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Patents Grantslast 30 patents

Information Patent Grant
Test systems configured to perform test mode operations for multipl...
- Patent number 12,159,681
- Issue date Dec 3, 2024
- SK hynix Inc.
- Sang Ah Hyun
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor system including semiconductor device for performing...
- Patent number 12,131,791
- Issue date Oct 29, 2024
- SK Hynix Inc.
- Byung Goo Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory, memory system, operation method of the memory, and operatio...
- Patent number 12,073,902
- Issue date Aug 27, 2024
- SK Hynix Inc.
- Kyung Whan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Authenticity and yield by reading defective cells
- Patent number 12,027,224
- Issue date Jul 2, 2024
- International Business Machines Corporation
- Julien Frougier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage system
- Patent number 11,990,201
- Issue date May 21, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kangling Ji
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable ECC for MRAM mixed-read scheme
- Patent number 11,972,822
- Issue date Apr 30, 2024
- SANDISK TECHNOLOGIES LLC
- Martin Hassner
- G11 - INFORMATION STORAGE
Information Patent Grant
Concurrent compensation in a memory system
- Patent number 11,942,171
- Issue date Mar 26, 2024
- Micron Technology, Inc.
- Harish V. Gadamsetty
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip having debug function and chip debugging method
- Patent number 11,942,172
- Issue date Mar 26, 2024
- Realtek Semiconductor Corporation
- Pan-Ting Jiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory apparatus and semiconductor system including the same
- Patent number 11,942,173
- Issue date Mar 26, 2024
- SK hynix Inc.
- Heeeun Choi
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method to detect word-line leakage and process defects...
- Patent number 11,935,607
- Issue date Mar 19, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Vikas Rana
- G11 - INFORMATION STORAGE
Information Patent Grant
Reference voltage adjustment based on post-decoding and pre-decodin...
- Patent number 11,923,028
- Issue date Mar 5, 2024
- Chenrong Xiong
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for reading and writing and memory device
- Patent number 11,894,088
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shuliang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for read/write of memory devices and error corr...
- Patent number 11,881,240
- Issue date Jan 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shuliang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-repair for sequential SRAM
- Patent number 11,869,617
- Issue date Jan 9, 2024
- Meta Platforms Technologies, LLC
- Huichu Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage devices and methods of operating storage devices
- Patent number 11,862,273
- Issue date Jan 2, 2024
- Samsung Electronics Co., Ltd.
- Sehwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing techniques
- Patent number 11,862,271
- Issue date Jan 2, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit in scribe region for memory failure analysis
- Patent number 11,854,639
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Atsuko Otsuka
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory chip having on-die mirroring function and method for testing...
- Patent number 11,848,068
- Issue date Dec 19, 2023
- Samsung Electronics Co., Ltd.
- Byoungsul Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit, memory and operation method of memory
- Patent number 11,837,311
- Issue date Dec 5, 2023
- SK Hynix Inc.
- Yun Gi Hong
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage devices and methods of operating storage devices
- Patent number 11,830,561
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Youngmin Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
JTAG based architecture allowing multi-core operation
- Patent number 11,830,563
- Issue date Nov 28, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Error correction system
- Patent number 11,791,009
- Issue date Oct 17, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kangling Ji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-volatile storage device, data readout method, and non-transitor...
- Patent number 11,776,652
- Issue date Oct 3, 2023
- MegaChips Corporation
- Kantatsu Chin
- G11 - INFORMATION STORAGE
Information Patent Grant
Controlling memory including managing a correction value table
- Patent number 11,776,651
- Issue date Oct 3, 2023
- Kioxia Corporation
- Masanobu Shirakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Programming codewords for error correction operations to memory
- Patent number 11,769,566
- Issue date Sep 26, 2023
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Grant
Devices and methods for preventing errors and detecting faults with...
- Patent number 11,769,567
- Issue date Sep 26, 2023
- NXP USA, INC.
- Jehoda Refaeli
- G11 - INFORMATION STORAGE
Information Patent Grant
Selecting read reference voltage using historical decoding information
- Patent number 11,735,286
- Issue date Aug 22, 2023
- INNOGRIT TECHNOLOGIES CO., LTD.
- Bo Fu
- G11 - INFORMATION STORAGE
Information Patent Grant
Detection of address bus corruption for data storage devices
- Patent number 11,735,285
- Issue date Aug 22, 2023
- Kioxia Corporation
- Jason Griffin
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line control method, word line control circuit device and semi...
- Patent number 11,693,584
- Issue date Jul 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Column redundancy techniques
- Patent number 11,664,086
- Issue date May 30, 2023
- ARM Limited
- Yew Keong Chong
