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MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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Industry
CPC
G01B
Parent Industries
G
PHYSICS
G01
Measuring instruments
Current Industry
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Sub Industries
G01B1/00
Measuring instruments characterised by the selection of material therefor
G01B11/00
Measuring arrangements characterised by the use of optical means
G01B13/00
Measuring arrangements characterised by the use of fluids
G01B15/00
Measuring arrangements characterised by the use of wave or particle radiation
G01B17/00
Measuring arrangements characterised by the use of subsonic, sonic or ultrasonic vibrations
G01B21/00
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups
G01B2210/00
Aspects not specifically covered by any group under G01B
G01B2290/00
Aspects of interferometers not specifically covered by any group under G01B9/02
G01B3/00
Instruments as specified in the subgroups and characterised by the use of mechanical measuring means
G01B5/00
Measuring arrangements characterised by the use of mechanical means
G01B7/00
Measuring arrangements characterised by the use of electric or magnetic means
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
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last 30 patents
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Patent Grant
Method of processing optical coherence tomography (OCT) data, metho...
Patent number
12,226,160
Issue date
Feb 18, 2025
Topcon Corporation
Yasufumi Fukuma
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Ultra-precision timing clock method
Patent number
12,226,246
Issue date
Feb 18, 2025
Weng-Dah Ken
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Phase adjustment method, correction value calculation device, motor...
Patent number
12,227,232
Issue date
Feb 18, 2025
NSK Ltd.
Yusuke Nishioka
B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information
Patent Grant
Device and method for measuring tools
Patent number
12,226,868
Issue date
Feb 18, 2025
Dr. Johannes Heidenhain GmbH
Michael Butzhammer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Information processing apparatus, information processing method and...
Patent number
12,228,390
Issue date
Feb 18, 2025
Tokyo Electron Limited
Masahide Tadokoro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for measuring surface characteristics in optically distortin...
Patent number
12,228,392
Issue date
Feb 18, 2025
Electric Power Research Institute, Inc.
David Stoutamire
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Substrate position calibration for substrate supports in substrate...
Patent number
12,228,395
Issue date
Feb 18, 2025
Applied Materials, Inc.
Tomoharu Matsushita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Position sensor, designed in particular for detecting torsion in a...
Patent number
12,228,468
Issue date
Feb 18, 2025
Moving Magnet Technologies
Didier Frachon
B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information
Patent Grant
Systems and methods for volumetric sizing
Patent number
12,228,388
Issue date
Feb 18, 2025
Packsize, LLC
Francesco Peruch
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Clamp-on pressure and flow metering system
Patent number
12,228,396
Issue date
Feb 18, 2025
Saudi Arabian Oil Company
Sakethraman Mahalingam
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Sensor-enabled system and method for monitoring the health, conditi...
Patent number
12,228,397
Issue date
Feb 18, 2025
Tensar International Corporation
Joseph Cavanaugh
B61 - RAILWAYS
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Patent Grant
Non-contacting angular motion measuring device
Patent number
12,228,398
Issue date
Feb 18, 2025
The Aerospace Corporation
Kenneth D. Price
G01 - MEASURING TESTING
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Patent Grant
Polarizing Fizeau interferometer
Patent number
12,228,400
Issue date
Feb 18, 2025
Mitutoyo Corporation
Shimpei Matsuura
G01 - MEASURING TESTING
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Patent Grant
Identification apparatus
Patent number
12,228,517
Issue date
Feb 18, 2025
Canon Kabushiki Kaisha
Yuki Yonetani
G01 - MEASURING TESTING
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Patent Grant
Vehicle sensor calibration target alignment system
Patent number
12,227,150
Issue date
Feb 18, 2025
Richard L. Jackson
B60 - VEHICLES IN GENERAL
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Patent Grant
Estimation of source-detector separation in an optical measurement...
Patent number
12,226,187
Issue date
Feb 18, 2025
HI LLC
Ryan Field
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Grant
Tape measure with compact retraction system
Patent number
12,228,393
Issue date
Feb 18, 2025
Milwaukee Electric Tool Corporation
Collin J. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Tire tread depth estimation system and method
Patent number
12,228,473
Issue date
Feb 18, 2025
Nissan North America, Inc.
Vikram Krishnamurthy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for facilitating placement of labware components
Patent number
12,231,820
Issue date
Feb 18, 2025
Revvity Health Sciences, Inc.
