Accessing multiple bits simultaneously

Industry

CPC
G11C29/34

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/34Accessing multiple bits simultaneously

Industries

Patents Grantslast 30 patents

Information Patent Grant
Memory testing techniques
- Patent number 11,862,271
- Issue date Jan 2, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory chip having on-die mirroring function and method for testing...
- Patent number 11,848,068
- Issue date Dec 19, 2023
- Samsung Electronics Co., Ltd.
- Byoungsul Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent proactive responses to operations to read data from mem...
- Patent number 11,657,886
- Issue date May 23, 2023
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and test method thereof
- Patent number 11,437,118
- Issue date Sep 6, 2022
- Samsung Electronics Co., Ltd.
- Sungik Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic devices including a test circuit and methods of operatin...
- Patent number 11,417,409
- Issue date Aug 16, 2022
- SK hynix Inc.
- Hyun Seung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory chip having on-die mirroring function and method for testing...
- Patent number 11,398,292
- Issue date Jul 26, 2022
- Samsung Electronics Co., Ltd.
- Byoungsul Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for prioritization of bit error correction attempts
- Patent number 11,342,044
- Issue date May 24, 2022
- Nuvoton Technology Corporation
- Ziv Hershman
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and operating method of memory system
- Patent number 11,188,415
- Issue date Nov 30, 2021
- Samsung Electronics Co., Ltd.
- Beomkyu Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent proactive responses to operations to read data from mem...
- Patent number 11,081,200
- Issue date Aug 3, 2021
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing multi-port array in integrated circuits
- Patent number 11,069,422
- Issue date Jul 20, 2021
- International Business Machines Corporation
- Matthew Steven Hyde
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and operation method thereof
- Patent number 11,024,402
- Issue date Jun 1, 2021
- SK Hynix Inc.
- Hoiju Chung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory circuit and method of operating a memory circuit
- Patent number 10,937,469
- Issue date Mar 2, 2021
- Infineon Technologies AG
- Jan Otterstedt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flash memory with reference voltage generation from a plurality of...
- Patent number 10,910,046
- Issue date Feb 2, 2021
- X-FAB SEMICONDUCTOR FOUNDRIES GMBH
- Predrag Micakovic
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile in-memory computing device
- Patent number 10,832,746
- Issue date Nov 10, 2020
- GSI Technology Inc.
- Avidan Akerib
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and operating method thereof
- Patent number 10,790,006
- Issue date Sep 29, 2020
- SK hynix Inc.
- Hee Youl Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Safety enhancement for memory controllers
- Patent number 10,747,611
- Issue date Aug 18, 2020
- Microchip Technology Incorporated
- Alain Vergnes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated characterization vehicles for non-volatile memory cells
- Patent number 10,622,087
- Issue date Apr 14, 2020
- Hewlett Packard Enterprise Development LP
- Jeffrey Alan Lucas
- G01 - MEASURING TESTING
Information Patent Grant
Content addressable memory with match hit quality indication
- Patent number 10,614,884
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Martin Eckert
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit fault detection
- Patent number 10,613,926
- Issue date Apr 7, 2020
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory circuit including overlay memory cells and method of operati...
- Patent number 10,497,408
- Issue date Dec 3, 2019
- Infineon Technologies AG
- Jan Otterstedt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing and operating a non-volatile memory device
- Patent number 10,475,517
- Issue date Nov 12, 2019
- Western Digital Technologies, Inc.
- Ajith Kumar Battaje
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor apparatus with reduced risks of chip counterfeiting a...
- Patent number 10,460,824
- Issue date Oct 29, 2019
- Yukihiro Nagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory circuit with improved read and write access
- Patent number 10,387,047
- Issue date Aug 20, 2019
- Etron Technology, Inc.
- Chun Shiah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device and operating method thereof
- Patent number 10,388,358
- Issue date Aug 20, 2019
- SK hynix Inc.
- Hee Youl Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan compression architecture for highly compressed designs and ass...
- Patent number 10,354,742
- Issue date Jul 16, 2019
- STMicroelectronics International N.V.
- Swapnil Bahl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Content addressable memory with match hit quality indication
- Patent number 10,347,337
- Issue date Jul 9, 2019
- International Business Machines Corporation
- Martin Eckert
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory circuit capable of being quickly written in data
- Patent number 10,255,965
- Issue date Apr 9, 2019
- Etron Technology, Inc.
- Chun Shiah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device for applying different bias voltages an...
- Patent number 10,121,529
- Issue date Nov 6, 2018
- SK hynix Inc.
- Hee Youl Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Characterizing and operating a non-volatile memory device
- Patent number 10,068,650
- Issue date Sep 4, 2018
- Western Digital Technologies, Inc.
- Ajith Kumar Battaje
- G11 - INFORMATION STORAGE
Information Patent Grant
Address translation stimuli generation for post-silicon functional...
- Patent number 10,026,500
- Issue date Jul 17, 2018
- International Business Machines Corporation
