Accessing single arrays

Industry

CPC
G11C29/30

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/30Accessing single arrays

Industries

Patents Grantslast 30 patents

Information Patent Grant
Scan chain compression for testing memory of a system on a chip
- Patent number 12,112,818
- Issue date Oct 8, 2024
- Synopsys, Inc.
- Harold Pilo
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory, memory system, operation method of the memory, and operatio...
- Patent number 12,073,902
- Issue date Aug 27, 2024
- SK Hynix Inc.
- Kyung Whan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus of integrating memory stacks
- Patent number 11,604,754
- Issue date Mar 14, 2023
- Advanced Micro Devices, Inc.
- Dmitri Yudanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for direct access hybrid testing
- Patent number 11,581,056
- Issue date Feb 14, 2023
- Micron Technology, Inc.
- Chiaki Dono
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory, memory system, operation method of the memory, and operatio...
- Patent number 11,557,366
- Issue date Jan 17, 2023
- SK Hynix Inc.
- Kyung Whan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit and associated chip
- Patent number 11,508,452
- Issue date Nov 22, 2022
- Realtek Semiconductor Corporation
- Sheng-Lin Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Cache array macro micro-masking
- Patent number 11,449,397
- Issue date Sep 20, 2022
- International Business Machines Corporation
- Gregory J. Fredeman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods to encode column plane compression data
- Patent number 10,937,517
- Issue date Mar 2, 2021
- Micron Technology, Inc.
- Eric J. Rich-Plotkin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for direct access hybrid testing
- Patent number 10,896,738
- Issue date Jan 19, 2021
- Micron Technology, Inc.
- Chiaki Dono
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device providing bad column repair and method of operating same
- Patent number 10,803,974
- Issue date Oct 13, 2020
- Yangtze Memory Technologies Co., Ltd.
- Qiang Tang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having a test circuit
- Patent number 10,790,039
- Issue date Sep 29, 2020
- Micron Technology, Inc.
- Hyunui Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device and test method thereof
- Patent number 10,658,064
- Issue date May 19, 2020
- SK Hynix Inc.
- Jeong-Jun Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Monitoring a memory for retirement
- Patent number 10,453,547
- Issue date Oct 22, 2019
- Seagate Technologies LLC
- Darshana H. Mehta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Register array having groups of latches with single test latch test...
- Patent number 10,365,328
- Issue date Jul 30, 2019
- GLOBALFOUNDRIES Inc.
- Jian Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repairable semiconductor memory device and test methods for the same
- Patent number 10,094,869
- Issue date Oct 9, 2018
- SK hynix Inc.
- Sang Hee Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for accessing a storage unit of a flash memory and apparatu...
- Patent number 9,514,843
- Issue date Dec 6, 2016
- Silicon Motion, Inc.
- Han-Cheng Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Partial chip, and systems having the same
- Patent number 9,508,452
- Issue date Nov 29, 2016
- Samsung Electronics Co., Ltd.
- Young Seok Ryu
- G11 - INFORMATION STORAGE
Information Patent Grant
Variable read delay system
- Patent number 9,431,129
- Issue date Aug 30, 2016
- QUALCOMM Incorporated
- Jung Pill Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Address windowing for at-speed bitmapping with memory built-in self...
- Patent number 9,171,645
- Issue date Oct 27, 2015
- GlobalFoundries U.S. 2 LLC
- Geovanny Rodriguez
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus pertaining to a ferroelectric random access me...
- Patent number 8,724,367
- Issue date May 13, 2014
- Texas Instruments Incorporated
- Michael Patrick Clinton
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory array configurable for high performance and hig...
- Patent number 8,587,982
- Issue date Nov 19, 2013
- QUALCOMM Incorporated
- Jung Pill Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Performing stuck-at testing using multiple isolation circuits
- Patent number 8,553,488
- Issue date Oct 8, 2013
- Apple Inc.
- Brian J. Campbell
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for accelerating memory randomization
- Patent number 8,549,367
- Issue date Oct 1, 2013
- Cadence Design Systems, Inc.
- Mark A. Sherred
- G11 - INFORMATION STORAGE
Information Patent Grant
Automatic scrambling of input/output data according to row addresse...
- Patent number 8,081,534
- Issue date Dec 20, 2011
- Hynix Semiconductor Inc.
- Seung-Bong Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 7,742,350
- Issue date Jun 22, 2010
- NEC Electronics Corporation
- Yoichi Yamaguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device, memory module having the same, the tes...
- Patent number 7,529,143
- Issue date May 5, 2009
- Elpida Memory, Inc.
- Shinji Sakuragi
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for semiconductor device
- Patent number 7,437,645
- Issue date Oct 14, 2008
- Oki Electric Industry Co., Ltd.
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for semiconductor device
- Patent number 7,249,295
- Issue date Jul 24, 2007
- Oki Electric Industry Co., Ltd.
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Acceleration of the programming of a memory module with the aid of...
- Patent number 7,173,840
- Issue date Feb 6, 2007
- Siemens Aktiengesellschaft
- Karlheinz Krause
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory circuit scan arrangement
- Patent number 7,134,058
- Issue date Nov 7, 2006
- STMicroelectronics Limited