Stephen Allen
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Resolver-to-digital converter circuit, resolver signal processing a...
Patent number
12,228,429
Issue date
Feb 18, 2025
Mabuchi Motor Co., Ltd.
Kohei Hamazaki
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring thin film deposition
Patent number
12,227,846
Issue date
Feb 18, 2025
Inficon, Inc.
Mohamed Buhary Rinzan
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Underwater organism imaging aid system, underwater organism imaging...
Patent number
12,228,389
Issue date
Feb 18, 2025
NEC Corporation
Jun Kobayashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for measuring a filter cake thickness
Patent number
12,228,391
Issue date
Feb 18, 2025
BHS-Sonthofen GmbH
Martin Schäfer
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Measurement device
Patent number
12,228,394
Issue date
Feb 18, 2025
Christopher R. Fisher
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Heterodyne light source for use in metrology system
Patent number
12,228,399
Issue date
Feb 18, 2025
Mitutoyo Corporation
Nick Hartmann
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor, magnetic encoder, lens position detection device,...
Patent number
12,228,623
Issue date
Feb 18, 2025
TDK Corporation
Tsuyoshi Umehara
G01 - MEASURING TESTING
Information
Patent Grant
Pre-charge modulation of a laser array for 3D imaging applications
Patent number
12,230,939
Issue date
Feb 18, 2025
II-VI DELAWARE, INC.
Steve Troyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light-transmittance device and use method
Patent number
12,222,200
Issue date
Feb 11, 2025
ZHONGJIAN WUZHOU ENGINEERING EQUIPMENT CO., LTD
Huaijun Ji
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Systems, methods, and media for multiple beam optical coherence tom...
Patent number
12,222,202
Issue date
Feb 11, 2025
The General Hospital Corporation
Benjamin Vakoc
G01 - MEASURING TESTING
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Patent Grant
Touchless wrist measurement
Patent number
12,223,669
Issue date
Feb 11, 2025
Apple Inc.
Aditya Sankar
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Carpenter Tools
Publication number
20250058580
Publication date
Feb 20, 2025
Daniel Wayne McGee
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Shape Estimation of Structures Undergoing Dynamic Stress
Publication number
20250060207
Publication date
Feb 20, 2025
Massachusetts Institute of Technology
Tairan Wang
G01 - MEASURING TESTING
Information
Patent Application
GENERATING AN ALIGNMENT SIGNAL WITHOUT DEDICATED ALIGNMENT STRUCTURES
Publication number
20250060680
Publication date
Feb 20, 2025
ASML NETHERLANDS B.V.
Aabid PATEL
G01 - MEASURING TESTING
Information
Patent Application
LED LIGHT SOURCE FOR MEDICAL OPTICAL COHERENCE TOMOGRAPHY WITH HIGH...
Publication number
20250063864
Publication date
Feb 20, 2025
Lumileds LLC
Peter Josef Schmidt
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Application
MARKING TOOL
Publication number
20250058456
Publication date
Feb 20, 2025
Wolfcraft GmbH
Christopher MOOG
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
DEVICES AND METHODS FOR MEASURING MUSICAL INSTRUMENT STRINGS
Publication number
20250060205
Publication date
Feb 20, 2025
GOTCHOPS MUSIC INC
Shawn P. FERGUSON
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Application
SYSTEM AND METHOD TO DETECT, ENUMERATE AND CHARACTERIZE CIRCULATING...
Publication number
20250060214
Publication date
Feb 20, 2025
THE TEXAS A&M UNIVERSITY SYSTEM
Jian Sheng
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Swivel Angle Measuring Device on a Hydrostatic Axial Piston Machine...
Publication number
20250059963
Publication date
Feb 20, 2025
ROBERT BOSCH GmbH
Bernd Huehn
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Application
ANALYZING SYSTEM FOR IDENTIFYING AND MEASURING SOLAR PANEL MODULE
Publication number
20250061598
Publication date
Feb 20, 2025
NATIONAL UNIVERSITY OF TAINAN
Yao-Hsien FU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR MEASURING CARRIER-ENVELOPE PHASE, STABILIZED LIGHT SOURC...
Publication number
20250062588
Publication date
Feb 20, 2025
TOHOKU UNIVERSITY
Yohei KAWAKAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EPOXY MOLDING COMPOUND THICKNESS MEASUREMENT METHOD AND MEASUREMENT...