- Shai Doron
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Memory Testing Techniques
- Publication number 20240136006
- Publication date Apr 25, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STORAGE APPARATUS
- Publication number 20240071551
- Publication date Feb 29, 2024
- ABLIC Inc.
- Yasushi IMAI
- G11 - INFORMATION STORAGE
Information Patent Application
ONE-TIME PROGRAMMABLE (ROTP) NVM
- Publication number 20230395171
- Publication date Dec 7, 2023
- Infineon Technologies LLC
- Yoav Yogev
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CHIP HAVING ON-DIE MIRRORING FUNCTION AND METHOD FOR TESTING...
- Publication number 20220328122
- Publication date Oct 13, 2022
- Samsung Electronics Co., Ltd.
- Byoungsul KIM
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC DEVICES INCLUDING A TEST CIRCUIT AND METHODS OF OPERATIN...
- Publication number 20220122683
- Publication date Apr 21, 2022
- SK HYNIX INC.
- Hyun Seung KIM
- G11 - INFORMATION STORAGE
Information Patent Application
Intelligent Proactive Responses to Operations to Read Data from Mem...
- Publication number 20210350869
- Publication date Nov 11, 2021
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT AND MEMORY CHIP USING TEST CIRCUIT
- Publication number 20210174890
- Publication date Jun 10, 2021
- Changxin Memory Technologies, Inc.
- Jia WANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CHIP HAVING ON-DIE MIRRORING FUNCTION AND METHOD FOR TESTING...
- Publication number 20210104292
- Publication date Apr 8, 2021
- Samsung Electronics Co., Ltd.
- Byoungsul KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR PRIORITIZATION OF BIT ERROR CORRECTION ATTEMPTS
- Publication number 20200381076
- Publication date Dec 3, 2020
- NUVOTON TECHNOLOGY CORPORATION
- Ziv HERSHMAN
- G11 - INFORMATION STORAGE
Information Patent Application
IN-MEMORY COMPUTING DEVICE FOR 8T-SRAM MEMORY CELLS
- Publication number 20200381026
- Publication date Dec 3, 2020
- GSI Technology Inc.
- Avidan Akerib
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20200327952
- Publication date Oct 15, 2020
- SK HYNIX INC.
- Hoiju CHUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory Testing Techniques
- Publication number 20200194093
- Publication date Jun 18, 2020
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM AND OPERATING METHOD OF MEMORY SYSTEM
- Publication number 20200183777
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- BEOMKYU SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CIRCUIT AND METHOD OF OPERATING A MEMORY CIRCUIT
- Publication number 20200066312
- Publication date Feb 27, 2020
- INFINEON TECHNOLOGIES AG
- Jan OTTERSTEDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLASH MEMORY
- Publication number 20200020394
- Publication date Jan 16, 2020
- X-FAB SEMICONDUCTOR FOUNDRIES GmbH
- Predrag MICAKOVIC
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF
- Publication number 20190325935
- Publication date Oct 24, 2019
- SK HYNIX INC.
- Hee Youl LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CHARACTERIZATION VEHICLES FOR NON-VOLATILE MEMORY CELLS
- Publication number 20190272886
- Publication date Sep 5, 2019
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Jeffrey Alan Lucas
- G01 - MEASURING TESTING
Information Patent Application
CONTENT ADDRESSABLE MEMORY WITH MATCH HIT QUALITY INDICATION
- Publication number 20190206492
- Publication date Jul 4, 2019
- International Business Machines Corporation
- Martin ECKERT
- G11 - INFORMATION STORAGE
Information Patent Application
CHARACTERIZING AND OPERATING A NON-VOLATILE MEMORY DEVICE
- Publication number 20190066801
- Publication date Feb 28, 2019
- Western Digital Technologies, Inc.
- Ajith Kumar BATTAJE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF
- Publication number 20190035451
- Publication date Jan 31, 2019
- SK HYNIX INC.
- Hee Youl LEE
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CIRCUIT AND METHOD OF OPERATING A MEMORY CIRCUIT
- Publication number 20180158534
- Publication date Jun 7, 2018
- INFINEON TECHNOLOGIES AG
- Jan OTTERSTEDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE, CONTROLLER, AND OPERATING METHODS THEREOF
- Publication number 20180129559
- Publication date May 10, 2018
- SK HYNIX INC.
- Nack Hyun KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF
- Publication number 20180082731
- Publication date Mar 22, 2018
- SK HYNIX INC.
- Hee Youl LEE
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS OF OPERATING BUFFERED MULTI-RANK MEMORY MODULES CONFIGURED...
- Publication number 20180025788
- Publication date Jan 25, 2018
- Samsung Electronics Co., Ltd.
- Tae-Hyung Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Apparatus and Identification Method of a Semiconducto...
- Publication number 20170221581
- Publication date Aug 3, 2017
- Yukihiro Nagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN COMPRESSION ARCHITECTURE FOR HIGHLY COMPRESSED DESIGNS AND ASS...
- Publication number 20170140838
- Publication date May 18, 2017
- STMicroelectronics International N.V
- Swapnil BAHL
- G01 - MEASURING TESTING
Information Patent Application
ADDRESS TRANSLATION STIMULI GENERATION FOR POST-SILICON FUNCTIONAL...
- Publication number 20170140839
- Publication date May 18, 2017
- International Business Machines Corporation
- Shai Doron
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUFFERED MULTI-RANK MEMORY MODULES CONFIGURED TO SELECTIVELY LINK R...
- Publication number 20170092379
- Publication date Mar 30, 2017
- Samsung Electronics Co., Ltd.
- Tae-Hyung Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPRATUS FOR SHORTENED ERASE OPTION
- Publication number 20140376311
- Publication date Dec 25, 2014
- Macronix International Co., Ltd.
- Chun-Hsiung Hung
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE HAVING ROLL CALL CIRCUIT
- Publication number 20140286113
- Publication date Sep 25, 2014
- Micron Technology, Inc.
- SHUICHI KUBOUCHI
- G11 - INFORMATION STORAGE