- Christophe Lauga
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DISTRIBUTED MRAM CONFIGURATION BIT AND METHOD OF REPAIR
- Publication number 20240420796
- Publication date Dec 19, 2024
- EVERSPIN TECHNOLOGIES, INC.
- Syed M. ALAM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...
- Publication number 20240412802
- Publication date Dec 12, 2024
- MimirIP LLC
- Kyung Whan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fully Scannable Memory Arrays
- Publication number 20240412797
- Publication date Dec 12, 2024
- SambaNova Systems, Inc.
- Thomas A. ZIAJA
- G11 - INFORMATION STORAGE
Information Patent Application
Method for Scanning a Memory Array
- Publication number 20240412798
- Publication date Dec 12, 2024
- SambaNova Systems, Inc.
- Thomas ZIAJA
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUS TO SELECT ADDRESSES FOR MEMORY TRAINING
- Publication number 20240257890
- Publication date Aug 1, 2024
- Intel Corporation
- Zhiguo Wei
- G11 - INFORMATION STORAGE
Information Patent Application
Register Bank Architecture with Latches
- Publication number 20240249790
- Publication date Jul 25, 2024
- ARM Limited
- Yannis Jallamion-Grive
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS OF INTEGRATING MEMORY STACKS
- Publication number 20230350830
- Publication date Nov 2, 2023
- ADVANCED MICRO DEVICES, INC.
- Dmitri Yudanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...
- Publication number 20230116422
- Publication date Apr 13, 2023
- SK HYNIX INC.
- Kyung Whan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN CHAIN COMPRESSION FOR TESTING MEMORY OF A SYSTEM ON A CHIP
- Publication number 20230005562
- Publication date Jan 5, 2023
- Synopsys, Inc.
- Harold PILO
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT AND ASSOCIATED CHIP
- Publication number 20220130481
- Publication date Apr 28, 2022
- REALTEK SEMICONDUCTOR CORPORATION
- SHENG-LIN LIN
- G01 - MEASURING TESTING
Information Patent Application
MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...
- Publication number 20210158886
- Publication date May 27, 2021
- SK HYNIX INC.
- Kyung Whan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR DIRECT ACCESS HYBRID TESTING
- Publication number 20210104293
- Publication date Apr 8, 2021
- Micron Technology, Inc.
- Chiaki Dono
- G11 - INFORMATION STORAGE
Information Patent Application
CACHE ARRAY MACRO MICRO-MASKING
- Publication number 20210073087
- Publication date Mar 11, 2021
- International Business Machines Corporation
- Gregory J. FREDEMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200082902
- Publication date Mar 12, 2020
- Kabushiki Kaisha Toshiba
- Junji TAKAHASHI
- G11 - INFORMATION STORAGE
Information Patent Application
REGISTER ARRAY HAVING GROUPS OF LATCHES WITH SINGLE TEST LATCH TEST...
- Publication number 20190004114
- Publication date Jan 3, 2019
- GLOBALFOUNDRIES INC.
- JIAN SUN
- G11 - INFORMATION STORAGE
Information Patent Application
MONITORING A MEMORY FOR RETIREMENT
- Publication number 20180366209
- Publication date Dec 20, 2018
- Seagate Technology LLC
- Darshana H. Mehta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE AND TEST METHOD THEREOF
- Publication number 20180268917
- Publication date Sep 20, 2018
- SK HYNIX INC.
- Jeong-Jun LEE
- G11 - INFORMATION STORAGE
Information Patent Application
REPAIR DEVICE AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
- Publication number 20180261301
- Publication date Sep 13, 2018
- SK HYNIX INC.
- Sang Hee KIM
- G11 - INFORMATION STORAGE
Information Patent Application
VARIABLE READ DELAY SYSTEM
- Publication number 20150318057
- Publication date Nov 5, 2015
- QUALCOMM Incorporated
- Jung Pill KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR ACCESSING A STORAGE UNIT OF A FLASH MEMORY AND APPARATU...
- Publication number 20150143188
- Publication date May 21, 2015
- SILICON MOTION, INC.
- Han-Cheng HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADDRESS WINDOWING FOR AT-SPEED BITMAPPING WITH MEMORY BUILT-IN SELF...
- Publication number 20140359383
- Publication date Dec 4, 2014
- Geovanny Rodriguez
- G11 - INFORMATION STORAGE
Information Patent Application
CONFIGURABLE MEMORY ARRAY
- Publication number 20140043924
- Publication date Feb 13, 2014
- QUALCOMM Incorporated
- Jung Pill Kim
- G11 - INFORMATION STORAGE
Information Patent Application
Performing Stuck-At Testing Using Multiple Isolation Circuits
- Publication number 20120314516
- Publication date Dec 13, 2012
- Brian J. Campbell
- G11 - INFORMATION STORAGE
Information Patent Application
Configurable Memory Array
- Publication number 20120218805
- Publication date Aug 30, 2012
- QUALCOMM Incorporated
- Jung Pill Kim
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS PERTAINING TO A FERRO-MAGNETIC RANDOM ACCESS M...
- Publication number 20120170350
- Publication date Jul 5, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Michael Patrick Clinton
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Memory Device
- Publication number 20100296357
- Publication date Nov 25, 2010
- Seung-Bong Kim
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090067271
- Publication date Mar 12, 2009
- NEC ELECTRONICS CORPORATION
- Yoichi YAMAGUCHI
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device, memory module having the same, the tes...
- Publication number 20070280013
- Publication date Dec 6, 2007
- Elpida Memory, Inc.
- Shinji Sakuragi
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit for semiconductor device
- Publication number 20070208966
- Publication date Sep 6, 2007
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Application
Acceleration of the programming of a memory module with the aid of...
- Publication number 20060041801
- Publication date Feb 23, 2006
- Karlheinz Krause
- G11 - INFORMATION STORAGE

