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G01B21/047

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B21/00Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups

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G01B21/047Accessories

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Patents Grantslast 30 patents

Information Patent Grant
Parametric and modal work-holding method for automated inspection
- Patent number 12,066,808
- Issue date Aug 20, 2024
- Hexagon Metrology, Inc.
- Jonathan J. O'Hare
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automated generation of a test plan to mea...
- Patent number 12,055,913
- Issue date Aug 6, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Ana Carolina Mayr Adam
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement machine for measuring a predominantly longitudi...
- Patent number 12,055,383
- Issue date Aug 6, 2024
- VIVI & C. S.P.A.
- Carlo Bedeschi
- G01 - MEASURING TESTING
Information Patent Grant
Optical positioning system determining positions based on last pass...
- Patent number 12,018,927
- Issue date Jun 25, 2024
- Keen-Hun Leong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring method and measuring system for measuring drilled holes,...
- Patent number 12,005,544
- Issue date Jun 11, 2024
- Kadia Produktion GmbH + Co.
- Roland Regler
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Feature location detection utilizing depth sensor
- Patent number 11,940,269
- Issue date Mar 26, 2024
- MLOptic Corp.
- Bailing Hou
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system
- Patent number 11,913,770
- Issue date Feb 27, 2024
- M&H Inprocess Messtechnik GmbH
- Christoph Wiest
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measurement system with auxiliary axis
- Patent number 11,853,028
- Issue date Dec 26, 2023
- Faro Technologies, Inc.
- Kishore Lankalapalli
- G05 - CONTROLLING REGULATING
Information Patent Grant
Scanning path segmentation of workpiece
- Patent number 11,774,226
- Issue date Oct 3, 2023
- Hexagon Metrology, Inc.
- Sean Taylor
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit correction method
- Patent number 11,761,759
- Issue date Sep 19, 2023
- Mitutoyo Corporation
- Kohju Kasahara
- G01 - MEASURING TESTING
Information Patent Grant
Generating efficient measurement protocol using segment grouping an...
- Patent number 11,754,383
- Issue date Sep 12, 2023
- Hexagon Metrology, Inc.
- Sean Taylor
- G01 - MEASURING TESTING
Information Patent Grant
Post-processing of measurement data collected with optical probe
- Patent number 11,740,063
- Issue date Aug 29, 2023
- Hexagon Metrology, Inc.
- Sean Taylor
- G01 - MEASURING TESTING
Information Patent Grant
Error determination apparatus, error determination method, and stor...
- Patent number 11,698,252
- Issue date Jul 11, 2023
- Mitutoyo Corporation
- Yuto Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Machine tool apparatus
- Patent number 11,674,789
- Issue date Jun 13, 2023
- Renishaw plc
- John Anthony Styles
- G01 - MEASURING TESTING
Information Patent Grant
Inspection support apparatus
- Patent number 11,657,496
- Issue date May 23, 2023
- Rolls-Royce North American Technologies, Inc.
- Ronald Knerr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Waist measuring belt
- Patent number 11,639,878
- Issue date May 2, 2023
- Ebay Inc.
- Jennifer Robertson
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Feeding device of hole inspection device
- Patent number 11,598,624
- Issue date Mar 7, 2023
- SUBARU CORPORATION
- Ryohei Ono
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical positioning system having high resolution
- Patent number 11,585,651
- Issue date Feb 21, 2023
- PixArt Imaging Inc.
- Keen-Hun Leong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection program editing environment including integrated alignme...
- Patent number 11,520,472
- Issue date Dec 6, 2022
- Mitutoyo Corporation
- Guenther Ade
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying a workpiece, determining a measurement seque...
- Patent number 11,493,899
- Issue date Nov 8, 2022
- Carl Zeiss Industrielle Messtechnik GmbH
- Matthias Riek
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and device for checking an electrical value of an electric m...
- Patent number 11,489,466
- Issue date Nov 1, 2022
- Carl Zeiss Industrielle Messtechnik GmbH
- Guenter Grupp
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measuring arm with multifunctional end
- Patent number 11,466,975
- Issue date Oct 11, 2022
- HEXAGON METROLOGY SAS
- Laurent Desforges
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement cycle generation
- Patent number 11,435,180
- Issue date Sep 6, 2022
- Renishaw plc
- Martin Peter Summers
- G01 - MEASURING TESTING
Information Patent Grant
Locationing device for a machining point on a workpiece
- Patent number 11,420,317
- Issue date Aug 23, 2022
- Rock Roots Oy
- Andreas Stenroth
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measurement probe apparatus and method
- Patent number 11,415,412
- Issue date Aug 16, 2022
- Renishaw plc
- Jamie John Buckingham
- G01 - MEASURING TESTING
Information Patent Grant
Rotary table for a coordinate measuring apparatus
- Patent number 11,391,566
- Issue date Jul 19, 2022
- Carl Zeiss Industrielle Messtechnik GmbH
- Rainer Sagemueller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for a mobile dimensioning device to use a dynamic accuracy c...
- Patent number 11,353,319
- Issue date Jun 7, 2022
- Hand Held Products, Inc.
- Franck Laffargue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated inspection process for batch production
- Patent number 11,347,368
- Issue date May 31, 2022
- Hexagon Metrology, Inc.
- Jonathan J. O'Hare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of making a component with an integral strain indicator
- Patent number 11,313,673
- Issue date Apr 26, 2022
- General Electric Company
- Gregory Lee Hovis
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
3-D measurement of features, including cut-outs and/or grooves
- Patent number 11,307,022
- Issue date Apr 19, 2022
- Siemens Energy Global GmbH & Co. KG
- Martin Kördel
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES

