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MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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Industry
CPC
G01B
Parent Industries
G
PHYSICS
G01
Measuring instruments
Current Industry
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Sub Industries
G01B1/00
Measuring instruments characterised by the selection of material therefor
G01B11/00
Measuring arrangements characterised by the use of optical means
G01B13/00
Measuring arrangements characterised by the use of fluids
G01B15/00
Measuring arrangements characterised by the use of wave or particle radiation
G01B17/00
Measuring arrangements characterised by the use of subsonic, sonic or ultrasonic vibrations
G01B21/00
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups
G01B2210/00
Aspects not specifically covered by any group under G01B
G01B2290/00
Aspects of interferometers not specifically covered by any group under G01B9/02
G01B3/00
Instruments as specified in the subgroups and characterised by the use of mechanical measuring means
G01B5/00
Measuring arrangements characterised by the use of mechanical means
G01B7/00
Measuring arrangements characterised by the use of electric or magnetic means
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
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Patents Grants
last 30 patents
Information
Patent Grant
Display apparatus
Patent number
12,205,529
Issue date
Jan 21, 2025
Samsung Display Co., Ltd.
Juyeop Seong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for determining optical probe location relative to a photoni...
Patent number
12,203,739
Issue date
Jan 21, 2025
Keysight Technologies, Inc.
Christopher Coleman
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for inspection of a geometry, the device comprisi...
Patent number
12,203,743
Issue date
Jan 21, 2025
Winteria AB
Martin Engman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Rotary encoder
Patent number
12,203,746
Issue date
Jan 21, 2025
Harmonic Drive Systems Inc.
Shintaro Ueno
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Apparatus for controlling the printing on cable
Patent number
12,204,963
Issue date
Jan 21, 2025
Encore Wire Corporation
William T. Bigbee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
In-wheel motor with motor position sensor and brake system
Patent number
12,206,319
Issue date
Jan 21, 2025
HL MANDO CORPORATION
Mohammad Islam
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Device and method for the additive manufacture of a workpiece
Patent number
12,202,205
Issue date
Jan 21, 2025
Intom GmbH
Martin Simon
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Method for contactless power transmission between a stationary part...
Patent number
12,206,263
Issue date
Jan 21, 2025
Marposs Societa' per Azioni
Davide Castaldini
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Compact snapshot dual-mode interferometric system
Patent number
12,203,752
Issue date
Jan 21, 2025
Arizona Board of Regents on behalf of the University of Arizona
Rongguang Liang
G01 - MEASURING TESTING
Information
Patent Grant
Metrology system configured to illuminate and measure apertures of...
Patent number
12,204,226
Issue date
Jan 21, 2025
Mitutoyo Corporation
Paul Gerard Gladnick
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Localization of optical coupling points
Patent number
12,204,154
Issue date
Jan 21, 2025
Karlsruher Institut für Technologie
Matthias Blaicher
G01 - MEASURING TESTING
Information
Patent Grant
Detection device, detection system, detection method, and storage m...
Patent number
12,203,744
Issue date
Jan 21, 2025
Nikon Corporation
Yoshihiro Nakagawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Rotation angle detection device and rotation angle detection method
Patent number
12,203,750
Issue date
Jan 21, 2025
Alps Alpine Co., Ltd.
Ikuyasu Miyako
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for an adjustable beam directing optical system
Patent number
12,203,751
Issue date
Jan 21, 2025
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Brett F. Bathel
G01 - MEASURING TESTING
Information
Patent Grant
Log and cant optimization
Patent number
12,202,166
Issue date
Jan 21, 2025
USNR, LLC
Douglas G. Strasky
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Photonic quantum networking for large superconducting qubit modules
Patent number
12,204,997
Issue date
Jan 21, 2025
Rigetti & Co, LLC
Matthew J. Reagor
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for haptic navigation
Patent number
12,203,770
Issue date
Jan 21, 2025
WearWorks, Inc
Kevin Yoo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Heterogeneous magnetic and inductive sensors
Patent number
12,203,822
Issue date
Jan 21, 2025
ALLEGRO MICROSYSTEMS, LLC
Emanuele Andrea Casu
G01 - MEASURING TESTING
Information
Patent Grant
Optical imaging system and method based on random light field spati...