Accessing single arrays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scan chain compression for testing memory of a system on a chip

Memory, memory system, operation method of the memory, and operatio...

Method and apparatus of integrating memory stacks

Apparatuses and methods for direct access hybrid testing

Memory, memory system, operation method of the memory, and operatio...

Circuit and associated chip

Cache array macro micro-masking

Apparatuses and methods to encode column plane compression data

Apparatuses and methods for direct access hybrid testing

Memory device providing bad column repair and method of operating same

Semiconductor device having a test circuit

Memory device and test method thereof

Monitoring a memory for retirement

Register array having groups of latches with single test latch test...

Repairable semiconductor memory device and test methods for the same

Methods for accessing a storage unit of a flash memory and apparatu...

Partial chip, and systems having the same

Variable read delay system

Address windowing for at-speed bitmapping with memory built-in self...

Method and apparatus pertaining to a ferroelectric random access me...

Non-volatile memory array configurable for high performance and hig...

Performing stuck-at testing using multiple isolation circuits

Method and system for accelerating memory randomization

Automatic scrambling of input/output data according to row addresse...

Semiconductor device

Semiconductor memory device, memory module having the same, the tes...

Test circuit for semiconductor device

Test circuit for semiconductor device

Acceleration of the programming of a memory module with the aid of...

Memory circuit scan arrangement

Patents Applicationslast 30 patents

DISTRIBUTED MRAM CONFIGURATION BIT AND METHOD OF REPAIR

MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...

Fully Scannable Memory Arrays

Method for Scanning a Memory Array

METHODS AND APPARATUS TO SELECT ADDRESSES FOR MEMORY TRAINING

Register Bank Architecture with Latches

METHOD AND APPARATUS OF INTEGRATING MEMORY STACKS

MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...

SCAN CHAIN COMPRESSION FOR TESTING MEMORY OF A SYSTEM ON A CHIP

CIRCUIT AND ASSOCIATED CHIP

MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...

APPARATUSES AND METHODS FOR DIRECT ACCESS HYBRID TESTING

CACHE ARRAY MACRO MICRO-MASKING

SEMICONDUCTOR DEVICE

REGISTER ARRAY HAVING GROUPS OF LATCHES WITH SINGLE TEST LATCH TEST...

MONITORING A MEMORY FOR RETIREMENT

MEMORY DEVICE AND TEST METHOD THEREOF

REPAIR DEVICE AND SEMICONDUCTOR DEVICE INCLUDING THE SAME

VARIABLE READ DELAY SYSTEM

METHODS FOR ACCESSING A STORAGE UNIT OF A FLASH MEMORY AND APPARATU...

ADDRESS WINDOWING FOR AT-SPEED BITMAPPING WITH MEMORY BUILT-IN SELF...

CONFIGURABLE MEMORY ARRAY

Performing Stuck-At Testing Using Multiple Isolation Circuits

Configurable Memory Array

METHOD AND APPARATUS PERTAINING TO A FERRO-MAGNETIC RANDOM ACCESS M...

Semiconductor Memory Device

SEMICONDUCTOR DEVICE

Semiconductor memory device, memory module having the same, the tes...

Test circuit for semiconductor device

Acceleration of the programming of a memory module with the aid of...