Patents Applicationslast 30 patents

Information Patent Application
OPERATION OF A COORDINATE MEASURING MACHINE WITH A PERSON-GUIDED SE...
- Publication number 20240418500
- Publication date Dec 19, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Benjamin Weber
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING MACHINE
- Publication number 20240401925
- Publication date Dec 5, 2024
- HEXAGON TECHNOLOGY CENTER GMBH
- Danick BRÜHLMANN
- G01 - MEASURING TESTING
Information Patent Application
Parametric and Modal Work-holding Method for Automated Inspection
- Publication number 20240385583
- Publication date Nov 21, 2024
- Hexagon Metrology, Inc.
- Jonathan J. O'Hare
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Automated Generation of a Test Plan to Mea...
- Publication number 20240361743
- Publication date Oct 31, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Ana Carolina MAYR ADAM
- G01 - MEASURING TESTING
Information Patent Application
USE OF A MEASURING UNIT FOR MEASURING DISTANCES IN A SHAFT ALIGNMEN...
- Publication number 20240344821
- Publication date Oct 17, 2024
- Aktiebolaget SKF
- Sylvain Georges Henri HUMBERT
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING LOCATIONAL POINTS ON AN ENAMELLED SURFACE, I...
- Publication number 20240337484
- Publication date Oct 10, 2024
- THALETEC GmbH
- Jurgen Reinemuth
- G01 - MEASURING TESTING
Information Patent Application
ARTICULATED MEMBER
- Publication number 20240230325
- Publication date Jul 11, 2024
- RENISHAW PLC
- Andrew Geoffrey BUTTER
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS
- Publication number 20240159508
- Publication date May 16, 2024
- RENISHAW PLC
- Andrew Geoffrey BUTTER
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROBE
- Publication number 20240142229
- Publication date May 2, 2024
- RENISHAW PLC
- Jamie John BUCKINGHAM
- G01 - MEASURING TESTING
Information Patent Application
ARTICULATED MEMBER
- Publication number 20240133685
- Publication date Apr 25, 2024
- RENISHAW PLC
- Andrew Geoffrey BUTTER
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS
- Publication number 20240061393
- Publication date Feb 22, 2024
- FARO TECHNOLOGIES, INC.
- Kishore Lankalapalli
- G05 - CONTROLLING REGULATING
Information Patent Application
AUTOMATIC MEASURING DEVICE AND CONTROL METHOD OF THE SAME
- Publication number 20240035816
- Publication date Feb 1, 2024
- MITUTOYO CORPORATION
- Keita OGAWA
- G01 - MEASURING TESTING
Information Patent Application
FAULT PROCESSING METHOD, APPARATUS AND SYSTEM FOR DISPLACEMENT SENS...
- Publication number 20230288197
- Publication date Sep 14, 2023
- GREE ELECTRIC APPLIANCES, INC. OF ZHUHAI
- Yusheng HU
- G01 - MEASURING TESTING
Information Patent Application
Parametric and Modal Work-holding Method for Automated Inspection
- Publication number 20230161317
- Publication date May 25, 2023
- Hexagon Metrology, Inc.
- Jonathan J. O'Hare
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POSITIONING SYSTEM DETERMINING POSITIONS BEASED ON LAST PAS...