Patent number
12,203,845
Issue date
Jan 21, 2025
Soochow University
Yahong Chen
G01 - MEASURING TESTING
Information
Patent Grant
THz measuring and THz measuring device for measuring a corrugated pipe
Patent number
12,203,740
Issue date
Jan 21, 2025
CiTEX Holding GmbH
Jan Hendrik Petermann
G01 - MEASURING TESTING
Information
Patent Grant
System and method for digital-representation-based flight path plan...
Patent number
12,203,742
Issue date
Jan 21, 2025
PHOTOGAUGE, INC.
Sankara J. Subramanian
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Metrology for additive manufacturing
Patent number
12,203,745
Issue date
Jan 21, 2025
Nikon Corporation
Eric Peter Goodwin
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Interference in-sensitive Littrow system for optical device structu...
Patent number
12,203,747
Issue date
Jan 21, 2025
Applied Materials, Inc.
Yangyang Sun
G01 - MEASURING TESTING
Information
Patent Grant
Chain elongation monitoring device and method for determining wear
Patent number
12,203,749
Issue date
Jan 21, 2025
Thomas Wolf
G01 - MEASURING TESTING
Information
Patent Grant
Laser scanner
Patent number
12,204,031
Issue date
Jan 21, 2025
Leica Geosystems AG
Simon Mark
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
OCT device
Patent number
12,201,358
Issue date
Jan 21, 2025
Nidek Co., Ltd.
Taisei Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Bone and tool tracking in robotized computer-assisted surgery
Patent number
12,201,383
Issue date
Jan 21, 2025
ORTHOSOFT ULC
Louis-Philippe Amiot
G01 - MEASURING TESTING
Information
Patent Grant
System and method for efficient material measurement and conversion
Patent number
12,202,063
Issue date
Jan 21, 2025
Joel Wille
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and device for superresolution optical measurement using sin...
Patent number
12,203,741
Issue date
Jan 21, 2025
BioAxial SAS
Gabriel Y. Sirat
G01 - MEASURING TESTING
Information
Patent Grant
Tape reel post
Patent number
12,203,748
Issue date
Jan 21, 2025
STANLEY BLACK & DECKER, INC.
Yi-Chan Shih
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Identification of Facial Expression of Head-Mountable Display Wearer
Publication number
20250022312
Publication date
Jan 16, 2025
Hewlett-Packard Development Company, L.P.
Paul Howard Mazurkiewicz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING DEVICE AND FORMING MACHINE
Publication number
20250020448
Publication date
Jan 16, 2025
ASAHI-SEIKI MANUFACTURING CO., LTD.
Yasuo NAKAZAKI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING THE THICKNESS OF ONE OR MORE LAY...
Publication number
20250020449
Publication date
Jan 16, 2025
SYNCRO S.R.L.
Marco BRANCA
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS FOR MEASURING HEIGHT OF FOREIGN SUBSTANCE IN PIPE
Publication number
20250020456
Publication date
Jan 16, 2025
Seoul National University R&DB Foundation
Chunguang Piao
G01 - MEASURING TESTING
Information
Patent Application
SAFETY APPARATUS FOR ONE DEGREE OF FREEDOM ELECTRODYNAMIC SHAKER
Publication number
20250020536
Publication date
Jan 16, 2025
Sentek Dynamics Inc.
James Q. Zhuge
G01 - MEASURING TESTING
Information
Patent Application
DRIVE SYSTEM, TURBO COMPRESSOR, AND REFRIGERATION DEVICE
Publication number
20250020379
Publication date
Jan 16, 2025
DAIKIN INDUSTRIES, LTD.
Shota KURODA
G01 - MEASURING TESTING
Information
Patent Application
TAPE MEASURE ASSEMBLY
Publication number
20250020442
Publication date
Jan 16, 2025
Diversified Innovations, LLC
Eddie Alexander Meeks
G01 - MEASURING TESTING
Information
Patent Application
SENSING DEVICE
Publication number
20250020444
Publication date
Jan 16, 2025
LG Innotek Co., Ltd.
Jong Yeop YANG
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT MEASUREMENT APPARATUS, NON-CONTACT INPUT APPARATUS, AN...
Publication number
20250020452
Publication date
Jan 16, 2025
Suguru SANGU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STATE DETERMINATION DEVICE, CONDITION DETERMINATION METHOD, AND REC...
