KIOXIA Corporation
Tsukasa TOKUTOMI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF
Publication number
20250201330
Publication date
Jun 19, 2025
SK HYNIX INC.
Jeong Hwan SONG
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY, MEMORY SYSTEM, PROGRAM METHOD OF MEMORY, AND ELECTRONIC APP...
Publication number
20250191668
Publication date
Jun 12, 2025
Yangtze Memory Technologies Co., Ltd.
Hongtao Liu
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD, DEVICE, AND CIRCUIT FOR HIGH-SPEED MEMORIES
Publication number
20250191669
Publication date
Jun 12, 2025
Taiwan Semiconductor Manufacturing Company, Ltd.
Jaspal Singh SHAH
G11 - INFORMATION STORAGE
Information
Patent Application
FLASH MEMORY AND TESTING METHOD THEREOF
Publication number
20250191672
Publication date
Jun 12, 2025
WINBOND ELECTRONICS CORP.
I-Hsien Tseng
G11 - INFORMATION STORAGE
Information
Patent Application
BLOCK FAMILY ERROR AVOIDANCE BIN DESIGNS ADDRESSING ERROR CORRECTIO...
Publication number
20250191670
Publication date
Jun 12, 2025
Micron Technology, Inc.
Guang Hu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS FOR MULTI-BANKED VICTIM CACHE WITH DUAL DATAPATH
Publication number
20250190368
Publication date
Jun 12, 2025
TEXAS INSTRUMENTS INCORPORATED
Naveen Bhoria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20250190301
Publication date
Jun 12, 2025
RENESAS ELECTRONICS CORPORATION
Daiki KITAGATA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMPEDANCE CALIBRATION CIRCUIT, SEMICONDUCTOR MEMORY APPARATUS AND M...
Publication number
20250191623
Publication date
Jun 12, 2025
SK HYNIX INC.
Jae Hyeong HONG
G11 - INFORMATION STORAGE
Information
Patent Application
TECHNOLOGIES FOR DYNAMIC ACCELERATOR SELECTION
Publication number
20250193295
Publication date
Jun 12, 2025
Intel Corporation
Francesc Guim Bernat
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE INCLUDING BUILT-IN-SELF-TES...
Publication number
20250191671
Publication date
Jun 12, 2025
Samsung Electronics Co., Ltd.
Jaehyeok KIM
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE
Publication number
20250182828
Publication date
Jun 5, 2025
KIOXIA Corporation
Masanobu SHIRAKAWA
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
Publication number
20250182839
Publication date
Jun 5, 2025
Micron Technology, Inc.
James Brian Johnson
G11 - INFORMATION STORAGE