- Publication number 20230152085
- Publication date May 18, 2023
- PIXART IMAGING INC.
- Keen-Hun LEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL-MEASURING-APPARATUS INSPECTION GAUGES, THREE-DIME...
- Publication number 20230136366
- Publication date May 4, 2023
- MITUTOYO CORPORATION
- Yuto INOUE
- G01 - MEASURING TESTING
Information Patent Application
PROBE UNIT CORRECTION METHOD
- Publication number 20220390227
- Publication date Dec 8, 2022
- Mitutoyo Corporation
- Kohju KASAHARA
- G01 - MEASURING TESTING
Information Patent Application
POST-PROCESSING OF MEASUREMENT DATA COLLECTED WITH OPTICAL PROBE
- Publication number 20220381552
- Publication date Dec 1, 2022
- Hexagon Metrology, Inc.
- Sean Taylor
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC GENERATION OF OBJECT INSPECTIONS
- Publication number 20220381555
- Publication date Dec 1, 2022
- Bell Textron Inc.
- Chesley KRANIAK
- G01 - MEASURING TESTING
Information Patent Application
Scanning Path Segmentation of Workpiece
- Publication number 20220381559
- Publication date Dec 1, 2022
- Hexagon Metrology, Inc.
- Sean Taylor
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AND CONTROLLER
- Publication number 20220364338
- Publication date Nov 17, 2022
- MOBA Mobile Automation AG
- Alfons HORN
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Application
TEST INDICATOR
- Publication number 20220341733
- Publication date Oct 27, 2022
- Mitutoyo Corporation
- Tatsushi TERAUTCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A METHOD AND APPARATUS FOR TREATMENT OF DRUG RESISTANT HYPERTENSION...
- Publication number 20220282962
- Publication date Sep 8, 2022
- Michael Burnam
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM
- Publication number 20220170733
- Publication date Jun 2, 2022
- M & H Inprocess Messtechnik GmbH
- Christoph WIEST
- G01 - MEASURING TESTING
Information Patent Application
ARTICULATED ARM COORDINATE MEASURING MACHINE
- Publication number 20220143812
- Publication date May 12, 2022
- FARO TECHNOLOGIES, INC.
- John Lucas Creachbaum
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
ERROR DETERMINATION APPARATUS, ERROR DETERMINATION METHOD, AND STOR...
- Publication number 20220107177
- Publication date Apr 7, 2022
- MITUTOYO CORPORATION
- Yuto Inoue
- G01 - MEASURING TESTING
Information Patent Application
MACHINE TOOL APPARATUS
- Publication number 20220074727
- Publication date Mar 10, 2022
- RENISHAW PLC
- John Anthony STYLES
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POSITIONING SYSTEM HAVING HIGH RESOLUTION
- Publication number 20210348916
- Publication date Nov 11, 2021
- PIXART IMAGING INC.
- Keen-Hun LEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MEASUREMENT CYCLE GENERATION
- Publication number 20210285762
- Publication date Sep 16, 2021
- RENISHAW PLC
- Martin Peter SUMMERS
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION MASTER
- Publication number 20210223020
- Publication date Jul 22, 2021
- ASANUMA GIKEN CO., LTD.
- Susumu ASANUMA
- G01 - MEASURING TESTING