Accessing multiple bits simultaneously

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Memory testing techniques

Memory chip having on-die mirroring function and method for testing...

Intelligent proactive responses to operations to read data from mem...

Memory device and test method thereof

Electronic devices including a test circuit and methods of operatin...

Memory chip having on-die mirroring function and method for testing...

System and method for prioritization of bit error correction attempts

Memory system and operating method of memory system

Intelligent proactive responses to operations to read data from mem...

Testing multi-port array in integrated circuits

Memory system and operation method thereof

Memory circuit and method of operating a memory circuit

Flash memory with reference voltage generation from a plurality of...

Non-volatile in-memory computing device

Semiconductor memory device and operating method thereof

Safety enhancement for memory controllers

Integrated characterization vehicles for non-volatile memory cells

Content addressable memory with match hit quality indication

Integrated circuit fault detection

Memory circuit including overlay memory cells and method of operati...

Characterizing and operating a non-volatile memory device

Semiconductor apparatus with reduced risks of chip counterfeiting a...

Memory circuit with improved read and write access

Semiconductor memory device and operating method thereof

Scan compression architecture for highly compressed designs and ass...

Content addressable memory with match hit quality indication

Memory circuit capable of being quickly written in data

Semiconductor memory device for applying different bias voltages an...

Characterizing and operating a non-volatile memory device

Address translation stimuli generation for post-silicon functional...

Patents Applicationslast 30 patents

Memory Testing Techniques

SEMICONDUCTOR STORAGE APPARATUS

ONE-TIME PROGRAMMABLE (ROTP) NVM

MEMORY CHIP HAVING ON-DIE MIRRORING FUNCTION AND METHOD FOR TESTING...

ELECTRONIC DEVICES INCLUDING A TEST CIRCUIT AND METHODS OF OPERATIN...

Intelligent Proactive Responses to Operations to Read Data from Mem...

TEST CIRCUIT AND MEMORY CHIP USING TEST CIRCUIT

MEMORY CHIP HAVING ON-DIE MIRRORING FUNCTION AND METHOD FOR TESTING...

SYSTEM AND METHOD FOR PRIORITIZATION OF BIT ERROR CORRECTION ATTEMPTS

IN-MEMORY COMPUTING DEVICE FOR 8T-SRAM MEMORY CELLS

MEMORY SYSTEM AND OPERATION METHOD THEREOF

Memory Testing Techniques

MEMORY SYSTEM AND OPERATING METHOD OF MEMORY SYSTEM

MEMORY CIRCUIT AND METHOD OF OPERATING A MEMORY CIRCUIT

FLASH MEMORY

SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF

INTEGRATED CHARACTERIZATION VEHICLES FOR NON-VOLATILE MEMORY CELLS

CONTENT ADDRESSABLE MEMORY WITH MATCH HIT QUALITY INDICATION

CHARACTERIZING AND OPERATING A NON-VOLATILE MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF

MEMORY CIRCUIT AND METHOD OF OPERATING A MEMORY CIRCUIT

SEMICONDUCTOR MEMORY DEVICE, CONTROLLER, AND OPERATING METHODS THEREOF

SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF

METHODS OF OPERATING BUFFERED MULTI-RANK MEMORY MODULES CONFIGURED...

Semiconductor Apparatus and Identification Method of a Semiconducto...

SCAN COMPRESSION ARCHITECTURE FOR HIGHLY COMPRESSED DESIGNS AND ASS...

ADDRESS TRANSLATION STIMULI GENERATION FOR POST-SILICON FUNCTIONAL...

BUFFERED MULTI-RANK MEMORY MODULES CONFIGURED TO SELECTIVELY LINK R...

METHOD AND APPRATUS FOR SHORTENED ERASE OPTION

SEMICONDUCTOR DEVICE HAVING ROLL CALL CIRCUIT