Acousto-optical scan

Industry

CPC
G01N2201/106

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/106Acousto-optical scan

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of scanning an optical beam using an acousto-optic deflector...
- Patent number 11,927,873
- Issue date Mar 12, 2024
- Femtonics Kft.
- Gergely Katona
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for multispectral optoacoustic imaging
- Patent number 10,588,516
- Issue date Mar 17, 2020
- Helmholtz Zentrum Muenchen Deutsches Forschungszentrum fuer Gesundheit und Um...
- Stratis Tzoumas
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Photoacoustic measurement device and puncture needle
- Patent number 10,568,603
- Issue date Feb 25, 2020
- FUJIFILM Corporation
- Kaku Irisawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
High resolution photoacoustic imaging in scattering media using str...
- Patent number 10,551,357
- Issue date Feb 4, 2020
- The Regents of the University of Colorado, a Body Corporate
- Todd W. Murray
- G01 - MEASURING TESTING
Information Patent Grant
Photoacoustic apparatus and method of operating the same
- Patent number 9,939,368
- Issue date Apr 10, 2018
- SAMSUNG MEDISON CO., LTD.
- Jong-kyu Jung
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for oblique incidence scanning with 2D array of s...
- Patent number 9,891,175
- Issue date Feb 13, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Systems and methods for run-time alignment of a spot scanning wafer...
- Patent number 9,864,173
- Issue date Jan 9, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
System and method of two-stepped laser scattering defect inspection
- Patent number 8,339,593
- Issue date Dec 25, 2012
- Sumco Corporation
- Eiji Kamiyama
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting an object using an acousto-optic d...
- Patent number 7,528,940
- Issue date May 5, 2009
- Applied Materials, Israel, Ltd.
- Alexander Veis
- G01 - MEASURING TESTING
Information Patent Grant
Optical spot grid array scanning system
- Patent number 7,468,507
- Issue date Dec 23, 2008
- Applied Materials, Israel, Ltd.
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Optical reticle substrate inspection apparatus and beam scanning me...
- Patent number 6,665,112
- Issue date Dec 16, 2003
- NEC Corporation
- Motonari Tateno
- G01 - MEASURING TESTING
Information Patent Grant
Optical reticle substrate inspection apparatus and beam scanning me...
- Patent number 6,538,795
- Issue date Mar 25, 2003
- NEC Corporation
- Motonari Tateno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL CONTOURED SCANNING PHOTOACOUSTIC IMAGING AND VIRT...
- Publication number 20230055979
- Publication date Feb 23, 2023
- California Institute of Technology
- Lihong Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPOSITIONS AND METHODS BASED ON DIFFUSION OF FLUOROPHORES
- Publication number 20220404281
- Publication date Dec 22, 2022
- Scintimetrics, Inc.
- Christopher Gordon ATWOOD
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF SCANNING AN OPTICAL BEAM USING AN ACOUSTO-OPTIC DEFLECTOR...
- Publication number 20210318590
- Publication date Oct 14, 2021
- Femtonics Kft.
- Gergely KATONA
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Oblique Incidence Scanning with 2D Array of S...
- Publication number 20160327493
- Publication date Nov 10, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
Systems and Methods for Run-Time Alignment of a Spot Scanning Wafer...
- Publication number 20160313256
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
OBJECT INFORMATION ACQUIRING APPARATUS
- Publication number 20160091415
- Publication date Mar 31, 2016
- Canon Kabushiki Kaisha
- Yukio Furukawa
- G01 - MEASURING TESTING
Information Patent Application
Photoacoustic Imager
- Publication number 20160061715
- Publication date Mar 3, 2016
- XTrillion, Inc.
- Kazuo KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MICROSCOPY SYSTEMS BASED ON PHOTOACOUSTIC IMAGING
- Publication number 20150160120
- Publication date Jun 11, 2015
- National Taiwan University
- Chi-Kuang SUN
- G01 - MEASURING TESTING
Information Patent Application
PHOTOACOUSTIC APPARATUS AND METHOD OF OPERATING THE SAME
- Publication number 20150122032
- Publication date May 7, 2015
- SAMSUNG MEDISON CO., LTD.
- Jong-kyu JUNG
- G01 - MEASURING TESTING
Information Patent Application
LASER SCATTERING DEFECT INSPECTION SYSTEM AND LASER SCATTERING DEFE...
- Publication number 20100085561
- Publication date Apr 8, 2010
- SUMCO CORPORATION
- Eiji KAMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING AN OBJECT USING AN ACOUSTO-OPTIC D...
- Publication number 20080100830
- Publication date May 1, 2008
- Applied Materials, Israel, Ltd.
- Alexander Veis
- G01 - MEASURING TESTING
Information Patent Application
Optical spot grid array scanning system
- Publication number 20070133077
- Publication date Jun 14, 2007
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Optical reticle substrate inspection apparatus and beam scanning me...
- Publication number 20030117683
- Publication date Jun 26, 2003
- NEC Corporation
- Motonari Tateno
- G01 - MEASURING TESTING
Information Patent Application
Optical reticle substrate inspection apparatus and beam scanning me...
- Publication number 20020093719
- Publication date Jul 18, 2002
- NEC Corporation
- Motonari Tateno
- G01 - MEASURING TESTING

Acousto-optical scan

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of scanning an optical beam using an acousto-optic deflector...

Device and method for multispectral optoacoustic imaging

Photoacoustic measurement device and puncture needle

High resolution photoacoustic imaging in scattering media using str...

Photoacoustic apparatus and method of operating the same

System and method for oblique incidence scanning with 2D array of s...

Systems and methods for run-time alignment of a spot scanning wafer...

System and method of two-stepped laser scattering defect inspection

System and method for inspecting an object using an acousto-optic d...

Optical spot grid array scanning system

Optical reticle substrate inspection apparatus and beam scanning me...

Optical reticle substrate inspection apparatus and beam scanning me...

Patents Applicationslast 30 patents

THREE-DIMENSIONAL CONTOURED SCANNING PHOTOACOUSTIC IMAGING AND VIRT...

COMPOSITIONS AND METHODS BASED ON DIFFUSION OF FLUOROPHORES

METHOD OF SCANNING AN OPTICAL BEAM USING AN ACOUSTO-OPTIC DEFLECTOR...

System and Method for Oblique Incidence Scanning with 2D Array of S...

Systems and Methods for Run-Time Alignment of a Spot Scanning Wafer...

OBJECT INFORMATION ACQUIRING APPARATUS

Photoacoustic Imager

OPTICAL MICROSCOPY SYSTEMS BASED ON PHOTOACOUSTIC IMAGING

PHOTOACOUSTIC APPARATUS AND METHOD OF OPERATING THE SAME

LASER SCATTERING DEFECT INSPECTION SYSTEM AND LASER SCATTERING DEFE...

SYSTEM AND METHOD FOR INSPECTING AN OBJECT USING AN ACOUSTO-OPTIC D...

Optical spot grid array scanning system

Optical reticle substrate inspection apparatus and beam scanning me...

Optical reticle substrate inspection apparatus and beam scanning me...