Publication number
20250060212
Publication date
Feb 20, 2025
ACTRO CO., LTD
Seong Hoon OH
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASUREMENT SYSTEM AND SHAPE MEASUREMENT METHOD
Publication number
20250060213
Publication date
Feb 20, 2025
Nippon Telegraph and Telephone Corporation
Nobutomo HANZAWA
G01 - MEASURING TESTING
Information
Patent Application
Apparatus For Recognizing Object And Method Thereof
Publication number
20250061683
Publication date
Feb 20, 2025
Hyundai Motor Company
Mi Rim Noh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Pattern Measurement Device and Pattern Measurement Method
Publication number
20250060678
Publication date
Feb 20, 2025
HITACHI HIGH-TECH CORPORATION
Takuma Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR COMPENSATING ANGULAR ERRORS
Publication number
20250060209
Publication date
Feb 20, 2025
TDK - Micronas GmbH
Joerg FRANKE
G01 - MEASURING TESTING
Information
Patent Application
ROTARY POSITION SENSOR
Publication number
20250060229
Publication date
Feb 20, 2025
ALPS ALPINE CO., LTD.
Hidekazu KATO
G01 - MEASURING TESTING
Information
Patent Application
BENT TUBE MEASUREMENT USING A VIRTUAL SHARP
Publication number
20250060204
Publication date
Feb 20, 2025
ULTRA CLEAN HOLDINGS, INC
Jeffrey NELSON
G01 - MEASURING TESTING
Information
Patent Application
FEEDBACK INSPECTION SYSTEMS AND METHODS
Publication number
20250060206
Publication date
Feb 20, 2025
RTX Corporation
Tracy A. Propheter-Hinckley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONDUCTIVE STRUCTURES AND FLEXIBLE SENSORS HAVING THE SAME
Publication number
20250060208
Publication date
Feb 20, 2025
SHENZHEN SHOKZ CO., LTD.
Yujia HUANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR COMPENSATING FOR ANGULAR ERRORS
Publication number
20250060210
Publication date
Feb 20, 2025
TDK - Micronas GmbH
Joerg FRANKE
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT ESTIMATION APPARATUS, DISPLACEMENT ESTIMATION METHOD,...
Publication number
20250060211
Publication date
Feb 20, 2025
NEC Corporation
Sakiko Mishima
G01 - MEASURING TESTING
Information
Patent Application
Magnetism Alignment Apparatus for Negative Electrodes and Method fo...
Publication number
20250062058
Publication date
Feb 20, 2025
LG ENERGY SOLUTION, LTD.
Jong Su Yoon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DYNAMIC AUTOFOCUS METHOD AND SYSTEM FOR ASSAY IMAGER
Publication number
20250052999
Publication date
Feb 13, 2025
Illumina, Inc.
Darren Robert Segale
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Connector Fixture and Connector Detection System
Publication number
20250052365
Publication date
Feb 13, 2025
Tyco Electronics (Shanghai) Co., Ltd.
Lijiong Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FLEXIBLE FORCE MEASURING TACTILE SENSOR SYSTEM
Publication number
20250052624
Publication date
Feb 13, 2025
HACETTEPE UNIVERSITESI REKTORLUK
Dincer GOKCEN
B82 - NANO-TECHNOLOGY
Information
Patent Application
IMAGE SENSING DEVICE USING A SINGLE ANALOG TO DIGITAL CONVERSION OP...
Publication number
20250055968
Publication date
Feb 13, 2025
SK HYNIX INC.
Jeong Eun SONG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Methods for Detecting Vehicle Following Distance
Publication number
20250054169
Publication date
Feb 13, 2025
Geotab Inc
Joy Mazumder
B60 - VEHICLES IN GENERAL
Information
Patent Application
ORTHO-IMAGE CREATION SYSTEM, ORTHO-IMAGE CREATION METHOD, SURVEY MA...
Publication number
20250054173
Publication date
Feb 13, 2025
MR Support Inc.
Shigeo Kusaki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Fish Tape Measurement Device
Publication number
20250052555
Publication date
Feb 13, 2025
Bunthy Kong
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
DISPLACEMENT MEASURING APPARATUS
Publication number
20250052558
Publication date
Feb 13, 2025
MITUTOYO CORPORATION
Keita OGAWA
G01 - MEASURING TESTING