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...
- Publication number 20240412802
- Publication date Dec 12, 2024
- MimirIP LLC
- Kyung Whan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fully Scannable Memory Arrays
- Publication number 20240412797
- Publication date Dec 12, 2024
- SambaNova Systems, Inc.
- Thomas A. ZIAJA
- G11 - INFORMATION STORAGE
Information Patent Application
Method for Scanning a Memory Array
- Publication number 20240412798
- Publication date Dec 12, 2024
- SambaNova Systems, Inc.
- Thomas ZIAJA
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF
- Publication number 20240257896
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Seungki HONG
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT AND RECEIVING CIRCUIT HAVING TEST FUNCTION
- Publication number 20240242773
- Publication date Jul 18, 2024
- SK HYNIX INC.
- Gi Moon HONG
- G11 - INFORMATION STORAGE
Information Patent Application
Logical Memory Repair with a Shared Physical Memory
- Publication number 20240203517
- Publication date Jun 20, 2024
- Google LLC
- Wilson Pradeep
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY APPARATUS AND SEMICONDUCTOR SYSTEM INCLUDING THE SAME
- Publication number 20240194285
- Publication date Jun 13, 2024
- SK HYNIX INC.
- HEEEUN CHOI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SEMICONDUCTOR DEVICE
- Publication number 20240177791
- Publication date May 30, 2024
- SK HYNIX INC.
- Jun Hyuk LEE
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPL...
- Publication number 20240161851
- Publication date May 16, 2024
- SK HYNIX INC.
- Sang Ah HYUN
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Testing Techniques
- Publication number 20240136006
- Publication date Apr 25, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
- Publication number 20240120014
- Publication date Apr 11, 2024
- SK HYNIX INC.
- Suk Hwan CHOI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR SYSTEM INCLUDING SEMICONDUCTOR DEVICE FOR PERFORMING...
- Publication number 20240079077
- Publication date Mar 7, 2024
- SK HYNIX INC.
- Byung Goo CHO
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLING MEMORY INCLUDING MANAGING A CORRECTION VALUE TABLE
- Publication number 20230395178
- Publication date Dec 7, 2023
- KIOXIA Corporation
- Masanobu SHIRAKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
SELECTING READ REFERENCE VOLTAGE USING HISTORICAL DECODING INFORMATION
- Publication number 20230360715
- Publication date Nov 9, 2023
- INNOGRIT TECHNOLOGIES CO., LTD
- Bo Fu
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT IN SCRIBE REGION FOR MEMORY FAILURE ANALYSIS
- Publication number 20230326540
- Publication date Oct 12, 2023
- Micron Technology, Inc.
- ATSUKO OTSUKA
- G11 - INFORMATION STORAGE
Information Patent Application
AUTHENTICITY AND YIELD BY READING DEFECTIVE CELLS
- Publication number 20230298683
- Publication date Sep 21, 2023
- International Business Machines Corporation
- Julien Frougier
- G11 - INFORMATION STORAGE
Information Patent Application
CONCURRENT COMPENSATION IN A MEMORY SYSTEM
- Publication number 20230207033
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Harish V. Gadamsetty
- G11 - INFORMATION STORAGE
Information Patent Application
CHIP HAVING DEBUG FUNCTION AND CHIP DEBUGGING METHOD
- Publication number 20230187007
- Publication date Jun 15, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- PAN-TING JIANG
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT, MEMORY AND OPERATION METHOD OF MEMORY
- Publication number 20230162811
- Publication date May 25, 2023
- SK HYNIX INC.
- Yun Gi HONG
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES
- Publication number 20230124303
- Publication date Apr 20, 2023
- Samsung Electronics Co., Ltd.
- Sehwan PARK
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...
- Publication number 20230116422
- Publication date Apr 13, 2023
- SK HYNIX INC.
- Kyung Whan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES
- Publication number 20230094273
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Youngmin LEE
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAMMABLE ECC FOR MRAM MIXED-READ SCHEME
- Publication number 20230101414
- Publication date Mar 30, 2023
- SANDISK TECHNOLOGIES LLC
- Martin Hassner
- G11 - INFORMATION STORAGE
Information Patent Application
SELECTING READ REFERENCE VOLTAGE USING HISTORICAL DECODING INFORMATION
- Publication number 20230098775
- Publication date Mar 30, 2023
- INNOGRIT TECHNOLOGIES CO., LTD
- Bo Fu
- G11 - INFORMATION STORAGE
Information Patent Application
REFERENCE VOLTAGE ADJUSTMENT BASED ON POST-DECODING AND PRE-DECODIN...
- Publication number 20230078705
- Publication date Mar 16, 2023
- INNOGRIT TECHNOLOGIES CO., LTD
- Chenrong XIONG
- G11 - INFORMATION STORAGE
Information Patent Application
SELF-REPAIR FOR SEQUENTIAL SRAM
- Publication number 20230065591
- Publication date Mar 2, 2023
- Meta Platforms Technologies, LLC
- Huichu LIU
- G11 - INFORMATION STORAGE
Information Patent Application
CELL STATISTICS GENERATOR FOR NVM DEVICES
- Publication number 20230063666
- Publication date Mar 2, 2023
- Western Digital Technologies, Inc.
- Jonas GOODE
- G11 - INFORMATION STORAGE
Information Patent Application
Column Redundancy Techniques
- Publication number 20230016339
- Publication date Jan 19, 2023
- ARM Limited
- Yew Keong Chong
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT AND METHOD TO DETECT WORD-LINE LEAKAGE AND PROCESS DEFECTS...
- Publication number 20230008272
- Publication date Jan 12, 2023
- STMicroelectronics International N.V.
- Vikas RANA
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAMMING CODEWORDS FOR ERROR CORRECTION OPERATIONS TO MEMORY
- Publication number 20230005563
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE

Address decoder

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test systems configured to perform test mode operations for multipl...

Semiconductor system including semiconductor device for performing...

Memory, memory system, operation method of the memory, and operatio...

Authenticity and yield by reading defective cells

Storage system

Programmable ECC for MRAM mixed-read scheme

Concurrent compensation in a memory system

Chip having debug function and chip debugging method

Memory apparatus and semiconductor system including the same

Circuit and method to detect word-line leakage and process defects...

Reference voltage adjustment based on post-decoding and pre-decodin...

Method for reading and writing and memory device

Systems and methods for read/write of memory devices and error corr...

Self-repair for sequential SRAM

Storage devices and methods of operating storage devices

Memory testing techniques

Test circuit in scribe region for memory failure analysis

Memory chip having on-die mirroring function and method for testing...

Integrated circuit, memory and operation method of memory

Storage devices and methods of operating storage devices

JTAG based architecture allowing multi-core operation

Error correction system

Non-volatile storage device, data readout method, and non-transitor...

Controlling memory including managing a correction value table

Programming codewords for error correction operations to memory

Devices and methods for preventing errors and detecting faults with...

Selecting read reference voltage using historical decoding information

Detection of address bus corruption for data storage devices

Word line control method, word line control circuit device and semi...

Column redundancy techniques

Patents Applicationslast 30 patents

MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...

Fully Scannable Memory Arrays

Method for Scanning a Memory Array

MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF

TEST CIRCUIT AND RECEIVING CIRCUIT HAVING TEST FUNCTION

Logical Memory Repair with a Shared Physical Memory

MEMORY APPARATUS AND SEMICONDUCTOR SYSTEM INCLUDING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SEMICONDUCTOR DEVICE

TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPL...

Memory Testing Techniques

TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME

SEMICONDUCTOR SYSTEM INCLUDING SEMICONDUCTOR DEVICE FOR PERFORMING...

CONTROLLING MEMORY INCLUDING MANAGING A CORRECTION VALUE TABLE

SELECTING READ REFERENCE VOLTAGE USING HISTORICAL DECODING INFORMATION

TEST CIRCUIT IN SCRIBE REGION FOR MEMORY FAILURE ANALYSIS

AUTHENTICITY AND YIELD BY READING DEFECTIVE CELLS

CONCURRENT COMPENSATION IN A MEMORY SYSTEM

CHIP HAVING DEBUG FUNCTION AND CHIP DEBUGGING METHOD

INTEGRATED CIRCUIT, MEMORY AND OPERATION METHOD OF MEMORY

STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES

MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...

STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES

PROGRAMMABLE ECC FOR MRAM MIXED-READ SCHEME

SELECTING READ REFERENCE VOLTAGE USING HISTORICAL DECODING INFORMATION

REFERENCE VOLTAGE ADJUSTMENT BASED ON POST-DECODING AND PRE-DECODIN...

SELF-REPAIR FOR SEQUENTIAL SRAM

CELL STATISTICS GENERATOR FOR NVM DEVICES

Column Redundancy Techniques

CIRCUIT AND METHOD TO DETECT WORD-LINE LEAKAGE AND PROCESS DEFECTS...

PROGRAMMING CODEWORDS FOR ERROR CORRECTION OPERATIONS TO MEMORY