Publication number
20250020458
Publication date
Jan 16, 2025
NEC CORPORATION
Chisato Sugawara
G01 - MEASURING TESTING
Information
Patent Application
SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY
Publication number
20250020450
Publication date
Jan 16, 2025
Cargill, Incorporated
Amina ALAOUI
G01 - MEASURING TESTING
Information
Patent Application
Shape-Sensing Systems with Filters and Methods Thereof
Publication number
20250020453
Publication date
Jan 16, 2025
Bard Access Systems, Inc.
Chase Thompson
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MEASURING THIN FILM THICKNESS AND METHOD THEREOF
Publication number
20250020457
Publication date
Jan 16, 2025
Seoul National University R&DB Foundation
Jeseung Lee
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING METHOD OF CUTTING THROUGH WORKPIECE AND PROCESSING SYSTEM
Publication number
20250018604
Publication date
Jan 16, 2025
TCL ZHONGHUAN RENEWABLE ENERGY TECHNOLOGY CO., LTD.
Haoming ZHANG
B28 - WORKING CEMENT, CLAY, OR STONE
Information
Patent Application
OPTICAL COHERENCE TOMOGRAPHY APPARATUS, OPTICAL COHERENCE TOMOGRAPH...
Publication number
20250020447
Publication date
Jan 16, 2025
DAIKIN INDUSTRIES, LTD.
Masao NOUMI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR CONTINUOUSLY MEASURING THICKNESS OF THIN MATERIAL, ME...
Publication number
20250020451
Publication date
Jan 16, 2025
KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE
In Sung PARK
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CREATING A CUSTOM PROTECTIVE EQUIPMENT ITEM
Publication number
20250020454
Publication date
Jan 16, 2025
Steven King
G01 - MEASURING TESTING
Information
Patent Application
AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
Publication number
20250020627
Publication date
Jan 16, 2025
HUSQVARNA AB
Andreas Jonsson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SIGNAL GENERATION DEVICE AND ELEVATOR
Publication number
20250020443
Publication date
Jan 16, 2025
NIDEC CORPORATION
Shuhei MURASE
G01 - MEASURING TESTING
Information
Patent Application
WAFER INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER USING SAME
Publication number
20250020445
Publication date
Jan 16, 2025
Korea Research Institute of Standards and Science
Chan Yong HWANG
G01 - MEASURING TESTING
Information
Patent Application
LASER ARCHITECTURE FOR COMPONENT EFFICIENT ATOMIC INTERFEROMETER GR...
Publication number
20250020446
Publication date
Jan 16, 2025
AOSense, Inc.
Miroslav Y. Shverdin
G01 - MEASURING TESTING
Information
Patent Application
DEPTH SENSOR DEVICE AND METHOD FOR OPERATING A DEPTH SENSOR DEVICE
Publication number
20250020455
Publication date
Jan 16, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Marc OSSWALD
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CURVE INDUCTIVE SENSOR
Publication number
20250012555
Publication date
Jan 9, 2025
Magnisity Ltd.
Ron BARAK
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM
Publication number
20250012907
Publication date
Jan 9, 2025
ams-OSRAM lnternational GmbH
Farhang GHASEMI AFSHAR
G01 - MEASURING TESTING
Information
Patent Application
DEPTH IMAGING DEVICE, PACKAGE, MODULE, AND DEPTH IMAGING SYSTEM
Publication number
20250012925
Publication date
Jan 9, 2025
NUVOTON TECHNOLOGY CORPORATION JAPAN
Hideki KAWAMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENVIRONMENTAL SENSOR CIRCUIT HAVING A CAPACITIVE PROXIMITY SENSOR A...
Publication number
20250015802
Publication date
Jan 9, 2025
SEMTECH CORPORATION
Chaouki Rouaissia
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SAMPLE THICKNESS METROLOGY USING FOCUSED BEAM INTERFERENCE
Publication number
20250012560
Publication date
Jan 9, 2025
Applied Materials, Inc.
Venkatakaushik Voleti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Optical Displacement Sensor
Publication number
20250012561
Publication date
Jan 9, 2025
SensiBel AS
Håkon Sagberg
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD FOR OPTICALLY MEASURING TECHNICAL SURFACES, AND DEVICE FOR C...
Publication number
20250012564
Publication date
Jan 9, 2025
Breitmeier Messtechnik GmbH
Mark Alexander WEBER
G01 - MEASURING TESTING
Information
Patent Application
Measuring And Marking Assembly
Publication number
20250012554
Publication date
Jan 9, 2025
James Taylor
G01 - MEASURING TESTING