Accessories

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Parametric and modal work-holding method for automated inspection

Method and apparatus for automated generation of a test plan to mea...

Optical measurement machine for measuring a predominantly longitudi...

Optical positioning system determining positions based on last pass...

Measuring method and measuring system for measuring drilled holes,...

Feature location detection utilizing depth sensor

Measuring system

Coordinate measurement system with auxiliary axis

Scanning path segmentation of workpiece

Probe unit correction method

Generating efficient measurement protocol using segment grouping an...

Post-processing of measurement data collected with optical probe

Error determination apparatus, error determination method, and stor...

Machine tool apparatus

Inspection support apparatus

Waist measuring belt

Feeding device of hole inspection device

Optical positioning system having high resolution

Inspection program editing environment including integrated alignme...

Method for identifying a workpiece, determining a measurement seque...

Method and device for checking an electrical value of an electric m...

Measuring arm with multifunctional end

Method and apparatus for measurement cycle generation

Locationing device for a machining point on a workpiece

Measurement probe apparatus and method

Rotary table for a coordinate measuring apparatus

Method for a mobile dimensioning device to use a dynamic accuracy c...

Automated inspection process for batch production

Methods of making a component with an integral strain indicator

3-D measurement of features, including cut-outs and/or grooves

Patents Applicationslast 30 patents

OPERATION OF A COORDINATE MEASURING MACHINE WITH A PERSON-GUIDED SE...

COORDINATE MEASURING MACHINE

Parametric and Modal Work-holding Method for Automated Inspection

Method and Apparatus for Automated Generation of a Test Plan to Mea...

USE OF A MEASURING UNIT FOR MEASURING DISTANCES IN A SHAFT ALIGNMEN...

METHOD FOR DETERMINING LOCATIONAL POINTS ON AN ENAMELLED SURFACE, I...

ARTICULATED MEMBER

METROLOGY APPARATUS

MEASUREMENT PROBE

ARTICULATED MEMBER

COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS

AUTOMATIC MEASURING DEVICE AND CONTROL METHOD OF THE SAME

FAULT PROCESSING METHOD, APPARATUS AND SYSTEM FOR DISPLACEMENT SENS...

Parametric and Modal Work-holding Method for Automated Inspection

OPTICAL POSITIONING SYSTEM DETERMINING POSITIONS BEASED ON LAST PAS...

THREE-DIMENSIONAL-MEASURING-APPARATUS INSPECTION GAUGES, THREE-DIME...

PROBE UNIT CORRECTION METHOD

POST-PROCESSING OF MEASUREMENT DATA COLLECTED WITH OPTICAL PROBE

AUTOMATIC GENERATION OF OBJECT INSPECTIONS

Scanning Path Segmentation of Workpiece

MEASURING SYSTEM AND CONTROLLER

TEST INDICATOR

A METHOD AND APPARATUS FOR TREATMENT OF DRUG RESISTANT HYPERTENSION...

MEASURING SYSTEM

ARTICULATED ARM COORDINATE MEASURING MACHINE

ERROR DETERMINATION APPARATUS, ERROR DETERMINATION METHOD, AND STOR...

MACHINE TOOL APPARATUS

OPTICAL POSITIONING SYSTEM HAVING HIGH RESOLUTION

METHOD AND APPARATUS FOR MEASUREMENT CYCLE GENERATION

INSPECTION MASTER